Nonlinear refractive index measurement for amorphous $As_2S_3$ thin film by Z-scan method
(Z-scan 방법에 의한 비정질 $As_2S_3$ 박막의 비선형 굴절률 측정)
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- Korean Journal of Optics and Photonics
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- v.9 no.5
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- pp.342-347
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- 1998