• Title/Summary/Keyword: Defect Characterization

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Random topological defects in double-walled carbon nanotubes: On characterization and programmable defect-engineering of spatio-mechanical properties

  • A. Roy;K. K. Gupta;S. Dey;T. Mukhopadhyay
    • Advances in nano research
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    • v.16 no.1
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    • pp.91-109
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    • 2024
  • Carbon nanotubes are drawing wide attention of research communities and several industries due to their versatile capabilities covering mechanical and other multi-physical properties. However, owing to extreme operating conditions of the synthesis process of these nanostructures, they are often imposed with certain inevitable structural deformities such as single vacancy and nanopore defects. These random irregularities limit the intended functionalities of carbon nanotubes severely. In this article, we investigate the mechanical behaviour of double-wall carbon nanotubes (DWCNT) under the influence of arbitrarily distributed single vacancy and nanopore defects in the outer wall, inner wall, and both the walls. Large-scale molecular simulations reveal that the nanopore defects have more detrimental effects on the mechanical behaviour of DWCNTs, while the defects in the inner wall of DWCNTs make the nanostructures more vulnerable to withstand high longitudinal deformation. From a different perspective, to exploit the mechanics of damage for achieving defect-induced shape modulation and region-wise deformation control, we have further explored the localized longitudinal and transverse spatial effects of DWCNT by designing the defects for their regional distribution. The comprehensive numerical results of the present study would lead to the characterization of the critical mechanical properties of DWCNTs under the presence of inevitable intrinsic defects along with the aspect of defect-induced spatial modulation of shapes for prospective applications in a range of nanoelectromechanical systems and devices.

Characterization of Axial Defects in Pipeline Using Torsional Guided Wave (비틀림 유도파를 이용한 배관 축방향 결함 특성 규명)

  • Kim, Young-Wann;Park, Kyung-Jo
    • Transactions of the Korean Society for Noise and Vibration Engineering
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    • v.25 no.6
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    • pp.399-405
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    • 2015
  • In this work we use the mode decomposition technique employing chirplet transform, which is able to separate the individual modes from dispersive and multimodal waveform measured with the magnetostrictive sensor. The mode decomposition technique is also used to estimate the time-frequency centers and individual energies of the reflection, which would be used to locate and characterize axial defects. The arrival times of the separated modes are calculated and the axial defect lengths can be evaluated by using the estimated arrival time. Results from an experiment on a carbon steel pipe are presented and it is shown that the accurate and quantitative defect characterization could become enabled using the proposed technique.

Characterization of Pipe Defects in Torsional Guided Waves Using Chirplet Transform (첩릿변환을 이용한 배관 결함 특성 규명)

  • Kim, Chung-Youb;Park, Kyung-Jo
    • Transactions of the Korean Society for Noise and Vibration Engineering
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    • v.24 no.8
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    • pp.636-642
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    • 2014
  • The sensor configuration of the magnetostrictive guided wave system can be described as a single continuous transducing element which makes it difficult to separate the individual modes from the reflected signal. In this work we develop the mode decomposition technique employing chirplet transform, which is able to separate the individual modes from dispersive and multimodal waveform measured with the magnetostrictive sensor, and to estimate the time-frequency centers and individual energies of the reflection, which would be used to locate and characterize defects. The reflection coefficients are calculated using the modal energies of the separated mode. Results from experimental results on a carbon steel pipe are presented, which show that the accurate and quantitative defect characterization could become enabled using the proposed technique.

A Size Evaluation for Continuous Flaw Monitoring Using the Tip Diffraction Method (초음파(超音波)의 Tip Diffraction 방법(方法)을 이용한 결함연속감시(缺陷連續監視)를 위한 크기 평가(評價))

  • Jung, H.K.;Cho, C.K.;Kim, B.C.
    • Journal of the Korean Society for Nondestructive Testing
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    • v.7 no.1
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    • pp.42-50
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    • 1987
  • Most of significant defects in the pressure boundaries of nuclear power plant we re dispositioned to be monitored periodically every inservice inspection. Due to the difficulty of the defect sizing during operation, it is necessary to develope the continuous flaw monitoring techniques. The Tip Diffraction method, specifically speaking, spot seems to be suitable for flaw monitoring. The optimum conditions of selecting the transducer were 3.5 MHz and 45-57 degree according to compatibility with the defect height. The effective calculation of the defect height was to assume the fact that the incident beam is parallel. This method would be supplemented to ASME method about the defect characterization for the surface flaw.

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The study of GaN-based semiconductors with low-defect density by microstructural characterization (미세구조 분석을 이용한 저밀도 결함을 가진 GaN계 반도체 연구)

  • Cho, Hyung-Koun
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2003.07a
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    • pp.424-427
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    • 2003
  • We have investigated the microstructural analysis of epitaxial lateral overgrowth (ELO), pendeoepitaxy (PE), and superlattice structures used as technology for the reduction of structural defects like dislocation in nitride semiconductors using transmission electron microscopy. We confirmed that the regrowth process such as ELO and PE is very effective technique on the reduction of threading dislocation (less than $10^6/cm^2$) in the specific area. However, to decrease the defect density in the whole nitride films and the suppress the generation of defect by regrowth, we should find the optimized conditions. Besides, the process using double PE and AlGaN/GaN superlattice structure showed no effect on the defect reduction up to now.

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Reconstruction Characteristics of MgO (111) Textured Protective Layer by Over-Frequency Accelerated Discharge in AC Plasma Display Pannel

  • Kwon, Sang-Koo;Kim, Jeong-Ho;Moon, Seung-Kyu;Kim, Hyun-Ha;Park, Kyu-Ho;Kim, Sung-Tae
    • 한국정보디스플레이학회:학술대회논문집
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    • 2007.08a
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    • pp.224-227
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    • 2007
  • The reconstruction characteristics of MgO (111) textured protective layer by over-frequency accelerated discharge in AC-PDP were investigated and correlated to the variations of electronic structures. The reconstruction process and exaggerated grain growth (EGG) were explained by defect-assisted 2-D nucleation and growth mechanism combined with charged cluster model.

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Defect Shape Recovering by Parameter Estimation Arising in Eddy Current Testing

  • Kojima, Fumio
    • Journal of the Korean Society for Nondestructive Testing
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    • v.23 no.6
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    • pp.622-634
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    • 2003
  • This paper is concerned with a computational method for recovering a crack shape of steam generator tubes of nuclear plants. Problems on the shape identification are discussed arising in the characterization of a structural defect in a conductor using data of eddy current inspection. A surface defect on the generator tube ran be detected as a probe impedance trajectory by scanning a pancake type coil. First, a mathematical model of the inspection process is derived from the Maxwell's equation. Second, the input and output relation is given by the approximate model by virtue of the hybrid use of the finite element and boundary element method. In that model, the crack shape is characterized by the unknown coefficients of the B-spline function which approximates the crack shape geometry. Finally, a parameter estimation technique is proposed for recovering the crack shape using data from the probe coil. The computational experiments were successfully tested with the laboratory data.

The Defect Characterization of Rare-earth Intensifying Screen Material by Doppler Broadening Positron Annihilation Spectrometer (도플러 넓어짐 스펙트럼을 이용한 희토류 증감지 결함 특성)

  • Lee C. Y.;Kim C. G.;Song G. Y.;Kim J. H.
    • Korean Journal of Materials Research
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    • v.15 no.6
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    • pp.370-374
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    • 2005
  • Doppler broadening spectrometer for positron annihilation experiment(DBPAS) has been used to characterize nano size defect structures in materials. DBPAS measures the concentration, spatial distribution, and size of open volume defects in the rare-earth intensifying screen materials. The screens were exposed by X-ray varying the exposed doses from 3, 6, 9, and 12 Gy with 6 W and 15 MV respectively and also irradiated by 37 MeV proton beams ranging from 0 to $10^{12}ptls$. The S parameter values increased as the exposed time and the energies increased, which indicated the defects were generated more. The S parameters of the samples with X-rays varied from 0.5098 to 0.5108, on the other hand, as proton beams varied from 0.4804 to 0.4821.