• Journal of the Korea Institute of Information and Communication Engineering
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• v.24 no.7
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• pp.885-890
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• 2020

In the distance measurement system the time-to-digital conversion circuit used measures the distance using the time interval between the start signal and the stop signal. The time interval is generally converted to digital information using a counter circuit considering the response speed. Therefore, a clock signal with a high frequency is required to improve precision, and a clock signal with a high frequency is also required to measure fine distances. In this paper, a counter circuit was designed to increase the accuracy of distance measurement while using the same frequency. The circuit design was performed using a 0.18㎛ CMOS process technology, and the operation of the designed circuit was confirmed through HSPICE simulation. As a result of the simulation, it is possible to obtain an improvement of four times the precision compared to the case of using a general counter circuit.

• ETRI Journal
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• v.30 no.2
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• pp.275-281
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• 2008

A 40 Gb/s clock and data recovery (CDR) module for a fiber-optic receiver with improved phase-locked loop (PLL) circuits has been successfully implemented. The PLL of the CDR module employs an improved D-type flip-flop frequency acquisition circuit, which helps to stabilize the CDR performance, to obtain faster frequency acquisition, and to reduce the time of recovering the lock state in the event of losing the lock state. The measured RMS jitter of the clock signal recovered from 40 Gb/s pseudo-random binary sequence ($2^{31}-1$) data by the improved PLL clock recovery module is 210 fs. The CDR module also integrates a 40 Gb/s D-FF decision circuit, demonstrating that it can produce clean retimed data using the recovered clock.

• JSTS:Journal of Semiconductor Technology and Science
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• v.7 no.4
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• pp.215-220
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• 2007

Leakage current of CMOS circuits has become a major factor in VLSI design these days. Although many circuit-level techniques have been developed, most of them require significant amount of designers' effort and are not aligned well with traditional VLSI design process. In this paper, we focus on technology mapping, which is one of the steps of logic synthesis when gates are selected from a particular library to implement a circuit. We take a radical approach to push the limit of technology mapping in its capability of suppressing leakage current: we use a probabilistic leakage (together with delay) as a cost function that drives the mapping; we consider pin reordering as one of options in the mapping; we increase the library size by employing gates with larger gate length; we employ a new flipflop that is specifically designed for low-leakage through selective increase of gate length. When all techniques are applied to several benchmark circuits, leakage saving of 46% on average is achieved with 45-nm predictive model, compared to the conventional technology mapping.

• JSTS:Journal of Semiconductor Technology and Science
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• v.11 no.4
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• pp.302-308
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• 2011

In this paper, we have proposed a new approach for optical failure analysis which employs a CMOS photon-emitting circuitry, consisting of a flip-flop based on a sense amplifier and a photon-emitting device. This method can be used even with deep-submicron processes where conventional optical failure analyses are difficult to use due to the low sensitivity in the near infrared (NIR) region of the spectrum. The effectiveness of our approach has been proved by the failure analysis of a prototype designed and fabricated in 0.18 ${\mu}m$ CMOS process.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.48 no.2
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• pp.20-27
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• 2011

A CMOS Image Sensor(CIS) mounted on mobile appliances always needs a low power consumption because of the battery life cycle. In this paper, we propose novel power reduction techniques such as a data flip-flop circuit with leakage current elimination, a low power single slope A/D converter with a novel comparator, and etc. Based on 0.13um CMOS process, the chip satisfies QVGA resolution($320{\times}240$ pixels) whose pitch is 2.25um and whose structure is 4-Tr active pixel sensor. From the experimental results, the ADC in the middle of CIS has a 10-b resolution, the operating speed of CIS is 16 frame/s, and the power dissipation is 25mW at 3.3V(Analog)/1.8V(Digital) power supply. When we compare the proposed CIS with conventional ones, the power consumption is reduced approximately by 22% in sleep mode, 20% in operating mode.

• The Journal of Korean Institute of Communications and Information Sciences
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• v.14 no.3
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• pp.235-239
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• 1989

A multiplier is proposed for computing multiplication of two arbitrary elements in the finite fields GF($2^m$), and the operation process is described step by step. The modified type of the circuit which is constructed with m-stage feedgack shift register, m-1 flip-flop, m AND gate, and m-input XOR gate is presented by referring to the conventional shift-register multiplier. At the end of mth shift, the shift-register multiplier stores the product of two elements of GF($2^m$); however the proposed circuit in this paper requires m-1 clock times from first input to first output. This circuit is simpler than cellulra-array or systolic multiplier and moreover it is faster than systolic multiplier.

• Journal of the Korean Institute of Electrical and Electronic Material Engineers
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• v.21 no.8
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• pp.719-726
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• 2008

In this paper, we designed driving IC for 500 V resonant half-bridge type power converter, In this single-ended level shifter, chip area and power dissipation was decreased by 50% and 23.5% each compared to the conventional dual-ended level shifter. Also, this newly designed circuit solved the biggest problem of conventional flip-flop type level shifter in which the power MOSFET were turned on simultaneously due to the large dv/dt noise. The proposed high side level shifter included switching noise protection circuit and schmmit trigger to minimize the effect of displacement current flowing through LDMOS of level shifter when power MOSFET is operating. The designing process was proved reasonable by conducting Spectre and PSpice simulation on this circuit using 1${\mu}m$ BCD process parameter.

• Journal of information and communication convergence engineering
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• v.20 no.2
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• pp.137-142
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• 2022

Monolithic three-dimensional (M3D) logics such as M3D-NAND, M3D-NOR, M3D-buffer, M3D 2×1 multiplexer, and M3D D flip-flop, consisting of modularized M3D inverters (M3D-INVs), have been proposed. In the previous M3D logic, each M3D logic had to be designed separately for a standard cell library. The proposed M3D logic is designed by placing modularized M3D-INVs and connecting interconnects such as metal lines or monolithic inter-tier-vias between M3D-INVs. The electrical characteristics of the previous and proposed M3D logics were simulated using the technology computer-aided design and Simulation Program with Integrated Circuit Emphasis with the extracted parameters of the previously developed LETI-UTSOI MOSFET model for n- and p-type MOSFETs and the extracted external capacitances. The area, propagation delay, falling/rising times, and dynamic power consumption of the proposed M3D logic are lower than those of previous versions. Despite the larger space and lower performance of the proposed M3D logic in comparison to the previous versions, it can be easily designed with a single modularized M3D-INV and without having to design all layouts of the logic gates separately.

• ETRI Journal
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• v.25 no.3
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• pp.187-194
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• 2003

Delay testing has become an area of focus in the field of digital circuits as the speed and density of circuits have greatly improved. This paper proposes a new scan flip-flop and test algorithm to overcome some of the problems in delay testing. In the proposed test algorithm, the second test pattern is generated by scan justification, and the first test pattern is processed by functional justification. In the conventional functional justification, it is hard to generate the proper second test pattern because it uses a combinational circuit for the pattern. The proposed scan justification has the advantage of easily generating the second test pattern by direct justification from the scan. To implement our scheme, we devised a new scan in which the slave latch is bypassed by an additional latch to allow the slave to hold its state while a new pattern is scanned in. Experimental results on ISCAS'89 benchmark circuits show that the number of testable paths can be increased by about 45 % over the conventional functional justification.

• The Transactions of the Korean Institute of Electrical Engineers P
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• v.53 no.4
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• pp.210-215
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• 2004

This paper proposes an implicit method for computing the minimum cost feedback vertex set for a graph. For an arbitrary graph, a Boolean function is derived, whose satisfying assignments directly correspond to feedback vertex sets of the graph. Importantly, cycles in the graph are never explicitly enumerated, but rather, are captured implicitly in this Boolean function. This function is then used to determine the minimum cost feedback vertex set. Even though computing the minimum cost satisfying assignment for a Boolean function remains an NP-hard problem, it is possible to exploit the advances made in the area of Boolean function representation in logic synthesis to tackle this problem efficiently in practice for even reasonably large sized graphs. The algorithm has obvious application in flip-flop selection for partial scan. The algorithm proposed in this paper is the first to obtain the MFVS solutions for many benchmark circuits.