• Title/Summary/Keyword: Weibull Lifetime

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A study of lifetime prediction of PV module using damp heat test (고온고습 시험을 이용한 실리콘 태양전지 모듈의 수명 예측 연구)

  • Oh, Won Wook;Kang, Byung Jun;Park, Nochang;Tark, Sung Ju;Kim, Young Do;Kim, Donghwan
    • 한국신재생에너지학회:학술대회논문집
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    • 2011.11a
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    • pp.63.1-63.1
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    • 2011
  • To analyze the phenomenon of corrosion in the PV module, we experimented damp heat test at $85^{\circ}C$/85% relative humidity(RH) and $65^{\circ}C$/85% RH for 2,000 hours, respectively. We used 30 mini-modules designed of 6inch one cell. Despite of 2,000 hours test, measured $P_{max}$ is not reached failure which is defined less than 80% compared to initial $P_{max}$. Therefore, we calculate proper curve fitting over 2,000 hours. Data less than 80% $P_{max}$ is found and B10 lifetime is calculated by the number of failure specimens and weibull distribution. Using B10 lifetime that the point of failure rate 10% and Peck's model, the predictable equation of lifetime was derived under temperature and humidity condition.

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Robust second-order rotatable designs invariably applicable for some lifetime distributions

  • Kim, Jinseog;Das, Rabindra Nath;Singh, Poonam;Lee, Youngjo
    • Communications for Statistical Applications and Methods
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    • v.28 no.6
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    • pp.595-610
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    • 2021
  • Recently a few articles have derived robust first-order rotatable and D-optimal designs for the lifetime response having distributions gamma, lognormal, Weibull, exponential assuming errors that are correlated with different correlation structures such as autocorrelated, intra-class, inter-class, tri-diagonal, compound symmetry. Practically, a first-order model is an adequate approximation to the true surface in a small region of the explanatory variables. A second-order model is always appropriate for an unknown region, or if there is any curvature in the system. The current article aims to extend the ideas of these articles for second-order models. Invariant (free of the above four distributions) robust (free of correlation parameter values) second-order rotatable designs have been derived for the intra-class and inter-class correlated error structures. Second-order rotatability conditions have been derived herein assuming the response follows non-normal distribution (any one of the above four distributions) and errors have a general correlated error structure. These conditions are further simplified under intra-class and inter-class correlated error structures, and second-order rotatable designs are developed under these two structures for the response having anyone of the above four distributions. It is derived herein that robust second-order rotatable designs depend on the respective error variance covariance structure but they are independent of the correlation parameter values, as well as the considered four response lifetime distributions.

A generalized likelihood ratio chart for monitoring type I right-censored Weibull lifetimes (제1형 우측중도절단된 와이블 수명자료를 모니터링하는 GLR 관리도)

  • Han, Sung Won;Lee, Jaeheon
    • The Korean Journal of Applied Statistics
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    • v.30 no.5
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    • pp.647-663
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    • 2017
  • Weibull distribution is a popular distribution for modeling lifetimes because it reflects the characteristics of failure adequately and it models either increasing or decreasing failure rates simply. It is a standard method of the lifetimes test to wait until all samples failed; however, censoring can occur due to some realistic limitations. In this paper, we propose a generalized likelihood ratio (GLR) chart to monitor changes in the scale parameter for type I right-censored Weibull lifetime data. We also compare the performance of the proposed GLR chart with two CUSUM charts proposed earlier using average run length (ARL). Simulation results show that the Weibull GLR chart is effective to detect a wide range of shift sizes when the shape parameter and sample size are large and the censoring rate is not too high.

Two Factors Failure Model of Oil-Paper Insulation Aging under Electrical and Thermal Multistress

  • Li, Jian;Wang, Yan;Bao, Lianwei
    • Journal of Electrical Engineering and Technology
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    • v.9 no.3
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    • pp.957-963
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    • 2014
  • Converter transformers play important roles in high-voltage direct current transmission systems. This paper presents experimental and analysis results of the combined electrical and thermal aging of oil-impregnated paper at pulsating DC voltages. Breakdown voltages and time-to-breakdown of oil-paper specimens were measured by using short-time and constant-stress tests. The breakdown characteristics of combined electrical and thermal aging on insulation system were discussed. According to the relationship between failure time and aging temperature, the two-parameter Weibull model was improved. On the basis of the competing risk algorithm and the improved Weibull model, the two factors failure model was calculated. And the influence of temperature in the insulation system has been analyzed. This model performs better than the two-parameter Weibull model when both time and temperature are considered as variables in estimating the lifetime of oil-paper insulation.

Optimal Periodic Preventive Maintenance Schedule When Preventive Maintenance is Imperfect (예방보전이 불완전할 때 최적 주기적 예방보전 계획)

  • Kim, Dae-Kyung;Shin, Sang-Wook;Lim, Jae-Hak
    • Journal of Korean Society for Quality Management
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    • v.35 no.4
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    • pp.140-146
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    • 2007
  • In this paper, we consider a periodic imperfect preventive maintenance(PM) policy in which the system's failure rate after each PM remains unchanged. The system undergoes only minimal repairs at failures between PMs. Exact mathematical formula of the expected cost rate per unit time is derived. Optimal number of PMs and optimal maintenance period are derived by minimizing the expected cost rate per unit time. A numerical example is provided to illustrate the proposed approach under Weibull lifetime distribution.

Breakdown characteristics with temperature variation on XLPE 6.9kV cable insulator at power plants (발전소 6.9kV급 XLPE 케이블 절연재의 온도에 따른 절연파괴 특성분석)

  • Park, Noh-Joon;Yang, Sang-Hyun;Lee, Ki-Joung;Kong, Tae-Sik;Kim, Hee-Dong;Park, Dae-Hee
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2010.06a
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    • pp.79-79
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    • 2010
  • In this paper, we present results of the dielectric breakdown test in various 6.9kV power cables used in power plants. The dielectric strength of the different conditioned cables was measured by placing the sliced cable sections in silicone oil bath with needle electrode. The results were analyzed by the Weibull distribution. The shape and scale parameters of the Weibull distribution for each cable sections under test were calculated and evaluated. Collected data base was applied to deterioration trend analysis and lifetime guide was also proposed.

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Higher Order Moments of Record Values From the Inverse Weibull Lifetime Model and Edgeworth Approximate Inference

  • Sultan, K.S.
    • International Journal of Reliability and Applications
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    • v.8 no.1
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    • pp.1-16
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    • 2007
  • In this paper, we derive exact explicit expressions for the triple and quadruple moments of the lower record values from inverse the Weibull (IW) distribution. Next, we present and calculate the coefficients of the best linear unbiased estimates of the location and scale parameters of IW distribution (BLUEs) for different choices of the shape parameter and records size. We then use the higher order moments and the calculated BLUEs to compute the mean, variance, and the coefficients of skewness and kurtosis of certain linear functions of lower record values. By using the coefficients of the skewness and kurtosis, we develop approximate confidence intervals for the location and scale parameters of the IW distribution using Edgeworth approximate values and then compare them with the corresponding intervals constructed through Monte Carlo simulations. Finally, we apply the findings of the paper to some simulated data.

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A Two-Plan Sampling System for Life Testing Under Weibull Distribution

  • Aslam, Muhammad;Balamurali, Saminathan;Jun, Chi-Hyuck;Ahmad, Munir
    • Industrial Engineering and Management Systems
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    • v.9 no.1
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    • pp.54-59
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    • 2010
  • A two-plan sampling system is proposed for a failure-censored life testing when the lifetime follows a Weibull distribution with known shape parameter. The proposed sampling system is based on a switching rule, for switching between the tightened and the normal inspection levels when lots are submitted for inspection in the order of production or in some other systematic way. The design parameters of the proposed sampling system are determined by the two-point approach considering the producer's risks and the consumer's at the specified acceptable reliability level and the lot tolerance reliability level, respectively. It has been observed that the proposed system requires only a single failure for the observation.

Estimation of Insulation Life of PAI/Nano Silica Hybrid Coil by Accelerated Thermal Stress (가속된 열적 스트레스에 의한 PAI / Nano Silica 하이브리드 코일의 절연수명 추정)

  • Park, Jae-Jun
    • The Transactions of The Korean Institute of Electrical Engineers
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    • v.68 no.1
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    • pp.52-60
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    • 2019
  • In this paper, four types of insulation coils were fabricated by adding various kinds of glycols to improve the flexibility and adhesion of insulating coils in varnish dispersed with PAI / Nano Silica_15wt%. The applied voltage and frequency were 1.5 kV / 20 kHz for accelerated life evaluation. Through the 6th temperature stress level, the cause of the insulation breakdown of the coil was ignored and only the breakdown time was measured. The Arrhenius model was chosen based on the theoretical relationship between chemical reaction rate and temperature for estimating the insulation life of the coil due to accelerated thermal stress. Three types of distributions (Weibull, Lognormal, Exponential) were selected as the relationship between thermal stress model and distribution. The average insulation lifetime was estimated under the temperature stress of four types of insulation coils through the relationship between one kind of model and three kinds of distributions.

Improving Lifetime Prediction Modeling for SiON Dielectric nMOSFETs with Time-Dependent Dielectric Breakdown Degradation (SiON 절연층 nMOSFET의 Time Dependent Dielectric Breakdown 열화 수명 예측 모델링 개선)

  • Yeohyeok Yun
    • The Journal of Korea Institute of Information, Electronics, and Communication Technology
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    • v.16 no.4
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    • pp.173-179
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    • 2023
  • This paper analyzes the time-dependent dielectric breakdown(TDDB) degradation mechanism for each stress region of Peri devices manufactured by 4th generation VNAND process, and presents a complementary lifetime prediction model that improves speed and accuracy in a wider reliability evaluation region compared to the conventional model presented. SiON dielectric nMOSFETs were measured 10 times each under 5 constant voltage stress(CVS) conditions. The analysis of stress-induced leakage current(SILC) confirmed the significance of the field-based degradation mechanism in the low electric field region and the current-based degradation mechanism in the high field region. Time-to-failure(TF) was extracted from Weibull distribution to ascertain the lifetime prediction limitations of the conventional E-model and 1/E-model, and a parallel complementary model including both electric field and current based degradation mechanisms was proposed by extracting and combining the thermal bond breakage rate constant(k) of each model. Finally, when predicting the lifetime of the measured TDDB data, the proposed complementary model predicts lifetime faster and more accurately, even in the wider electric field region, compared to the conventional E-model and 1/E-model.