Room tempearture deposition of SiN film by using $SiH_4-NH_3-N_2$ plasma: Effect of duty ratio on Ion energy and Refractive index
(펄스드 플라즈마를 이용한 $SiH_4-NH_3-N_2$ 에서의 SiN박막의 상온 증착 : Duty ratio 이온에너지와 굴절률에의 영향)
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- Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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- 2009.06a
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- pp.206-207
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- 2009