• Title/Summary/Keyword: embedded circuit

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A high speed embedded SRAM with improve dcontrol circuit and sense amplifier (개선된 control circuit과 sense amplifier를 갖는 고속동작 embedded SRAM의 설계)

  • 김진국;장일권;곽계달
    • Proceedings of the IEEK Conference
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    • 1998.06a
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    • pp.538-541
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    • 1998
  • This paper describes the development of 5.15ns 32kb asynchronous CMOS SRAM using 0.6.mu.m CMOS technology. The proposed high speed embedded SRAM is realized with optimized control circuit and sense amplifier at a power supply of 3V. Using proposed control circuit, the delay time from address input to wordline 'on' is reduced by 33% and mismatch-insensitive sense amplifier can sense a small difference of bit-line voltage fast and stably.

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Characterization of Embedded Inductors using Partial Element Equivalent Circuit Models (부분등가회로모델을 이용한 매립형 인덕터의 특성 연구)

  • 신동욱;오창훈;이규복;김종규;윤일구
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.16 no.5
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    • pp.404-408
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    • 2003
  • The characterization for several multi-layer embedded inductors with different structures was investigated. The optimized equivalent circuit models for several test structures were obtained from HSPICE. Building blocks are modeled using Partial element equivalent circuit method. The mean and the standard deviation of model parameters were extracted and predictive modeling was performed on different test structure. From this study, the characteristic of multi-layer inductors can be predicted.

Fabrication of embedded circuit patterns for Ie substrates using UV laser (UV 레이저 응용 반도체 기판용 임베디드 회로 패턴 가공)

  • Sohn, Hyon-Kee;Shin, Dong-Sig;Choi, Ji-Yeon
    • Laser Solutions
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    • v.14 no.1
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    • pp.14-18
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    • 2011
  • Semiconductor industry demands decrease in line/space dimensions of IC substrates. Particularly for IC substrates for CPU, line/space dimensions below $10{\mu}m/10{\mu}m$ are expected to be used in production since 2014. Conventional production technologies (SAP, etc.) based on photolithography are widely agreed to be reaching capability limits. To address this limitation, the embedded circuit fabrication technology using laser ablation has been recently developed. In this paper, we used a nanosecond UV laser and a picosecond UV laser to fabricate embedded circuit patterns into a buildup film with $SiO_2$ powders for IC substrate. We conducted SEM and EDS analysis to investigate surface quality of the embedded circuit patterns. Experimental results showed that due to higher recoil pressure, picosecond UV laser ablation of the buildup film generated a better surface roughness.

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A Study on the Built-In Self-Test for AC Parameter Testing of SDRAM using Image Graphic Controller

  • Park, Sang-Bong;Park, Nho-Kyung;Kim, Sang-Hun
    • The Journal of the Acoustical Society of Korea
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    • v.20 no.1E
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    • pp.14-19
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    • 2001
  • We have proposed BIST method and circuit for embedded 16M SDRAM with logic. It can test the AC parameter of embedded 16M SDRAM using the BIST circuit capable of detecting the address of a fail cell installed in an Merged Memory with Logic(MML). It generates the information of repair for redundancy circuit. The function and AC parameter of the embedded memory can also be tested using the proposed BIST method. It is possible to test the embedded SDRAM without external test pin. The total gate of the BIST circuit is approximately 4,500 in the case of synthesizing by 0.25μm cell library and is verified by Verilog simulation. The test time of each one AC parameter is about 200ms using 2Y-March 14n algorithm.

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Characteristic Prediction and Analysis of 3-D Embedded Passive Devices (3차원 매립형 수동소자의 특성 예측 및 분석에 대한 연구)

  • Shin, Dong-Wook;Oh, Chang-Hoon;Lee, Kyu-Bok;Kim, Jong-Kyu;Yun, Il-Gu
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2003.07b
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    • pp.607-610
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    • 2003
  • The characteristic prediction and analysis of 3-dimensional (3-D) solenoid-type embedded inductors is investigated. The four different structures of 3-D inductor are fabricated by using low-temperature cofired ceramic (LTCC) process. The circuit model parameters of the each building block are optimized and extracted using the partial element equivalent circuit method and HSPICE circuit simulator. Based on the model parameters, predictive modeling is applied for the structures composed of the combination of the modeled building blocks. And the characteristics of test structures, such as self-resonant frequency, inductance and Q-factor, are analyzed. This approach can provide the characteristic conception of 3-D solenoid embedded inductors for structural variations.

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Characteristic Variation of 3-D Solenoid Embedded Inductors for Wireless Communication Systems

  • Shin, Dong-Wook;Oh, Chang-Hoon;Kim, Kil-Han;Yun, Il-Gu
    • ETRI Journal
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    • v.28 no.3
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    • pp.347-354
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    • 2006
  • The characteristic variation of 3-dimensional (3-D) solenoid-type embedded inductors is investigated. Four different structures of a 3-D inductor are fabricated by using a low-temperature co-fired ceramic (LTCC) process, and their s-parameters are measured between 50 MHz and 5 GHz. The circuit model parameters of each building block are optimized and extracted using the partial element equivalent circuit method and an HSPICE circuit simulator. Based on the model parameters, the characteristics of the test structures such as self-resonant frequency, inductance, and quality (Q) factor are analyzed, and predictive modeling is applied to the structures composed of a combination of the modeled building blocks. In addition, characteristic variations of the 3-D inductors with different structures using extracted building blocks are also investigated. This approach can provide a characteristic estimation of 3-D solenoid embedded inductors for structural variations.

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Embedded RF Test Circuits: RF Power Detectors, RF Power Control Circuits, Directional Couplers, and 77-GHz Six-Port Reflectometer

  • Eisenstadt, William R.;Hur, Byul
    • Journal of information and communication convergence engineering
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    • v.11 no.1
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    • pp.56-61
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    • 2013
  • Modern integrated circuits (ICs) are becoming an integrated parts of analog, digital, and radio frequency (RF) circuits. Testing these RF circuits on a chip is an important task, not only for fabrication quality control but also for tuning RF circuit elements to fit multi-standard wireless systems. In this paper, RF test circuits suitable for embedded testing are introduced: RF power detectors, power control circuits, directional couplers, and six-port reflectometers. Various types of embedded RF power detectors are reviewed. The conventional approach and our approach for the RF power control circuits are compared. Also, embedded tunable active directional couplers are presented. Then, six-port reflectometers for embedded RF testing are introduced including a 77-GHz six-port reflectometer circuit in a 130 nm process. This circuit demonstrates successful calibrated reflection coefficient simulation results for 37 well distributed samples in a Smith chart. The details including the theory, calibration, circuit design techniques, and simulations of the 77-GHz six-port reflectometer are presented in this paper.

8-Layer System-in-Board Embedded Printed Circuit Board for Area Reduction of RF Communication System (RF 통신 시스템의 면적 축소를 위한 8층 시스템-인-보드 임베디드 인쇄회로기판)

  • Jeong, Jin-Woo;Yi, Jae-Hoon;Chun, Kuk-Jin
    • Journal of the Institute of Electronics Engineers of Korea SD
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    • v.48 no.2
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    • pp.67-72
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    • 2011
  • 8-layer printed circuit board is designed and implemented for triple band(2.3/2.5/3.5GHz) m-WiMAX system. In order to maintain excellent RF performance, low dielectric constant material is used for implementation of the printed circuit board. Also, embedded printed circuit board which embed passive devices is manufactured to reduce total system area. As a result, total system area is cut off by 9%. Triple band m-WiMAX system is produced using embedded printed circuit board. Furthermore, internet connecting test is performed and proved successful running of the system. The developed embedded printed circuit board will provide a effective solution for system area reduction and low loss signal RF communication system.

Composite $BaTiO_3$ Embedded capacitors in Multilayer Printed Circuit Board (다층 PCB에서의 $BaTiO_3$ 세라믹 Embedded capacitors)

  • You, Hee-Wook;Park, Yong-Jun;Koh, Jung-Hyuk
    • Transactions of the Korean Society of Machine Tool Engineers
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    • v.17 no.2
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    • pp.110-113
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    • 2008
  • Embedded capacitor technology is one of the effective packing technologies for further miniaturization and higher performance of electric packaging system. In this paper, the embedded capacitors were simulated and fabricated in 8-layered printed circuit board employing standard PCB processes. The composites of barium titanante($BaTiO_3$) powder and epoxy resin were employed for the dielectric materials in embedded capacitors. Theoretical considerations regarding the embedded capacitors have been paid to understand the frequency dependent impedance behavior. Frequency dependent impedance of simulated and fabricated embedded capacitors was investigated. Fabricated embedded capacitors have lower self resonance frequency values than that of the simulated embedded capacitors due to the increased parasitic inductance values. Frequency dependent capacitances of fabricated embedded capacitors were well matched with those of simulated embedded capacitors from the 100MHz to 10GHz range. Quality factor of 20 was observed and simulated at 2GHz range in the 10 pF embedded capacitors. Temperature dependent capacitance of fabricated embedded capacitors was presented.

Characterization of High-K Embedded Capacitor in Low Temperature Co-fired Ceramic (고 유전율 저온 동시 소성 세라믹으로 제작된 초고주파용 캐패시터의 특성연구)

  • Ahn, Min-Su;Kang, Jung-Han;Yun, Il-Gu
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2005.07a
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    • pp.57-58
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    • 2005
  • The properties such as capacitance and resonant frequency are important in embedded capacitors. Accurate equivalent model is required to find these properties of embedded capacitor. In this paper, we investigate to analyze the properties of high-K embedded capacitor which was fabricated by Low Temperature Co-fired Ceramic (LTCC). Modeling based on partial element equivalent circuit (PEEC) method is performed using HSPICE circuit simulation. This modeling methodology can provide the good inspection of embedded capacitor to device engineer.

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