• Proceedings of the Optical Society of Korea Conference
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• 1998.08a
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• pp.70-71
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• 1998

• Korean Journal of Optics and Photonics
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• v.9 no.5
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• pp.342-347
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• 1998

We present a theoretical analysis of Gaussian beam propagation in nonlinear Kerr media by using aberration-free approximation and Huygens-Fresnel diffraction integral and obtain a simple analytic formular for Z-scan characteristics. Z-scan experiments are carried out on amorphous $As_2S_3$ thin film and compared with the theory developed, showing good agreement. The sign and the value of ${\gamma}$ have been measured at 633 nm to be $+8.65{\times}10^{-6}\textrm{cm}^2/W$. We also measured the far-field intensity profiles, which confirm again self-focusing effect.

• Proceedings of the Optical Society of Korea Conference
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• 2004.02a
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• pp.40-41
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• 2004

• The Journal of Natural Sciences
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• v.7
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• pp.11-17
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• 1995

The optical nonlinear refractive index of $Bil_3$ semiconductor microcluster colloid has been measured by the Z-scan method with circular symmetric beam. The value of nonlinear refractive index was -1.53 x $10^12($cm^2/W) at $0.532\mum$and the nonlinearities were mainly due to thermal effect induced by 20 ns laser pulse. And the absorption coefficient was measured to be -$10^8$(cm/W)

• Proceedings of the Optical Society of Korea Conference
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• 1999.08a
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• pp.190-191
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• 1999

• Korean Journal of Optics and Photonics
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• v.6 no.4
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• pp.345-351
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• 1995

We have studied experimentally the propagation characteristics of fundamental dark spatial solitons on finite-width backgrounds and conpared with the result of numerical simulations. It was verified experimentally that the width of dark solitons decreased but that of background increased as the beam intensity increased. The refractive index change obtained from soliton constant, which is for infinite-width background, was smaller than that from Z-scan method. Numerical simulations of fundamental dark solitons on a finite-width backgrounds showed that the peak intensity of background, the width of dark soliton and the soliton constant varied with the propagation length. If the change of soliton constant on finite-width backgrounds was considered, the refractive index change was in good agreement with that from Z-scan method. ethod.

• Korean Journal of Optics and Photonics
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• v.5 no.4
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• pp.481-486
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• 1994

We demonstrate z-scan method as a tool for investigating the molecular orientational order in organic solution when high static electric field is applied. Experiments are performed for the solution of 0.5% (by weight) 4-dimethylamino-4'-nitrostilbene in cyclopentanone and nonlinear refractive index $n_{2}$, is measured to be $-0.905\times10^{-8}\textrm{cm}^2/MW$ at $1.064{\mu}m$. When static electric field of 3.45 KV fmm is applied, the anisotropy ratio of n, is measured to be 1.34 and the molecular orientational order parameters $

_2 and

_4$ are found to be 0.092 and -0.128, respectively. ively.

• Journal of Korean Dental Science
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• v.13 no.1
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• pp.28-34
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• 2020

Purpose: The purpose of this study was to investigate the influence of different implant computer software on the accuracy of image registration between radiographic and optical scan data. Materials and Methods: Cone-beam computed tomography and optical scan data of a partially edentulous jaw were collected and transferred to three different computer softwares: Blue Sky Plan (Blue Sky Bio), Implant Studio (3M Shape), and Geomagic DesignX (3D systems). In each software, the two image sets were aligned using a point-based automatic image registration algorithm. Image matching error was evaluated by measuring the linear discrepancies between the two images at the anterior and posterior area in the direction of the x-, y-, and z-axes. Kruskal-Wallis test and a post hoc Mann-Whitney U-test with Bonferroni correction were used for statistical analyses. The significance level was set at 0.05. Result: Overall discrepancy values ranged from 0.08 to 0.30 ㎛. The image registration accuracy among the software was significantly different in the x- and z-axes (P=0.009 and <0.001, respectively), but not different in the y-axis (P=0.064). Conclusion: The image registration accuracy performed by a point-based automatic image matching could be different depending on the computer software used.

• 한국신재생에너지학회:학술대회논문집
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• 2011.11a
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• pp.60.2-60.2
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• 2011

A study of the non-linear optical properties of nanocrystal-Si embedded in SiO2 has been performed by using the z-scan method in the nanosecond and femtosecond ranges. Substoichiometric SiOx films were grown by plasma-enhanced chemical-vapor deposition(PECVD) on silica substrates for Si excesses up to 24 at/%. An annealing at $1250^{\circ}C$ for 1 hour was performed in order to precipitate nanocrystal-Si, as shown by EFTEM images. Z-scan results have shown that, by using 5-ns pulses, the non-linear process is ruled by thermal effects and only a negative contribution can be observed in the non-linear refractive index, with typical values around $-10-10cm^2/W$. On the other hand, femtosecond excitation has revealed a pure electronic contribution to the nonlinear refractive index, obtaining values in the order of 10-12 cm2/W. Simulations of heat propagation have shown that the onset of the temperature rise is delayed more than half pulse-width respect to the starting edge of the excitation. A maximum temperature increase of ${\Delta}T=123.1^{\circ}C$ has been found after 3.5ns of the laser pulse maximum. In order to minimize the thermal contribution to the z-scan transmittance and extract the electronic part, the sample response has been analyzed during the first few nanoseconds. By this method we found a reduction of 20% in the thermal effects. So that, shorter pulses have to be used obtain just pure electronic nonlinearities.

• Proceedings of the Korean Vacuum Society Conference
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• 2010.08a
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• pp.58-58
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• 2010

Reactive or unstable adsorbates are often difficult to study spectroscopically. They may have, for instance, resonance states lying close to the Fermi level, inducing them to desorb or decompose by the probe itself, low-energy tunneling electrons. In order to overcome this limitation, we developed a novel method, which we call x-ramp scan. The method sweeps the bias voltage, with the simutaneous scan along the imaging direction, in a constant current mode. This mapping yields the tip-height variation as a function of bias, or Z(V), at nominally always fresh surface. We applied this method to the investigation of methanol-induced molecular features, attributed to methoxy, found on NiAl(110) surface. These were produced by methanol molecules deposited by a pulse injection method onto the metallic surface. Our study shows adsorbed methoxy are very reactive to the bias voltage, rendering the standard spectroscopy useless. Our new x-ramp scan shows that the decomposition of adsorbates occurs at the sample bias of 3.63 V, and proceeds with the lifetime of a few milliseconds. The details of the method will be provided at the discussion.