Journal of the Semiconductor & Display Technology (반도체디스플레이기술학회지)
- Volume 5 Issue 1 Serial No. 14
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- Pages.5-11
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- 2006
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- 1738-2270(pISSN)
Analytic Map Algorithms of DDI Chip Test Data
DDI 칩 테스트 데이터 분석용 맵 알고리즘
- Hwang Kum-Ju (Electronic Engineering, Chungbuk National University) ;
- Cho Tae-Won (School of Electronic & Computer Engineering, Chungbuk National University)
- Published : 2006.03.01
Abstract
One of the most important is to insure that a new circuit design is qualified far release before it is scheduled for manufacturing, test, assembly and delivery. Due to various causes, there happens to be a low yield in the wafer process. Wafer test is a critical process in analyzing the chip characteristics in the EDS(electric die sorting) using analytic tools -wafer map, wafer summary and datalog. In this paper, we propose new analytic map algorithms for DDI chip test data. Using the proposed analytic map algorithms, we expect to improve the yield, quality and analysis time.