The study of RF gain reduction due to air-bridge for CPW PHEMT's

CPW PHEMT의 에어브리지에 의한 이득 감소 현상에 대한 연구

  • 임병옥 (동국대학교 밀리미터파 신기술연구센터) ;
  • 강태신 (동국대학교 밀리미터파 신기술연구센터) ;
  • 이복형 (동국대학교 밀리미터파 신기술연구센터) ;
  • 이문교 (동국대학교 밀리미터파 신기술연구센터) ;
  • 이진구 (동국대학교 밀리미터파 신기술연구센터)
  • Published : 2003.12.01

Abstract

To analyze the effects of the air-bridge parasitic capacitances on the performance of coplanar waveguide pseudomorphic high electron mobility transistors (CPW PHEMTs), the gate-to-air-bridge ( $C_{ag}$ ) and the drain-to air-bridge ( $C_{ad}$ ) capacitances were taken into account plus the conventional pinched-off cold. FET circuit model. To examine the effects of the parasitic capacitances due to the air-bridges, a variety routing schemes for the air-bridge interconnection were adopted for fabricating the 0.1-${\mu}{\textrm}{m}$ $\Gamma$-gate length CPW HEMT's. According to air-bridge schemes, the $S_{21}$ gain is affected considerably. From the results of the fabricated CPW PHEMT, the $C_{ag}$ and $C_{ad}$ is one of the important factor of decreasing the gain of HEMTs.

에어브리지의 기생 커패시턴스의 영향을 분석하기 위해 CPW PHEMT의 기존 cold-FET 회로모델에 게이트-에어브리지의 기생 커패시턴스(C/sub ag/)차 드레인-에어브리지의 기생 커패시턴스(C/sub ad/)를 더해주었다. 또한 제안된 모델을 사용하여 소자의 parameter들을 추출하여, 그 존재를 확인하였다. 본 논문에서는 에어브리지에 의해 생성되는 기생 커패시턴스의 영향을 연구하기 위해 에어브리지의 여러 연결방법을 CPW PHEMT 제작에 접목시켰다. 또한 핀치오프상태의 cold-FET에 대한 개선된 등가회로 모델을 제시하여 에어브리지에 의한 기생 커패시턴스가 소자 특성에 어떤 영향을 주는 가를 분석하였다. 제작된 CPW PHEMT의 측정 결과로부터, 기생 커패시턴스 C/sub ag/와 C/sub ad/가 소자의 S/sub 21/ 이득을 감소시키는 중요한 요소임을 확인하였다.

Keywords

References

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