• JSTS:Journal of Semiconductor Technology and Science
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• v.12 no.3
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• pp.286-292
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• 2012

Scan techniques are almost mandatorily adopted in designing current System-on-a-Chip (SoC) to enhance testability, but inadvertently secret keys can be stolen through the scan test channels of crypto SoCs. An efficient scan design technique is proposed in this paper to protect the secret key of an Advanced Encryption Standard (AES) core embedded in an SoC. A new instruction is added to IEEE 1149.1 boundary scan to use a fake key instead of user key, in which the fake key is chosen with meticulous care to improve the testability as well. Our approach can be implemented as user defined logic with conventional boundary scan design, hence no modification is necessary to any crypto IP core. Conformance to the IEEE 1149.1 standards is completely preserved while yielding better performance of area, power, and fault coverage with highly robust protection of the secret user key.

• Journal of the Korea Society of Computer and Information
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• v.13 no.4
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• pp.87-95
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• 2008

In this paper, we developed a selectable observation Point test architecture and test procedure for clocked 4-bit synchronous counter circuit based on boundary scan architecture. To develope, we analyze the operation of Sample/Preload instruction on boundary scan architecture. The Sample/Preload instruction make Possible to snapshot of outputs of CUT(circuit under test) at the specific time. But the changes of output of CUT during normal operation are not possible to observe using Sample/Preload in typical scan architecture. We suggested a selectable observation point test architecture that allows to select output of CUT and to observe of the changes of selected output of CUT during normal operation. The suggested a selectable observation point test architecture and test procedure is simulated by Altera Max 10.0. The simulation results of 4-bit counter shows the accurate operation and effectiveness of the proposed test architecture and procedure.

• Journal of the Korean Institute of Telematics and Electronics C
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• v.36C no.2
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• pp.14-25
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• 1999

The IEEE standard 1149.1, which was proposed to increase the observability and the controllability in I/O pins, makes it possible the board level testing. In the boundary-scan environments, many shift operations are required due to their serial nature. This increases the test application time and the test application costs. To reduce the test application time, the method based on the parallel opereational multiple scan paths was proposed, but this requires the additional I/O pins and the internal wires. Moreover, it is difficult to make the designs in conformity to the IEEE standard 1149.1 since the standard does not support the parallel operation of data shifts on the scan paths. In this paper, the multiple scan path access algorithm which controls two scan paths simultaneously with one test bus is proposed. Based on the new algorithm, the new algorithm, the new board level BIST architecture which has a relatively small area overhead is developed. The new BIST architecture can reduce the test application time since it can shift the test patterns and the test responses of two scan paths at a time. In addition, it can reduce the costs for the test pattern generation and the test response analysis.

• JSTS:Journal of Semiconductor Technology and Science
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• v.14 no.1
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• pp.124-130
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• 2014

In highly reliable and durable systems, failures due to aging might result in catastrophes. Aging monitoring techniques to prevent catastrophes by predicting such a failure are required. This paper presents a scan-based on-line aging monitoring scheme which monitors aging during normal operation and gives an alarm if aging is detected so that the system users take action before a failure occurs. We illustrate our modified scan chain architecture and aging monitoring control method. Experimental results show our simulation results to verify the functions of the proposed scheme.

• Journal of the Korea Academia-Industrial cooperation Society
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• v.8 no.2
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• pp.201-206
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• 2007

In this paper, we propose the efficient low power test methodology of NoC(Network-on chip) for the test of core-based systems that use this platform. To reduce the power consumption of transferring data through router channel, the scan vectors are partitioned into flits by channel width. The don't cares in unspecified scan vectors are mapped to binary values to minimize the switching rate between flits. Experimental results for full-scanned versions of ISCAS 89 benchmark circuits show that the proposed method leads to about 35% reduction in test power.

• The Transactions of the Korean Institute of Electrical Engineers A
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• v.48 no.9
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• pp.1161-1166
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• 1999

Delay testing has become highlighted in the field of digital circuits as the speed and the density of the circuits improve greatly. However, delay faults in sequential circuits cannot be detected easily due to the existence of state registers. To overcome this difficulty a new scan filp-flop is devised which can be used for both stuck-at testing and delay testing. In addition, the new scan flip-flop can be applied to both the existing functional justification method and the newly-developed reverse functional justification method which uses scan flip-flops as storing the second test patterns rather than the first test patterns. Experimental results on ISCAS 89 benchmark circuits show that the number of testable paths can be increased by about 10% on the average.

• JSTS:Journal of Semiconductor Technology and Science
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• v.7 no.4
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• pp.221-228
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• 2007

In this paper, we propose a new symbolic simulation for scan chain diagnosis to solve the diagnosis resolution problem. The proposed scan chain fault simulation, called the SF-simulation, is able to analyze the effects caused by faulty scan cells in good scan chains. A new scan chain fault simulation is performed with a modified logic ATPG pattern. In this simulation, we consider the effect of errors caused by scan shifting in the faulty scan chain. Therefore, for scan chain diagnosis, we use the faulty information in good scan chains which are not contaminated by the faults while unloading scan out responses. The SF-simulation can tighten the size of the candidate list and achieve a high diagnosis resolution by analyzing fault effects of good scan chains, which are ignored by most previous works. Experimental results demonstrate the effectiveness of the proposed method.

• Korean Journal of Digital Imaging in Medicine
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• v.17 no.1
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• pp.49-56
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• 2015

Temporal bone CT scan side skull fracture. In addition to the confirmation of the ossicles, such as fractures and dislocations, temporomandibular facial fractures, deformities surgery helps to establish a science plan. Cochlear implant surgery has been performed in the state before and after identifying purposes. Test methods are being implemented by the Conventional direct axial and Direct coronal scan, the basic method of Temporal bone CT. Helical scan is a fast Volumetric data obtained compared with the Conventional scan, the patient reduced the dose, and there are some advantages, such as reduced Beam hardening streak artifacts caused by dental fillings. This study is a comparative analysis by dose reduction for patients with a dose according to the conventional scan method and then effective from 2015 by helical scan method performed in 2014 through the retrospective survey, which was then optimized for the purpose of inspection.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.40 no.7
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• pp.474-480
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• 2003

We designed and tested a new scan driver output stage. Compared to conventional CMOS structured scan driver IC′s, the new NMOSFET-only scan driver circuit can reduce the chip area and therefore, the chip cost considerably. We confirmed the circuit operation with open drain power NMOSFET IC′s by driving 2"PDP test panel. We defined critical device parameters and their optimization methods lot the best circuit performance.

• Journal of Veterinary Clinics
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• v.34 no.5
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• pp.330-334
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• 2017

The aim of this study was to establish an injection protocol of a test bolus and a main bolus of contrast material for computed tomographic pulmonary angiography (CTPA) for visualizing optimal pulmonary arteries in normal beagle dogs. CTPA using a test bolus method from either protocol A or B were performed in each of four normal beagle dogs. In protocol A, CTPA was conducted with a scan duration for around 8 s, setting the contrast enhancement peak of the pulmonary trunk in the middle of the scan duration. The arrival time to the contrast enhancement peak was predicted from a previous dynamic scan using a test bolus (150 mg iodine/kg) injected with the same injection duration using for a main bolus (450 mg iodine/kg). In protocol B, CTPA was started at the predicted appearance time of contrast material in the pulmonary trunk based on a previous dynamic scan using a test bolus injected with the same injection rate as a main bolus. CTPA using protocol A showed the optimal opacification of the pulmonary artery with pulmonary venous contamination. Proper CTPA images in the absence of venous contamination were obtained in protocol B. CTPA with a scan duration for 8 s should be started at the appearance time of contrast enhancement in the pulmonary trunk, which can be identified exactly when a test bolus is injected at the same injection rate used for the main bolus.