A New Method for Determination the Parasitic Extrinsic Resistances of MESFETs and HEMTs from the Meaured S-parameters under Active Bias (측정된 S-파라미터에서 MESFET과 HEMT의 기생 저항을 구하는 새로운 방법)
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- The Journal of Korean Institute of Electromagnetic Engineering and Science
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- v.11 no.6
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- pp.876-885
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- 2000