JSTS:Journal of Semiconductor Technology and Science

The Institute of Electronics and Information Engineers (대한전자공학회)
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A Scan-Based On-Line Aging Monitoring Scheme

  • Yi, Hyunbean (Dept. of Computer Engineering/Graduate School of Information & Communications, Hanbat National University) ;
  • Yoneda, Tomokazu (Graduate School of Information Science, Nara Institute of Science and Technology (NAIST)) ;
  • Inoue, Michiko (Graduate School of Information Science, Nara Institute of Science and Technology (NAIST))
  • Received : 2013.09.11
  • Accepted : 2013.11.25
  • Published : 2014.02.28
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Abstract

In highly reliable and durable systems, failures due to aging might result in catastrophes. Aging monitoring techniques to prevent catastrophes by predicting such a failure are required. This paper presents a scan-based on-line aging monitoring scheme which monitors aging during normal operation and gives an alarm if aging is detected so that the system users take action before a failure occurs. We illustrate our modified scan chain architecture and aging monitoring control method. Experimental results show our simulation results to verify the functions of the proposed scheme.

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