• Title/Summary/Keyword: latch-up

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Development of Walking Type Chinese Cabbage Transplanter (보행형 배추정식기 개발)

  • Park S. H.;Kim J. Y.;Choi D. K.;Kim C. K.;Kwak T. Y.;Cho S. C.
    • Journal of Biosystems Engineering
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    • v.30 no.2 s.109
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    • pp.81-88
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    • 2005
  • Manual transplanting Chinese cabbage needs 184 hours per ha in Korea. Mechanization of Chinese cabbage transplanting operation has been highly required because it needs highly intensive labor during peak season. This study was conducted to developed walking-type Chinese cabbage transplanter. In order to find out design factor of the transplanter, a kinematic analysis software, RecurDyn, was used. The prototype was tested in the circular soil bin and its operating motion was captured and analyzed using high speed camera system. Prototype was one row type which utilized original parts of engine, transmission and etc. from walking-type rice transplanter in order to save the manufacturing cost. Success ratio of pick-up device of hole-pin type and latch type were $96.0\%$ and $99.2\%$, respectively. which was highly affected by feeding accuracy of feeding device of seedling. Transplanting device of the prototype produced a elliptic loci which were coincident with those produced by the computer simulation. Prototype proved good performance in transplanting with mulching and without mulching operation, either. Working performance of prototype was 22 hours per ha and operation cost of the prototype was 961,757 won per ha. So, it would reduce $88\%$ of the labor and $29\%$ of operation cost.

The novel SCR-based ESD Protection Circuit with High Holding Voltage Applied for Power Clamp (파워 클램프용 높은 홀딩전압을 갖는 사이리스터 기반 새로운 구조의 ESD 보호회로)

  • Lee, Byung-Seok;Kim, Jong-Min;Byeon, Joong-Hyeok;Park, Won-Suk;Koo, Yong-Seo
    • Journal of IKEEE
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    • v.17 no.2
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    • pp.208-213
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    • 2013
  • In this paper, we proposed the novel SCR-based ESD protection circuit with high holding voltage for power clamp. In order to increase the holding voltage, the floating p+ and n+ to n-well and p-well, respectively, in the conventional SCR. The resulting increase of the holding voltage of the our proposed ESD circuit enables the high latch-up immunity. The electrical characteristics including ESD robustness of the proposed ESD circuit have been simulated using Synopsys TCAD simulator. According to the simulation result, the proposed device has higher holding voltage of 4.98 V than that of the conventional SCR protection circuit. Moreover, it is confirmed that the device could have the holding voltage of maximum 13.26 V with the size variation of floated diffusion area.

Analysis of SCR, MVSCR, LVTSCR With I-V Characteristic and Turn-On-Time (SCR, MVSCR, LVTSCR의 Turn-on time 및 전기적 특성에 관한 연구)

  • Lee, Joo-Young
    • Journal of IKEEE
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    • v.20 no.3
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    • pp.295-298
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    • 2016
  • In this paper, we analysed the properties of the conventional ESD protection devices such as SCR, MVSCR, LVTSCR. The electrical characteristics and the turn-on time properties are simulated by Synopsys T-CAD simulator. As the results, the devices have the holding voltages between 2V and 3V, and the trigger voltage of about 20V with SCR, of about 12V with MVSCR, of about 9V with LVTSCR. The results of the simulation for the turn-on time properties are 2.8ns of SCR, 2.2ns of MVSCR, 2.0ns of LVTSCR. Thus, we prove that LVTSCR has the shortest turn-on time. However, the second breakdown currents(It2) of the devices are 7.7A of SCR, 5.5A of MVSCR, 4A of LVTSCR. This different properties have to be adapted by the operation voltages for I/O Clamps.

A Study on Malfunction Mode of CMOS IC Under Narrow-Band High-Power Electromagnetic Wave (협대역 고출력 전자기파로 인한 CMOS IC에서의 오동작 특성 연구)

  • Park, Jin-Wook;Huh, Chang-Su;Seo, Chang-Su;Lee, Sung-Woo
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.29 no.9
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    • pp.559-564
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    • 2016
  • This study examined the malfunction mode of the HCMOS IC under narrow-band high-power electromagnetic wave. Magnetron is used to a narrow-band electromagnetic source. MFR (malfunction failure rate) was measured to investigate the HCMOS IC. In addition, we measured the resistance between specific pins of ICs, which are exposed and not exposed to the electromagnetic wave, respectively. As a test result of measurement, malfunction mode is shown in three steps. Flicker mode causing a flicker in LED connected to output pin of IC is dominant in more than 7.96 kV/m electric field. Self-reset mode causing a voltage drop to the input and output of IC during electromagnetic wave radiation is dominant in more than 9.1 kV/m electric field. Power-reset mode making a IC remained malfunction after electromagnetic radiation is dominant in more than 20.89 kV/m. As a measurement result of pin-to-pin resistance of IC, the differences between IC exposed to electromagnetic wave and normal IC were minor. However, the five in two hundred IC show a relatively low resistance. This is considered to be the result of the breakdown of pn junction when latch-up in CMOS occurred. Based on the results, the susceptibility of HCMOS IC can be applied to a basic database to IC protection and impact analysis of narrow-band high-power electromagnetic waves.

A Study on the Stabilization of Generating Negative Voltage for IT Equipments using Microcontroller (마이크로컨트롤러를 이용한 IT 기기용 마이너스 전압 생성의 안정화에 관한 연구)

  • Lee, Hyun-Chang
    • Journal of Convergence for Information Technology
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    • v.11 no.6
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    • pp.7-13
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    • 2021
  • In this paper, the function of starting the negative voltage used in the IT equipment when it is generated and the method of controlling it using a microcontroller for the function to detect the overload and respond to it are presented. To do this, the limitations of the existing negative voltage generation circuit and the problems that occur during overload were analyzed, and a circuit that detects and controls the overload condition without a separate current sensing circuit was presented. In order to confirm the effect of the proposed method, an experiment was conducted by configuring an experimental circuit. As a result of the experiment, compared to the existing negative voltage generation circuit, which falls into a latch-up state when overloaded and enters a dangerous state, the proposed circuit detects this, stop the operation of the circuit, and informs the user of such an abnormal state to take action. have. In addition, since the starting point of the circuit is determined according to the system state, the experimental result was confirmed that the starting time was significantly shortened by about 23% compared to the time switch method.

A study on SCR-based bidirectional ESD protection device with high holding voltage due to parallel NPN BJT (Parallel NPN BJT로 인한 높은 홀딩 전압을 갖는 SCR 기반 양방향 ESD 보호 소자에 관한 연구)

  • Jung, Jang-Han;Woo, Je-Wook;Koo, Yong-Seo
    • Journal of IKEEE
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    • v.25 no.4
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    • pp.735-740
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    • 2021
  • In this paper, we propose a new ESD protection device with high holding voltage with low current gain of parasitic NPN BJT by improving the structure of the existing LTDDSCR. The electrical characteristics of the proposed protection device were analyzed by HBM simulation using Synopsys' TCAD simulation, and the operation of the added BJT was confirmed by current flow, impact ionization and recombination simulation. In addition, the holding voltage characteristics were optimized with the design variables D1 and D2. As a result of the simulation, it was verified that the new ESD protection device has a higher holding voltage compared to the existing LTDDSCR and has a symmetrical bidirectional characteristic. Therefore, the proposed ESD protection device has high area efficiency when applied to an IC and is expected to improve the reliability of the IC.

A 0.16㎟ 12b 30MS/s 0.18um CMOS SAR ADC Based on Low-Power Composite Switching (저전력 복합 스위칭 기반의 0.16㎟ 12b 30MS/s 0.18um CMOS SAR ADC)

  • Shin, Hee-Wook;Jeong, Jong-Min;An, Tai-Ji;Park, Jun-Sang;Lee, Seung-Hoon
    • Journal of the Institute of Electronics and Information Engineers
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    • v.53 no.7
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    • pp.27-38
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    • 2016
  • This work proposes a 12b 30MS/s 0.18um CMOS SAR ADC based on low-power composite switching with an active die area of $0.16mm^2$. The proposed composite switching employs the conventional $V_{CM}$-based switching and monotonic switching sequences while minimizing the switching power consumption of a DAC and the dynamic offset to constrain a linearity of the SAR ADC. Two equally-divided capacitors topology and the reference scaling are employed to implement the $V_{CM}$-based switching effectively and match an input signal range with a reference voltage range in the proposed C-R hybrid DAC. The techniques also simplify the overall circuits and reduce the total number of unit capacitors up to 64 in the fully differential version of the prototype 12b ADC. Meanwhile, the SAR logic block of the proposed SAR ADC employs a simple latch-type register rather than a D flip-flop-based register not only to improve the speed and stability of the SAR operation but also to reduce the area and power consumption by driving reference switches in the DAC directly without any decoder. The measured DNL and INL of the prototype ADC in a 0.18um CMOS are within 0.85LSB and 2.53LSB, respectively. The ADC shows a maximum SNDR of a 59.33dB and a maximum SFDR of 69.83dB at 30MS/s. The ADC consumes 2.25mW at a 1.8V supply voltage.

An Electrical Properties Analysis of CMOS IC by Narrow-Band High-Power Electromagnetic Wave (협대역 고출력 전자기파에 의한 CMOS IC의 전기적 특성 분석)

  • Park, Jin-Wook;Huh, Chang-Su;Seo, Chang-Su;Lee, Sung-Woo
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.30 no.9
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    • pp.535-540
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    • 2017
  • The changes in the electrical characteristics of CMOS ICs due to coupling with a narrow-band electromagnetic wave were analyzed in this study. A magnetron (3 kW, 2.45 GHz) was used as the narrow-band electromagnetic source. The DUT was a CMOS logic IC and the gate output was in the ON state. The malfunction of the ICs was confirmed by monitoring the variation of the gate output voltage. It was observed that malfunction (self-reset) and destruction of the ICs occurred as the electric field increased. To confirm the variation of electrical characteristics of the ICs due to the narrow-band electromagnetic wave, the pin-to-pin resistances (Vcc-GND, Vcc-Input1, Input1-GND) and input capacitance of the ICs were measured. The pin-to-pin resistances and input capacitance of the ICs before exposure to the narrow-band electromagnetic waves were $8.57M{\Omega}$ (Vcc-GND), $14.14M{\Omega}$ (Vcc-Input1), $18.24M{\Omega}$ (Input1-GND), and 5 pF (input capacitance). The ICs exposed to narrow-band electromagnetic waves showed mostly similar values, but some error values were observed, such as $2.5{\Omega}$, $50M{\Omega}$, or 71 pF. This is attributed to the breakdown of the pn junction when latch-up in CMOS occurred. In order to confirm surface damage of the ICs, the epoxy molding compound was removed and then studied with an optical microscope. In general, there was severe deterioration in the PCB trace. It is considered that the current density of the trace increased due to the electromagnetic wave, resulting in the deterioration of the trace. The results of this study can be applied as basic data for the analysis of the effect of narrow-band high-power electromagnetic waves on ICs.

Implementation of the Digital Current Control System for an Induction Motor Using FPGA (FPGA를 이용한 유도 전동기의 디지털 전류 제어 시스템 구현)

  • Yang, Oh
    • Journal of the Korean Institute of Telematics and Electronics C
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    • v.35C no.11
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    • pp.21-30
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    • 1998
  • In this paper, a digital current control system using a FPGA(Field Programmable Gate Array) was implemented, and the system was applied to an induction motor widely used as an industrial driving machine. The FPGA designed by VHDL(VHSIC Hardware Description Language) consists of a PWM(Pulse Width Modulation) generation block, a PWM protection block, a speed measuring block, a watch dog timer block, an interrupt control block, a decoder logic block, a wait control block and digital input and output blocks respectively. Dedicated clock inputs on the FPGA were used for high-speed execution, and an up-down counter and a latch block were designed in parallel, in order that the triangle wave could be operated at 40 MHz clock. When triangle wave is compared with many registers respectively, gate delay occurs from excessive fan-outs. To reduce the delay, two triangle wave registers were implemented in parallel. Amplitude and frequency of the triangle wave, and dead time of PWM could be changed by software. This FPGA was synthesized by pASIC 2SpDE and Synplify-Lite synthesis tool of Quick Logic company. The final simulation for worst cases was successfully performed under a Verilog HDL simulation environment. And the FPGA programmed for an 84 pin PLCC package was applied to digital current control system for 3-phase induction motor. The digital current control system of the 3 phase induction motor was configured using the DSP(TMS320C31-40 MHz), FPGA, A/D converter and Hall CT etc., and experimental results showed the effectiveness of the digital current control system.

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