• Title/Summary/Keyword: 쉬프트 레지스터

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Dual Modulation Driving for Poly-Si TFT Active Matrix OLED Displays (다결정 실리콘 박막 트랜지스터 Active Matrix OLED 디스플레이를 위한 이중 변조 구동)

  • 김재근;정주영
    • Journal of the Institute of Electronics Engineers of Korea SD
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    • v.41 no.10
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    • pp.17-22
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    • 2004
  • We developed a new ANGLED display driving method which used both amplitude and pulse width modulation. For pulse width modulation, we divided a picture frame time into S sub-frames. For amplitude modulation, we used three OLED luminance(or current) levels which were controlled by TFT's gate voltages. By combining these two modulation methods, we obtained 35(=243) grey levels. And we designed a new data electrode driving circuit block with two shift registers without using DAC's. To verify the feasibility, we simulated the key circuit components by HSpice with TFT parameters extracted from current-voltage characteristics of 6${\mu}{\textrm}{m}$ channel length polysilicon TFT's. From the simulation results, we found that 320${\times}$240, dual scan, 243 grey level AMOLED display can be designed with this method.

A Testable PLA's Design for Multiple Faults (다중 고장 테스트가 가능한 PLA의 설계)

  • Lee, Jae-Min;Kim, Eun-Sung;Lim, In-Chil
    • Journal of the Korean Institute of Telematics and Electronics
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    • v.23 no.5
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    • pp.666-673
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    • 1986
  • This paper proposes a testable design method of PLA's with low overhead and high fault coverage for multiple faults. Only a shift register and control input of 2-bit decoder are used for extra hardware. By using a control input, the bit lines are controlled effectively. As the fault model, bridging faults and multiple faults of different fault models are particularly considered. 'Fault equivalence relation' and 'dominant faults' are defined to be used for detection of multiple faults. Also, an eadily testable folded PLA by this method is described.

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An Efficient Test Compression Scheme based on LFSR Reseeding (효율적인 LFSR 리시딩 기반의 테스트 압축 기법)

  • Kim, Hong-Sik;Kim, Hyun-Jin;Ahn, Jin-Ho;Kang, Sung-Ho
    • Journal of the Institute of Electronics Engineers of Korea SD
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    • v.46 no.3
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    • pp.26-31
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    • 2009
  • A new LFSR based test compression scheme is proposed by reducing the maximum number of specified bits in the test cube set, smax, virtually. The performance of a conventional LFSR reseeding scheme highly depends on smax. In this paper, by using different clock frequencies between an LFSR and scan chains, and grouping the scan cells, we could reduce smax virtually. H the clock frequency which is slower than the clock frequency for the scan chain by n times is used for LFSR, successive n scan cells are filled with the same data; such that the number of specified bits can be reduced with an efficient grouping of scan cells. Since the efficiency of the proposed scheme depends on the grouping mechanism, a new graph-based scan cell grouping heuristic has been proposed. The simulation results on the largest ISCAS 89 benchmark circuit show that the proposed scheme requires less memory storage with significantly smaller area overhead compared to the previous test compression schemes.

Low-power Design and Implementation of IMT-2000 Interpolation Filter using Add/Sub Processor (덧셈 프로세서를 사용한 IMT-2000 인터폴레이션 필터의 저전력 설계 및 구현)

  • Jang Young-Beom;Lee Hyun-Jung;Moon Jong-Beom;Lee Won-Sang
    • Journal of the Institute of Electronics Engineers of Korea SP
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    • v.42 no.1
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    • pp.79-85
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    • 2005
  • In this paper, low-power design and implementation techniques for IMT-2000 interpolation filter are proposed. Processor technique for DA(Distributed Arithmetic) filter and minimization technique for number of addition in CSD(Canonic Signed Digit) filter are utilized for low-power implementation. proposed filter structure consists of 3 blocks. In the first CSD coefficient block, every possible 4 bit CSD coefficients are calculated and stored. In second processor block, multiplication is done by MUX and addition processor in terms of filter coefficient. Finally, in third shift register block, multiplied values are output and stored in shift register. For IMT-2000 interpolation filter, proposed and conventional structures are implemented by using Verilog-HDL coding. Gate counts for the proposed structure is reduced to 31.57% comparison with those of the conventional one.

Filed Programmable Logic Control and Test Pattern Generation for IoT Multiple Object switch Control (사물인터넷 환경에서 다중 객체 스위치 제어를 위한 프로그래밍 가능한 로직제어 및 테스트 패턴 형성)

  • Kim, Eung-Ju;Jung, Ji-Hak
    • Journal of Internet of Things and Convergence
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    • v.6 no.1
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    • pp.97-102
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    • 2020
  • Multi-Channel Switch ICs for IoT have integrated several solid state structure low ON-resistance bi-directional relay MOS switches with level shifter to drive high voltage and they should be independently controlled by external serialized logic control. These devices are designed for using in applications requiring high-voltage switching control by low-voltage control signals, such as medical ultra-sound imaging, ink-jet printer control, bare board open/short and leakage test system using Kelvin 4-terminal measurement method. This paper describes implementation of analog switch control block and its verification using Field programmable Gate Array (FPGA) test pattern generation. Each block has been implemented using Verilog hardware description language then simulated by Modelsim and prototyped in a FPGA board. Compare to conventional IC, The proposed architecture can be applied to fields where multiple entities need to be controlled simultaneously in the IoT environment and the proposed pattern generation method can be applied to test similar types of ICs.

Synchronization Scheme Using Phase Offsets of PN Sequences (PN 부호의 위상오프셋을 이용한 동기 방법)

  • Song, Young-Joon;Han, Young-Yearl
    • Proceedings of the Korea Electromagnetic Engineering Society Conference
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    • 2003.11a
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    • pp.581-584
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    • 2003
  • It is important to know phase offsets of PN (Pseudo Noise) sequences in spread spectrum communications since the acquisition is equivalent to make a phase offset between a receiving PN sequence and a PN sequence of local PN generator be identical. In this paper, a phase offset enumeration method for PN sequences with error detection, and its application to the synchronization are proposed. The phase offset enumeration far an n-tuple PN sequence and its error detection are performed when one period of the sequence is received. Once the phase offset of the receiving sequence is calculated, we can easily accomplish the synchronization by initializing shift registers of a local PN generator according to the phase offset value. The mean acquisition time of the proposed synchronization method is derived analytically, and we see that the method acquires very fast acquisition in the high SNR (Signal-to- Noise Ratio) environment.

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Analysis of Code Sequence Generating Algorism and Implementation of Code Sequence Generator using Boolean Functions (부울함수를 이용한 부호계열 발생알고리즘 분석 부호계열발생기 구성)

  • Lee, Jeong-Jae
    • Journal of the Institute of Convergence Signal Processing
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    • v.13 no.4
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    • pp.194-200
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    • 2012
  • In this paper we analyze the code sequence generating algorism defined on $GF(2^n)$ proposed by S.Bostas and V.Kumar[7] and derive the implementation functions of code sequence generator using Boolean functions which can map the vector space $F_2^n$ of all binary vectors of length n, to the finite field with two elements $F_2$. We find the code sequence generating boolean functions based on two kinds of the primitive polynomials of degree, n=5 and n=7 from trace function. We then design and implement the code sequence generators using these functions, and produce two code sequence groups. The two groups have the period 31 and 127 and the magnitudes of out of phase(${\tau}{\neq}0$) autocorrelation and crosscorrelation functions {-9, -1, 7} and {-17, -1, 15}, satisfying the period $L=2^n-1$ and the correlation functions $R_{ij}({\tau})=\{-2^{(n+1)/2}-1,-1,2^{(n+l)/2}-1\}$ respectively. Through these results, we confirm that the code sequence generators using boolean functions are designed and implemented correctly.

A new design method of m-bit parallel BCH encoder (m-비트 병렬 BCH 인코더의 새로운 설계 방법)

  • Lee, June;Woo, Choong-Chae
    • Journal of the Institute of Convergence Signal Processing
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    • v.11 no.3
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    • pp.244-249
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    • 2010
  • The design of error correction code with low complexity has a good attraction for next generation multi-level cell flash memory. Sharing sub-expressions is effective method to reduce complexity and chip size. This paper proposes a new design method of m-bit parallel BCH encoder based on serial linear feedback shift register structure with low complexity using sub-expression. In addition, general algorithm for obtaining the sub-expression is introduced. The sub-expression can be expressed by matrix operation between sub-matrix of generator matrix and sum of two different variables. The number of the sub-expression is restricted by. The obtained sub-expressions can be shared for implementation of different m-parallel BCH encoder. This paper is not focused on solving a problem (delay) induced by numerous fan-out, but complexity reduction, expecially the number of gates.

Development of Continuous Capture Test Architecture in the Boundary Scan (경계면스캔에서의 연속캡쳐 시험구조 개발)

  • Jhang, Young-Sig;Lee, Chang-Hee
    • The KIPS Transactions:PartA
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    • v.16A no.2
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    • pp.79-88
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    • 2009
  • In boundary scan architecture, test stimuli are shifted in one at a time and applied to the on-chip system logic. The test results are captured into the BSR and are examined by subsequent shifting. In this paper, we developed a continuous capture test architecture and test procedure using TPG based on boundary scan is used to performance test. In this architecture, test patterns of TPG are applied to CUT with system clock rate, and response of CUT is continuously captured by CBSR(Continuous Capture Boundary Scan Register) at the same rate and the captured results is shifted to TDO at the same rate. The suggested a continuous capture test architecture and test procedure is simulated by Altera Max+Plus 10.0. The simulation results shows the accurate operation and effectiveness of the proposed test architecture and procedure.

Design of digitally controlled CMOS voltage mode DC-DC buck converter for high resolution duty ratio control (고해상도 듀티비 제어가 가능한 디지털 제어 방식의 CMOS 전압 모드 DC-DC 벅 변환기 설계)

  • Yoon, KwangSub;Lee, Jonghwan
    • Journal of IKEEE
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    • v.24 no.4
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    • pp.1074-1080
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    • 2020
  • This paper proposes a digitally controlled buck converter insensitive to process, voltage and temperature and capable of three modes of operation depending on the state of the output voltage. Conventional digital-controlled buck converters utilized A/D converters, counters and delay line circuits for accurate output voltage control, resulting in increasing the number of counter and delay line bits. This problem can be resolved by employing the 8-bit and 16-bit bidirectional shift registers, and this design technique leads a buck converter to be able to control duty ratio up to 128-bit resolution. The proposed buck converter was designed and fabricated with a CMOS 180 nano-meter 1-poly 6-metal process, generating an output voltage of 0.9 to 1.8V with the input voltage range of 2.7V to 3.6V, a ripple voltage of 30mV, and a power efficiency of up to 92.3%. The transient response speed of the proposed circuit was measured to be 4us.