• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2008년도 하계학술대회 논문집 Vol.9
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• pp.189-190
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• 2008

The electrical characteristics of band-gap engineered tunneling barriers consisting of thin $SiO_2$ and $Si_3N_4$ dielectric layers were investigated. The band structure of stacked tunneling barriers was studied and the effectiveness of these tunneling barriers was compared with that of the conventional tunneling barrier. The band-gap engineered tunneling barriers show the lower operation voltage, faster speed and longer retention time than the conventional $SiO_2$ tunnel barrier. The thickness of each $SiO_2$ and $Si_3N_4$ layer was optimized to improve the performance of non-volatile memory.

• Transactions on Electrical and Electronic Materials
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• 제14권5호
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• pp.250-253
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• 2013

In this paper, we fabricated 3D pillar type silicon-oxide-nitride-oxide-silicon (SONOS) devices for high density flash applications. To solve the limitation between erase speed and data retention of the conventional SONOS devices, bandgap-engineered (BE) tunneling oxide of oxide-nitride-oxide configuration is integrated with the 3D structure. In addition, the tunneling oxide is modulated by another method of $N_2$ ion implantation ($N_2$ I/I). The measured data shows that the BE-SONOS device has better electrical characteristics, such as a lower threshold voltage ($V_{\tau}$) of 0.13 V, and a higher $g_{m.max}$ of 18.6 ${\mu}A/V$ and mobility of 27.02 $cm^2/Vs$ than the conventional and $N_2$ I/I SONOS devices. Memory characteristics show that the modulated tunneling oxide devices have fast erase speed. Among the devices, the BE-SONOS device has faster program/erase (P/E) speed, and more stable endurance characteristics, than conventional and $N_2$ I/I devices. From the flicker noise analysis, however, the BE-SONOS device seems to have more interface traps between the tunneling oxide and silicon substrate, which should be considered in designing the process conditions. Finally, 3D structures, such as the pillar type BE-SONOS device, are more suitable for next generation memory devices than other modulated tunneling oxide devices.

• 한국전기전자재료학회논문지
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• 제22권1호
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• pp.17-21
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• 2009

The electrical characteristics of band-gap engineered tunneling barriers consisting of thin $SiO_2$ and $Si_3N_4$ dielectric layers were investigated for nonvolatile memory device applications. The band structure of band-gap engineered tunneling barriers was studied and the effectiveness of these tunneling barriers was compared with the conventional tunneling $SiO_2$ barrier. The band-gap engineered tunneling barriers composed of thin $SiO_2$ and $Si_3N_4$ layers showed a lower operation voltage, faster speed and longer retention time than the conventional $SiO_2$ tunnel barrier. The thickness of each $SiO_2$ and $Si_3N_4$ layer was optimized to improve the performance of non-volatile memory.

• 한국지능시스템학회:학술대회논문집
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• 한국퍼지및지능시스템학회 1998년도 The Third Asian Fuzzy Systems Symposium
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• pp.740-749
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• 1998

This paper proposes compression of image data using neural networks based on conjugate gradient method and dynamic tunneling system. The conjugate gradient method is applied for high speed optimization .The dynamic tunneling algorithms, which is the deterministic method with tunneling phenomenon, is applied for global optimization. Converging to the local minima by using the conjugate gradient method, the new initial point for escaping the local minima is estimated by dynamic tunneling system. The proposed method has been applied the image data compression of 12 ${\times}$12 pixels. The simulation results shows the proposed networks has better learning performance , in comparison with that using the conventional BP as learning algorithm.

• 한국정보통신학회:학술대회논문집
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• 한국정보통신학회 2019년도 춘계학술대회
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• pp.475-476
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• 2019

L형 터널링 전계 효과 트랜지스터 (LTFET)는 종래의 터널링 전계 효과 트랜지스터 (TFET)보다 우수한 소자로 고려된다. 그러나, 실험적으로 입증 된 LTFET은 트랩 상태의 존재로 인한 트랩-보조-터널링 (Trap-Assisted-Tunneling; TAT)에 기인한 열악한 임계 이하 기울기(SS) 특성을 나타내었다. 본 논문에서는 실험적으로 시연 된 LTFET의 저전압 바이어스에 TAT 메커니즘을 밴드 다이어그램과 TAT 재조합률 (GTAT)을 사용하여 조사한다.

• 대한전자공학회논문지SD
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• 제49권4호
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• pp.1-6
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• 2012

본 논문에서는 고주파에서 동작하는 터널링 전계효과 트랜지스터 (TFET)의 소신호 파라미터 추출과 이에 대한 분석을 다루고 있다. 시뮬레이션으로 구현된 TFET의 채널 길이는 50 nm에서 100 nm 사이에서 변화되었다. Conventional planar MOSFET 기반의 quasi-static 모델을 이용하여 TFET의 파라미터 추출이 이루어졌으며 다른 채널 길이를 갖는 TFET에 대한 소신호 파라미터의 값을 게이트 바이어스 변화에 따라서 추출하였다. 추출 결과로부터 effective gate resistance와 transconductance, source-drain conductance, gate capacitance 등 주요 파라미터의 채널 길이 변화에 따른 경향성이 conventional MOSFET과 상당히 다른 것을 확인하였다. 그리고 $f_T$는 MOSFET과 달리 게이트 길이 역수의 값에 정확히 반비례하는 특성을 보였으며 TFET의 고주파 특성 향상을 transconductance의 개선이 아닌 gate capacitance의 감소에 의하여 가능함을 알 수 있었다.

• Geomechanics and Engineering
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• 제11권1호
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• pp.41-58
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• 2016

This paper focuses on the deformation behavior of tunnels crossing a weak zone in conventional tunneling. A three-dimensional finite element model was adopted that allows realistic modeling of the tunnel excavation and the support installation. Using the 3D FE model, a parametric study was conducted on a number of tunneling cases with emphasis on the spatial characteristics of the weak zone such as the strike and dip angle, and on the initial stress state. The results of the analyses were thoroughly examined so that the three-dimensional tunnel displacements at the tunnel crown and the sidewalls can be related to the spatial characteristic of the weak zone as well as the initial stress state. The results indicate that the effectiveness of the absolute displacement monitoring data as early warning indicators depends strongly on the spatial characteristics of the weak zone. It is also shown that proper interpretation of the absolute monitoring data can provide not only early warning for a weak zone outside the excavation area but also information on the orientation and the extent of the weak zone. Practical implications of the findings are discussed.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2008년도 추계학술대회 논문집 Vol.21
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• pp.128-129
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• 2008

The annealing effects of $SiO_2/Si_3N_4$ stacked tunneling dielectrics were investigated. I-V characteristics of band gap engineered tunneling gate stacks consisted of $Si_3N_4/SiO_2/Si_3N_4$(NON), $SiO_2/Si_3N_4/SiO_2$(ONO) dielectrics were evaluated and compared with $SiO_2$ single layer using the MOS(Metal-Oxide-Semiconductor) capacitor structure. The leakage currents of engineered tunneling barriers (ONO, NON stacks) are lower than that of the conventional $SiO_2$ single layer at low electrical field. Meanwhile, the engineered tunneling barriers have larger tunneling current at high electrical field and improved electrical characteristics by annealing processes than $SiO_2$ layer.

• 한국지능시스템학회:학술대회논문집
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• 한국퍼지및지능시스템학회 2003년도 ISIS 2003
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• pp.676-678
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• 2003

Microtunneling techniques play a crucial role in the construction of pipelines. This paper shows the automatic tunneling algorithm of microtunneling system using fuzzy logic technology to assist operators to assure the quality of microtunneling construction. To have effective output value of fuzzy controller, we slightly modified the conventional defuzzification methods. The proposed automatic tunneling algorithm shows good tunneling results comparable with those of experts.

• 대한기계학회논문집
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• 제18권9호
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• pp.2272-2283
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• 1994

In scanning tunneling microscopy, the piezoelectric actuator is popuilarly used in stacked type as it can provide remarkable positioning resolution and stiffness. The actuator, however, exhibits a considerable amount of hystereic nonlinearity, resulting in losses of overall measuring accuracy when a linear model is used for its control and calibration, In this study, a nonlinear model is proposed for predicting the precise relationship between the input connand voltage and the output displacement of the actuator itself, cross-coupled electrical behaviours of the driving circuit with the actuator, and mechanical characteristics of the driven components of the actuator. Finally experimental results prove that the nonlinear model enhances the measuring of scanning tunneling microscopy by an order ten in comparison with a conventional linear model.