• 제목/요약/키워드: Super Junction Structure

검색결과 26건 처리시간 0.022초

Deep-Trench 기술을 적용한 Super Junction MOSFET의 Charge Balance 특성에 관한 연구 (A Study on the Charge Balance Characteristics of Super Junction MOSFET with Deep-Trench Technology)

  • 최종문;허윤영;정헌석;강이구
    • 전기전자학회논문지
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    • 제25권2호
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    • pp.356-361
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    • 2021
  • 파워 소자의 트레이드오프 현상을 최소화하기 위해 제시된 구조가 Super Junction 구조이다. Super Junction은 기존의 많이 사용하던 기본 구조 대비 1/5 정도의 낮은 온 저항(Ron) 특성을 가질 수 있다. Super Junction 구조의 공정 방법으로 Multi-Epi 공정과 Deep-Trench 공정 방법이 있다. Deep-Trench 공정은 실리콘 기판 상면에 깊은 트렌치 공정을 통하여 그안에 불순물이 도핑 되어 있는 폴리실리콘을 매립하여 P-Pillar를 형성 시키는 공정 방법이라 매립하는 과정에서 결함이 형성되기 쉬워서 비교적 어려운 제조 방법으로 알려져 있다. 하지만 비교적 Deep-Trench 공정으로 만들어진 구조가 낮은 온저항과 높은 항복 전압을 형성하여 좋은 효율을 보인다. 본 논문에서는 공정상의 새로운 방법을 제시하고, Charge Balance 이론을 접목시킨 구조를 설계하였다.

3.3kV 항복 전압을 갖는 저저항 SC-SJ(Shielding Connected-Super Junction) 4H-SiC UMOSFET (Low Resistance SC-SJ(Shielding Connected-Super Junction) 4H-SiC UMOSFET with 3.3kV Breakdown Voltage)

  • 김정훈;김광수
    • 전기전자학회논문지
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    • 제23권3호
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    • pp.756-761
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    • 2019
  • 본 논문에서는 기존 4H-SiC SJ UMOSFET 구조의 p-pillar을 기존 UMOSFET의 shielding 영역 아래로 배치시키는 SC-SJ(Shielding Connected-Super Junction) UMOSFET 구조를 제안한다. 제안한 SC-SJ UMOSFET의 경우 p-pillar와 shielding 영역이 공존하여 산화막에서 전계에 의한 항복이 발생하지 않도록 하며, 이는 pillar의 도핑 농도 상승을 가능하게 한다. 결과적으로 온저항을 낮춤으로서 소자의 정적 특성을 개선한다. Sentaurus TCAD 시뮬레이션을 통해 기존 구조와 제안한 구조의 정적 특성을 비교, 분석하였다. 제안한 SC-SJ UMOSFET은 기존 구조에 비해 항복전압의 변화 없이 50% 감소된 온저항을 얻을 수 있다.

N 버퍽층을 갖는 수퍼접합 LDMOS (Super Junction LDMOS with N-Buffer Layer)

  • 박일용
    • 대한전기학회논문지:전기물성ㆍ응용부문C
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    • 제55권2호
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    • pp.72-75
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    • 2006
  • A CMOS compatible Super Junction LDMOS (SJ-LDMOS) structure, which reduces substrate-assisted depletion effects, is reported. The proposed structure uses a N-buffer layer between the pillars and P-substrate to achieve global charge balance between the pillars, the N-buffer layer and the P-substrate. The new structure features high breakdown voltage, low on-resistance, and reduced sensitivity to doping imbalance in the pillars.

Deep Trench Filling 기술을 적용한 600 V급 Super Junction Power MOSFET의 최적화 특성에 관한 연구 (A Study on 600 V Super Junction Power MOSFET Optimization and Characterization Using the Deep Trench Filling)

  • 이정훈;정은식;강이구
    • 한국전기전자재료학회논문지
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    • 제25권4호
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    • pp.270-275
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    • 2012
  • Power MOSFET(metal oxide silicon field effect transistor) operate voltage-driven devices, design to control the large power switching device for power supply, converter, motor control, etc. But on-resistance characteristics depending on the increasing breakdown voltage spikes is a problem. So 600 V planar power MOSFET compare to 1/3 low on-resistance characteristics of super junction MOSFET structure. In this paper design to 600 V planar MOSFET and super junction MOSFET, then improvement of comparative analysis breakdown voltage and resistance characteristics. As a result, super junction MOSFET improve on about 40% on-state voltage drop performance than planar MOSFET.

대용량 전력변환용 초접합 IGBT 개발에 관한 연구 (The Develop of Super Junction IGBT for Using Super High Voltage)

  • 정헌석;강이구
    • 한국전기전자재료학회논문지
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    • 제28권8호
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    • pp.496-500
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    • 2015
  • This paper was proposed the theoretical research and optimal design 3000V super junction NPT IGBT for using electrical automotive and power conversion. Because super junction IGBT was showed ultra low on resistance, it was structure that can improve the thermal characteristics of conventional NPT IGBT. The electrical characteristics of super junction NPT IGBT were 2.52 V of on state voltage drop, 4.33 V of threshold voltage and 2,846 V breakdown voltage. We did not obtaing 3,000 V breakdown voltage but we will obtain 3,000 V breakdown voltage through improving p pillar layer. If we are carried this research, This device will be used electrical automotive, power conversiton and high speed train.

Electrothermal Analysis for Super-Junction TMOSFET with Temperature Sensor

  • Lho, Young Hwan;Yang, Yil-Suk
    • ETRI Journal
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    • 제37권5호
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    • pp.951-960
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    • 2015
  • For a conventional power metal-oxide-semiconductor field-effect transistor (MOSFET), there is a trade-off between specific on-state resistance and breakdown voltage. To overcome this trade-off, a super-junction trench MOSFET (TMOSFET) structure is suggested; within this structure, the ability to sense the temperature distribution of the TMOSFET is very important since heat is generated in the junction area, thus affecting its reliability. Generally, there are two types of temperature-sensing structures-diode and resistive. In this paper, a diode-type temperature-sensing structure for a TMOSFET is designed for a brushless direct current motor with on-resistance of $96m{\Omega}{\cdot}mm^2$. The temperature distribution for an ultra-low on-resistance power MOSFET has been analyzed for various bonding schemes. The multi-bonding and stripe bonding cases show a maximum temperature that is lower than that for the single-bonding case. It is shown that the metal resistance at the source area is non-negligible and should therefore be considered depending on the application for current driving capability.

Design of Main Body and Edge Termination of 100 V Class Super-junction Trench MOSFET

  • Lho, Young Hwan
    • 전기전자학회논문지
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    • 제22권3호
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    • pp.565-569
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    • 2018
  • For the conventional power MOSFET (metal-oxide semiconductor field-effect transistor) device structure, there exists a tradeoff relationship between specific on-state resistance (Ron,sp) and breakdown voltage (BV). In order to overcome this tradeoff, a super-junction (SJ) trench MOSFET (TMOSFET) structure with uniform or non-uniform doping concentration, which decreases linearly in the vertical direction from the N drift region at the bottom to the channel at the top, for an optimal design is suggested in this paper. The on-state resistance of $0.96m{\Omega}-cm2$ at the SJ TMOSFET is much less than that at the conventional power MOSFET under the same breakdown voltage of 100V. A design methodology for the edge termination is proposed to achieve the same breakdown voltage and on-state resistance as the main body of the super-junction TMOSFET by using of the SILVACO TCAD 2D device simulator, Atlas.

Super Junction IGBT 필러 내부 Trench SiO2성장에 따른 전기적 특성에 관한 연구 (A Study on the Electrical Characteristics according to Growth of Trench SiO2 Inside Super Junction IGBT Pillar)

  • 이건희;안병섭;강이구
    • 전기전자학회논문지
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    • 제25권2호
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    • pp.344-349
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    • 2021
  • Super Junction구조는 항복전압과 온-상태 전압강하의 트레이드-오프 특성을 개선하고자 제안된 구조이다. 본 논문은 Super Junction IGBT P-Pillar 내부 영역에 Trench SiO2를 성장시킨 구조를 제안한다. Super Junction구조에 인가되는 전계를 3D로 관찰 시 P-Pillar 내부에 전계가 인가되지 않는 영역을 확인하였다. Pillar영역의 부분저항은 각 Pillar의 크기와 항복전압에 의해 변동되는데 전계가 인가되지 않는 P-Pillar 내부 영역을 Trench 한 후 SiO2를 성장시켜 P-Pillar의 크기를 감소시킨다. 4.5kV의 동일한 항복전압을 가질 때 온-상태 전압강하 특성이 Field Stop IGBT 대비 약 58%, 기존의 Super Junction IGBT 대비 19% 향상되는 것을 확인하였다.

Structure Modeling of 100 V Class Super-junction Trench MOSFET with Specific Low On-resistance

  • Lho, Young Hwan
    • 전기전자학회논문지
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    • 제17권2호
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    • pp.129-134
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    • 2013
  • For the conventional power metal-oxide semiconductor field-effect transistor (MOSFET) device structure, there exists a tradeoff relationship between specific on-resistance ($R_{ON.SP}$) and breakdown voltage ($V_{BR}$). In order to overcome the tradeoff relationship, a uniform super-junction (SJ) trench metal-oxide semiconductor field-effect transistor (TMOSFET) structure is studied and designed. The structure modeling considering doping concentrations is performed, and the distributions at breakdown voltages and the electric fields in a SJ TMOSFET are analyzed. The simulations are successfully optimized by the using of the SILVACO TCAD 2D device simulator, Atlas. In this paper, the specific on-resistance of the SJ TMOSFET is successfully obtained 0.96 $m{\Omega}{\cdot}cm^2$, which is of lesser value than the required one of 1.2 $m{\Omega}{\cdot}cm^2$ at the class of 100 V and 100 A for BLDC motor.

Analysis of Lattice Temperature in Super Junction Trench Gate Power MOSFET as Changing Degree of Trench Etching

  • Lee, Byeong-Il;Geum, Jong Min;Jung, Eun Sik;Kang, Ey Goo;Kim, Yong-Tae;Sung, Man Young
    • JSTS:Journal of Semiconductor Technology and Science
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    • 제14권3호
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    • pp.263-267
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    • 2014
  • Super junction trench gate power MOSFETs have been receiving attention in terms of the trade-off between breakdown voltage and on-resistance. The vertical structure of super junction trench gate power MOSFETs allows the on-resistance to be reduced compared with conventional Trench Gate Power MOSFETs. The heat release of devices is also decreased with the reduction of on-resistance. In this paper, Lattice Temperature of two devices, Trench Gate Power MOSFET and Super junction trench gate power MOSFET, are compared in several temperature circumstance with the same Breakdown Voltage and Cell-pitch. The devices were designed by 100V Breakdown voltage and measured from 250K Lattice Temperature. We have tried to investigate how much temperature rise in the same condition. According as temperature gap between top of devices and bottom of devices, Super junction trench gate power MOSFET has a tendency to generate lower heat release than Trench Gate Power MOSFET. This means that Super junction trench gate power MOSFET is superior for wide-temperature range operation. When trench etching process is applied for making P-pillar region, trench angle factor is also important component. Depending on trench angle, characteristics of Super junction device are changed. In this paper, we focus temperature characteristic as changing trench angle factor. Consequently, Trench angle factor don't have a great effect on temperature change.