자연과학논문집 (The Journal of Natural Sciences)

  • 제7권
  • /
  • Pages.11-17
  • /
  • 1995
  • /
  • 1225-6196(pISSN)
배재대학교 자연과학연구소 (Research Institute of Natural Sciences)
권호 표지

원형대칭 빛살 Z-스캔 방법에 의한 광학적 비선형 굴절율 측정

Measurements of optical nonlinear refractive index through the Z-scan method with circular symmetric beam

  • Kim, Gi-Hun (Department of Physics, Seoul National University) ;
  • Im, Yong-Sik (Department of Physics, Seoul National University) ;
  • Park, Jong-Dae (Department of Physics, Pai-Chai University) ;
  • Kim, Chil-Min (Department of Physics, Pai-Chai University) ;
  • Jo, Chang-Ho (Department of Physics, Pai-Chai University)
  • 발행 : 1995.02.18
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초록

미소 반도체 $Bil_3$ 콜로이드의 광학적 비선형 굴절율을 원형 대칭 빛살을 사용한 Z 스캔 방법으로 측정하였다. 파장 $0.532\mum$, 펄스폭 20ns에서 비선형 굴절율은 주로 열적 요인에 의한 것이었으며, 그 크기는 -1.53 x $10^12($cm^2/W) 이었고, 비선형 흡수율 크기는 7.1 x $10^8$ (cm/W) 이었다.

The optical nonlinear refractive index of $Bil_3$ semiconductor microcluster colloid has been measured by the Z-scan method with circular symmetric beam. The value of nonlinear refractive index was -1.53 x $10^12($cm^2/W) at $0.532\mum$and the nonlinearities were mainly due to thermal effect induced by 20 ns laser pulse. And the absorption coefficient was measured to be -$10^8$(cm/W)

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