• Journal of electromagnetic engineering and science
• /
• v.14 no.3
• /
• pp.284-292
• /
• 2014

This paper presents a characteristic evaluation of commercial gallium nitride (GaN) transistors having two different gate-lengths of $0.4-{\mu}m$ and $0.25-{\mu}m$ in the design of a class-S power amplifier (PA). Class-S PA is operated by a random pulse-width input signal from band-pass delta-sigma modulation and has to deal with harmonics that consider quantization noise. Although a transistor having a short gate-length has an advantage of efficient operation at higher frequency for harmonics of the pulse signal, several problems can arise, such as the cost and export license of a $0.25-{\mu}m$ transistor. The possibility of using a $0.4-{\mu}m$ transistor on a class-S PA at 955 MHz is evaluated by comparing the frequency characteristics of GaN transistors having two different gate-lengths and extracting the intrinsic parameters as a shape of the simplified switch-based model. In addition, the effectiveness of the switch model is evaluated by currentmode class-D (CMCD) simulation. Finally, device characteristics are compared in terms of current-mode class-S PA. The analyses of the CMCD PA reveal that although the efficiency of $0.4-{\mu}m$ transistor decreases more as the operating frequency increases from 955 MHz to 3,500 MHz due to the efficiency limitation at the higher frequency region, it shows similar power and efficiency of 41.6 dBm and 49%, respectively, at 955 MHz when compared to the $0.25-{\mu}m$ transistor.

• Journal of the Korean Institute of Electrical and Electronic Material Engineers
• /
• v.13 no.12
• /
• pp.977-982
• /
• 2000

Conventional transistors which have vertical structure show increased parasitic capacitance characteristics in accordance with the increase of non-active base area and collector area. These consequently have disadvantage for high speed switching performance. In this paper, a lateral structure transistor which has minimized parasitic capacitance by using SDB(Silicon Direct Bonding) wafer and oxide sidewall isolation utilizing silicon trench technology is presented. Its structural characteristics are designed by ATHENA(SUPREM4), the process simulator from SILVACO International, and its performance is proven by ATLAS, the device simulator from SILVACO International. The performance of the proposed lateral structure transistor is certified through the V$\_$CE/-I$\_$C/ characteristics curve, h$\_$FE/-I$\_$C/ characteristics, and GP-plot. Cutoff Frequency is 13.7㎓.

• Journal of the Korean Institute of Telematics and Electronics
• /
• v.16 no.2
• /
• pp.7-14
• /
• 1979

Design considerations of I2L are discussed with particular emphasis on the upward current gain of the npn transistor, 6J Several test structures have been fabricated to measure the DC and AC characteristics of the I2L basic cell and the base current components of the npn transistor. A T flip-flop has also been designed and fabricated using the I2L technology. The upward current gain of 10 the speed -power product of the 2.6pJ/gate and the minimum propagation delay time of 36 nsec have been obtained from the test structure. The maxmum toggle frequency of the T flip -flop has been measured to be 3.5 MHz.

• 한국정보디스플레이학회:학술대회논문집
• /
• 2009.10a
• /
• pp.1122-1124
• /
• 2009

Organic thin-film transistors (OTFTs) were fabricated by using the transfer patterning method. In order to remove Au pattern easily, UV-curable polymer mold was surface treated. Au source/drain (S/D) pattern was transferred to insulator-coated substrate surface. Fabricated OTFTs were compared to OTFTs using vacuum-deposited Au S/D. Additionally, transistor diodes were characterized.

• Current Optics and Photonics
• /
• v.1 no.5
• /
• pp.544-550
• /
• 2017

This simulation based study reports a novel tunable, compact, room temperature terahertz (THz) transistor source, operated on the concept of charge plasma oscillation with the capability of radiating within a terahertz gap. A vertical cavity with a quasi-periodic distributed-Bragg-reflector has been attached to a THz plasma wave transistor to achieve a monochromatic coherent surface emission for single as well as multi-color operation. The resonance frequency has been tuned from 0.5 to 1.5 THz with the variable quality factor of the optical cavity from 5 to 290 and slope efficiency maximized to 11. The proposed surface emitting terahertz transistor is able to satisfy the demand for compact solid state terahertz sources in the field of teratronics. The proposed device can be integrated with Si CMOS technology and has opened the way towards the development of silicon photonics.

• Journal of the Korean Institute of Telematics and Electronics
• /
• v.23 no.6
• /
• pp.741-746
• /
• 1986

A novel n-p-n bipolar transistor of which emitter is self-aligned with base contact by polyilicon is developed for using in high speed and high packing density LSI circuits. The emitter of this transistor is separated less than 0.4 \ulcorner with base contact by self-aligh technology, and the emitter feature size is less than 3x5 \ulcorner\ulcorner Because the active region of this transistor is not damaged through all the process, it has excellent electric properties. Using the n-p-n transistors by 3.0\ulcorner design rules, a NTL ring oscillator has 380 ps, a CML ring oscillator has 390ps, and a I\ulcorner ring oscillator has 5.6ns of per-gate minimum propagation delay time.

• Journal of Electrical Engineering and Technology
• /
• v.11 no.6
• /
• pp.1763-1768
• /
• 2016

This paper presents the electrical characteristics of the gallium nitride (GaN) current aperture vertical electron transistor (CAVET) by using two-dimensional (2-D) technology computer-aided design (TCAD) simulations. The CAVETs are considered as the alternative device due to their high breakdown voltage and high integration density in the high-power applications. The optimized design for the CAVET focused on the electrical performances according to the different gate-source length ($L_{GS}$) and aperture length ($L_{AP}$). We analyze DC and RF parameters inducing on-state current ($I_{on}$), threshold voltage ($V_t$), breakdown voltage ($V_B$), transconductance ($g_m$), gate capacitance ($C_{gg}$), cut-off frequency ($f_T$), and maximum oscillation frequency ($f_{max}$).

• Journal of the Institute of Electronics Engineers of Korea SD
• /
• v.37 no.11
• /
• pp.1-8
• /
• 2000

In this paper, the dependence of interconnect line-induced delay time on the size of CMOSFET gate width is characterized. In case of capacitance dominant interconnect line, the total delay time decreases as transistor size increases. However, there exists a transistor size for minimum total delay time when both of resistance and capacitance of interconnect line become larger than those of transistor. The optimum transistor size for minimum total delay time is obtained using an analytic equation and the experimental results showed good agreement with the calculation.

• JSTS:Journal of Semiconductor Technology and Science
• /
• v.4 no.1
• /
• pp.41-44
• /
• 2004

The trend of decreasing the minimal structure sizes in microelectronics is still being continued. Therefore in its roadmap the Semiconductor Industries Association predicts a printed minimum MOS-transistor channel length of 10 nm for the year 2018. Although the resolution of optical lithography still dramatically increases, there are known and proved solutions for structure sizes significantly below 50 nm up to now. In this work a new method for the fabrication of extremely small MOS-transistors with a channel length and width below 50 nm with low demands to the used lithography will be explained. It's a further development of our deposition and etchback technique which was used in earlier research to produce transistors with very small channel lengths down to 30 nm, with a scaling of the transistor's width. The used technique is proved in a first charge of MOS-transistors with a channel area of W=200 nm and L=80 nm. The full CMOS compatible technique is easily transferable to almost any other technology line and results in an excellent homogeneity and reproducibility of the generated structure size. The electrical characteristics of such small transistor will be analyzed and the ultimate limits of the technique will be discussed.

• Proceedings of the Korean Institute of Information and Commucation Sciences Conference
• /
• 2022.10a
• /
• pp.115-117
• /
• 2022

The electrical characteristics of the monolithic 3-dimensional static random access memory consisting of a feedback field-effect transistor (M3D-SRAM-FBFET) was investigated using technology computer-aided design (TCAD). The N-type FBFET and N-type MOSFET are designed with fully depleted silicon on insulator (FDSOI), and those are located at bottom and top tiers, respectively. For the M3D-SRAM-FBFET, as the supply voltage decreased from 1.9 V to 1.6 V, the reading on-current decreased approximately 10 times.