• Journal of IKEEE
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• v.23 no.4
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• pp.1309-1313
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• 2019

In this paper, the electrical characteristics of Gate grounded NMOS(GGNMOS), Lateral insulated gate bipolar transistor(LIGBT), Silicon Controlled Rectifier(SCR), and Proposed ESD protection device were compared and analyzed. First, the trigger voltage and holding voltage were verified by simulating the I-V characteristic curve for each device. After that, the robustness was confirmed by HBM 4k simulation for each device. As a result of HBM 4k simulation, the maximum temperature of the proposed ESD protection device is lower than that of GGNMOS and GGLIGBT and SCR, which means that the robustness is improved, which means that the ESD protection device is excellent in terms of reliability.

• Progress in Superconductivity and Cryogenics
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• v.15 no.4
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• pp.30-33
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• 2013

The studies of superconducting fault current limiter (SFCL) for reduction of the fault current are actively underway in the worldwide. In this paper, we analyzed the characteristics of a new type SFCL using the conventional transformer and superconducting elements combined mutually. The secondary and third windings of this SFCL were connected the load and the superconducting element, respectively. The electric power was provided to load connected to secondary windings of the transformer in normal state of power system. On the other hand, when the fault occurred in power system, the fault current was limited by closing the line of third winding of the transformer. At this time, the ripple phenomenon of the fault was minimized by opening the fault line in secondary winding of a transformer in power system. The sensing of the fault state was performed by the CT(current transformer) and then turn-on and turn-off switching behavior of the SFCL was performed by the SCR(silicon-controlled rectifier). As a result, the proposed SFCL limited the fault current within a half-cycle efficiently. We confirmed that the fault current limitation rate was changed according to the winding ratio of a transformer.

• ETRI Journal
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• v.39 no.5
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• pp.746-755
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• 2017

In this paper, an electrostatic discharge (ESD) protection circuit is designed for use as a 12 V power clamp by using a parasitic-diode-triggered silicon controlled rectifier. The breakdown voltage and trigger voltage ($V_t$) of the proposed ESD protection circuit are improved by varying the length between the n-well and the p-well, and by adding $n^+/p^+$ floating regions. Moreover, the holding voltage ($V_h$) is improved by using segmented technology. The proposed circuit was fabricated using a $0.18-{\mu}m$ bipolar-CMOS-DMOS process with a width of $100{\mu}m$. The electrical characteristics and robustness of the proposed ESD circuit were analyzed using transmission line pulse measurements and an ESD pulse generator. The electrical characteristics of the proposed circuit were also analyzed at high temperature (300 K to 500 K) to verify thermal performance. After optimization, the $V_t$ of the proposed circuit increased from 14 V to 27.8 V, and $V_h$ increased from 5.3 V to 13.6 V. The proposed circuit exhibited good robustness characteristics, enduring human-body-model surges at 7.4 kV and machine-model surges at 450 V.

• Journal of the Korea Academia-Industrial cooperation Society
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• v.17 no.10
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• pp.719-724
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• 2016

This paper describes the performance improvement of an inrush current limiter to prevent damage or malfunctions in power converters due to the inrush current. When the power converter of military radar is operated, the circuit breaker of the power converter is often activated because the overcurrent flows through the circuit breaker of the power converter. Therefore, this study performed a cause analysis of the problem, which is a larger current flow than the intended current(250A). The operation principle of an inrush current limiter and SCR (Silicon Controlled Rectifier) used in the inrush current limiter was analyzed. As a result, the overcurrent flow through the circuit breaker was found to be due to dv/dt triggering of SCR. Based on cause analysis, this paper proposes a technique by adding the resistor in front of the SCR to prevent an unnecessary inrush current. Finally, the effectiveness of the improvement was verified by measuring the output current in the inrush current limiter. The power converter equipped with the improved inrush current limiter operated for more than 1 year without the circuit breaker of the power converter being activated.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2010.06a
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• pp.10-10
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• 2010

ESD (Electrostatic Discharge) phenomenon occurs in everywhere and especially it damages to semiconductor devices. For ESD protection, there are some devices such as diode, GGNMOS (Gate-Grounded NMOS), SCR (Silicon-Controlled Rectifier), etc. Among them, diode and GGNMOS are usually chosen because of their small size, even though SCR has greater current capability than GGNMOS. In this paper, a novel SCR is proposed on the SOI (Silicon-On-Insulator) structure which has $1{\mu}m$ film thickness. In order to design and confirm the proposed SCR, TSUPREM4 and MEDICI simulators are used, respectively. According to the simulation result, although the proposed SCR has more compact size, it's electrical performance is better than electrical characteristics of conventional GGNMOS.

• Proceedings of the Korean Society of Precision Engineering Conference
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• 1996.04a
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• pp.215-219
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• 1996

We developed a part of hydraulic stroke sensing cylinder for te purpose of position controlbyusing magnetic sensor and evaluated variously its performance its performance. In this paper, for the evaluation of the developed cylinder under various temperature change, thermal control systems are designed and controlled. It is composed of an heater case, temperature sensor, and interface circuits which included SCR(silicon controlled rectifier) for the control of the voltage's phase. To obtain various temperature conditions, the thermal systems are controlled by using Ziegler-Nichols PED tuning method. The thermalcontrol systems are used to experiment to evaluate whether the developed cylinder can obtain a stable output signal for detecting a stroke of the cylinder under the controlled temperature condition.

• 전기의세계
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• v.15 no.2
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• pp.1-7
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• 1966

It is well known that the speed of induction motor can be controlled in wide range by changing the second exciting e.m.f. of rotor circuit, but that is well not practised because of its complicated system. In order to simplify such a system, the Kramer system of which silicon rectifier substitutes for synchronous converter has analyzed in this paper. The result of this investigation show that in this system, only the equivlent synchronous speed it changed by second exciting e.m.f., but the mechanical output power, torque and power factor is not changed, and that this system is able to compensate the regulated speed on account of the load changed.

• Journal of Satellite, Information and Communications
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• v.10 no.4
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• pp.6-11
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• 2015

The ESD(electrostatic discharge) protection performance of PPS(PMOS pass structure) embedded N-type silicon controlled rectifier(NSCR_PPS) device with different GPNS(Gate to Primary $N^+$ Diffusion Space) structure was discussed for high voltage I/O applications. A conventional NSCR_PPS standard device with FPW(Full P-Well) structure and non-CPS(Counter Pocket Source) implant shows typical SCR-like characteristics with low on-resistance(Ron), low snapback holding voltage(Vh) and low thermal breakdown voltage(Vtb), which may cause latch-up problem during normal operation. However, our proposed NSCR_PPS devices with modified PPW(Partial P-Well) structure and optimal CPS implant demonstrate the improved ESD protection performance as a function of GPNS variation. GPNS was a important parameter, which is satisfied design window of ESD protection device.

• Journal of IKEEE
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• v.11 no.1 s.20
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• pp.54-60
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• 2007

In this study novel ESD protection device, namely, N/P-type Low Voltage Triggered SCR, has been proposed, for high speed I/O interface. Proposed device could lower high trigger voltage($\sim$20V) of conventional SCR and reduce latch-up phenomenon of protection device during the normal condition. In this Study, the proposed NPLVTSCR has been simulated using TMA MEDICI device simulator for electrical characteristic. Also the proposed device's test pattern was fabricated using 90nm TSMC's CMOS process and was measured electrical characteristic and robustness. In the result, NPLVTSCR has 3.2V $\sim$ 7.5V trigger voltage and 2.3V $\sim$ 3.2V holding voltage by changing PMOS gate length and it has about 2kV, 7.5A HBM ESD robustness(IEC61000-4-2).

• Journal of IKEEE
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• v.19 no.2
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• pp.265-270
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• 2015

In this paper, we proposed a dual-directional SCR (silicon-controlled rectifier) based ESD (electrostatic discharge) protection circuit. In comparison with conventional SCR, this ESD protection circuit can provide an effective protection against ESD pulses in the two opposite directions, so the ESD protection circuit can be discharged in two opposite direction. The proposed circuit has a higher holding voltage characteristic than conventional SCR. These characteristic enable to have latch-up immunity under normal operating conditions as well as superior full chip ESD protection. it was analyzed to figure out electrical characteristics in term of individual design parameters. They are investigated by using the Synopsys TCAD simulator. In the simulation results, it has trigger voltage of 6.5V and holding voltage increased with different design parameters. The holding voltage of the proposed circuit changes from 2.1V to 6.3V and the proposed circuit has symmetrical I-V characteristic for positive and negative ESD pulse.