• Journal of Biosystems Engineering
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• v.24 no.2
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• pp.135-144
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• 1999

An yield monitoring system plays a key role in precision farming. An yield monitoring system and a DGPS were implemented to a widely used domestic combine for yield mapping of a small sized paddy field, and yield mapping algorithms were investigated in this study. The yield variation in the 0.1ha rice paddy field was measured by installing a yield flow sensor and a grain moisture sensor at the end of the clean grain elevator discharging grains into a grain tank. Yield map of the test filed was drawn in a point map and a linear interpolated map based on the result of the field test. The size of a unit yield grid in yield mapping was determined based on the combine traveling speed, effective harvesting width and data storing period. It was possible to construct the yield map of a small sized paddy field.

• Journal of the Korea Society for Simulation
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• v.14 no.1
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• pp.1-8
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• 2005

In the semiconductor manufacturing, yield enhancement is an urgent issue. It is ideal to prevent all the failures. However, when a failure occurs, it is important to quickly specify the cause stage and take countermeasure. Reviewing wafer level and composite lot level yield patterns has always been an effective way of identifying yield inhibitors and driving process improvement. This process is very time consuming and as such generally occurs only when the overall yield of a device has dropped significantly enough to warrant investigation. The automatic method of failure pattern extraction from fail bit map provides reduced time to analysis and facilitates yield enhancement. The automatic method of failure pattern extraction from fail bit map provides reduced time to analysis and facilitates yield enhancement. This paper describes the techniques to automatically classifies a failure pattern using a fail bit map.

• Proceedings of the Korean Society for Agricultural Machinery Conference
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• 2000.11b
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• pp.254-261
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• 2000

Soil chemical properties, relief of field surface, SPAD values and grain yield were investigated in a 0.5ha paddy field in 1999 to obtain basic field information for precision agriculture. Descriptive statistics of field information showed that the coefficient of variation ranged from 1.63% to 38.7%. Field information showed a high spatial dependence for within paddy field. The ranges of spatial dependence were from 15m to 60m, respectively. Kriged maps enable the visualization and comparison the spatial variability of field information. The causes of spatial variability of the field information could be explained rationally by a field management map. Grain yield was negatively correlated with pH, relief values, whereas, was positively correlated with total C, total N, C/N ratio, mineralizable N, available P and exchangeable K, Ca at the significant level of 1 %.

• Journal of the Semiconductor & Display Technology
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• v.5 no.1 s.14
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• pp.5-11
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• 2006

One of the most important is to insure that a new circuit design is qualified far release before it is scheduled for manufacturing, test, assembly and delivery. Due to various causes, there happens to be a low yield in the wafer process. Wafer test is a critical process in analyzing the chip characteristics in the EDS(electric die sorting) using analytic tools -wafer map, wafer summary and datalog. In this paper, we propose new analytic map algorithms for DDI chip test data. Using the proposed analytic map algorithms, we expect to improve the yield, quality and analysis time.

• Journal of Information Technology Applications and Management
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• v.15 no.1
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• pp.243-260
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• 2008

To prevent low yields in the semiconductor industry is crucial to the success of that industry. However, to prevent low yields is difficult because of too many factors to affect yield variation and their complex relation in the semiconductor manufacturing process. This study presents a new efficient detection methodology for detecting abnormal yields including high and low yields, which can forecast the yield level of a production unit (namely a lot) based on yield-related feature variables' behaviors. In the methodology, we use C5.0 to identify the yield-related feature variables that are the combination of correlated process variables associated with yield, use SOM (Self-Organizing Map) neural networks to extract and classify significant patterns of past abnormal yield lots and finally use C5.0 to generate classification rules for detecting abnormal yield lot. We illustrate the effectiveness of our methodology using a semiconductor manufacturing company's field data.

• Spatial Information Research
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• v.14 no.1 s.36
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• pp.115-128
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• 2006

The aim of the study is to select and verify for development of groundwater resources using Geographic Information System(GIS). The water balance, land cover, forest, soil, elevation, slope, hydrogeology and lineament were analyzed. Using GIS, relationship between the data and groundwater yield data was analyzed and the groundwater resources potential map was made for selecting suitable area for groundwater development. Then groundwater resource potential map was verified using groundwater yield data. The verified result showed the good agreement between the potential map and groundwater yield data. The potential map can be used for groundwater management which is related to groundwater development.

• Korean Journal of Remote Sensing
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• v.36 no.5_1
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• pp.725-733
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• 2020

The objectives of this study were (1) to develop a temporal mask map using MCD12Q1 data, and (2) to extract the annual variations in paddy, (3) to investigate the correlation analysis between MYD13Q1 NDVI and rice yield, and (4) to review its applicability. For these purposes, the temporal mask map was created using annual MCD12Q1 PFT data from 2002 to 2019, and compared with the fixed mask map. As a result, it found that the temporal mask map well reflected the variations of the paddy area. In addition, the correlation coefficient between NDVI and rice yield was also high significant as compared to the fixed mask map. Therefore, the temporal mask map will be useful for NDVI extraction, crop monitoring, and estimation of rice yield.

• Proceedings of the KSRS Conference
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• 2005.10a
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• pp.430-433
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• 2005

In this study, weight of evidence(WOE) technique based on the bayesian method was applied to estimate the groundwater yield characteristics in the Pocheon area in Kyungki-do. The ground water preservation depends on many hydrogeologic factors that include hydrologic data, landuse data, topographic data, geological map and other natural materials, even with man-made things. All these data can be digitally collected and managed by GIS database. In the applied technique of WOE, The prior probabilities were estimated as the factors that affect the yield on lineament, geology, drainage pattern or river system density, landuse and soil. We calculated the value of the Weight W+, W- of each factor and estimated the contrast value of it. Results by the ground water yield characteristic calculations were presented in the form of posterior probability map to the consideration of in-situ samples. It is concluded that this technique is regarded as one of the effective technique for the feasibility mapping related to detection of groundwater bearing zones and its spatial pattern.

• Proceedings of the IEEK Conference
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• 2003.07b
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• pp.703-706
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• 2003

Yield enhancement in semiconductor fabrication is important. It is ideal to prevent all the failures. However, when a failure occurs, it is important to quickly specify the cause stage and take countermeasure. The automatic method of failure pattern extraction from fail bit map provides reduced time to analysis and facilitates yield enhancement. This paper describes the techniques to automatically classifies a failure pattern using a fail bit map, a new simple schema which facilitates the failure analysis.

• Proceedings of the KIEE Conference
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• 1998.07g
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• pp.2547-2549
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• 1998

Automatic yield-test equipment for micro mirror array using image processing was developed. This computerized test equipment can classify the error states of the micromirrors. The test results are displayed on the monitor as a map which shows the error states and position. It is possible to measure yield and reliability with this test equipment for micromirror array using image processing.