• Title/Summary/Keyword: Power Fuse

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An Analysis of the Impact of the PV generation on Fuse Coordination (퓨즈협조에 대한 태양광 발전의 영향 분석)

  • Cho, Hae-In;Seo, Hun-Chul;Kim, Chul-Hwan
    • Proceedings of the KIEE Conference
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    • 2009.07a
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    • pp.474_475
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    • 2009
  • Recently the grid-connected PV system is increased in the power system. According to this trend, protection coordination issues are becoming more important when the PV generation is connected to the power system. In this paper, we model the PV system using EMTP/ATPDRAW and analyze the impact of the PV generation for the fuse coordination.

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Design for a Fuse of High Durability Protection Elements for Improving the Safety of DC Current Measurement Device (직류전류측정기의 안전성 향상을 위한 고내구성 보호소자의 가용체 설계)

  • Lee, Ye Ji;Youn, Jae Seo;Cho, Sung Chul;Noh, Sung Yeo
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.33 no.3
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    • pp.201-207
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    • 2020
  • With the expansion in the use of DC power systems and increased need for system maintenance, the development of measurement devices for maintenance requires high stability. Of the different kinds of DC current measurement devices, the single-shot measurement device causes the input signal of the current measuring unit to initially generate a high inrush current. The high inrush current flows into the signal processor of the meter, shortening the life of the internal fuses and causing failure. Therefore, in this study, the I2t value for increasing the durability of the fuse is designed using the available wire diameter. Operating characteristics for 210~400% over-current of the rated current, which is relatively low over-current, are realized by the plating of low melting tin metal. As a result, a method of designing a fuse element for a DC power supply, which improves the safety of the DC current measurement device by blocking the failure caused by the inrush current, is presented.

A Study of the Fiber Fuse in Single-mode 2-kW-class High-power Fiber Amplifiers (단일 모드 2 kW급 고출력 광섬유 증폭기 내의 광섬유 용융 현상에 관한 연구)

  • Lee, Junsu;Lee, Kwang Hyun;Jeong, Hwanseong;Kim, Dong Jun;Lee, Jung Hwan;Jo, Minsik
    • Korean Journal of Optics and Photonics
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    • v.31 no.1
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    • pp.7-12
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    • 2020
  • In this paper, we experimentally investigate the fiber fuse in single-mode 2-kW-class high-power fiber amplifiers, depending on the cooling method at the splicing point. We measured the temperature of the splicing point between the pump-signal combiner and gain fiber as a function of laser output power. The temperature of the splicing point increased from 20 to 32℃ with a slope of 0.01℃/W, up to 1.2 kW of laser output power. At higher powers the temperature of the splicing point increased dramatically, with a slope of 0.08℃/W. After that, the fiber amplifier was destroyed during operation at 1.96 kW of output power by fiber fuse. The bullet shape, a common feature of fiber fuse, was observed in the damaged passive fiber core of the pump-signal combiner. Later, we adopted an improved water-cooled cold plate to increase the cooling efficiency at the splicing point, and investigated the laser output power. The temperature at the splicing point was 35.8℃ with a temperature-rise slope of 0.007℃/W at the maximum output power of 2.05 kW. The beam quality M2 was measured to be less than 1.3, and the output beam's profile was a stable Gaussian shape. Finally, neither fiber fuse nor mode instability was observed in the fiber amplifier at the maximum output power of 2.05 kW.

The Analysis of the LCL Set-up Parameters for Satellite Power Distribution (위성전원분배를 위한 LCL 동작 파라미터 설정분석)

  • Lim, Seong-Bin;Jeon, Hyun-Jin;Kim, Kyung-Soo;Kim, Tae-Youn
    • Aerospace Engineering and Technology
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    • v.10 no.2
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    • pp.56-64
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    • 2011
  • In this paper, the characteristics of LCL set-up parameters for the satellite load distribution are analyzed under the electrical system environment, implemented the LCL circuits and evaluated the performance and its behaviour. Recently, it is implemented the load distribution circuit by latching current limiter(LCL) rather than conventional fuse and relay for the protection of the satellite power system from a fault load. The LCL circuit is composed of the electrical components, not mechanical parts with the fuse and relay. When detected the over current on a fault load, it is activated to maintain the trip-off level for set-up time and then cut-off the load power by the active control. It is more flexible and provided a chance to reuse of the load in case of temporarily event, but the fuse and relay can't be used again after activating due to the physical disconnection. However, for implementation of LCL circuit, it should be carefully considered the behavior of the LCL circuit under the worst electrical system environment and applied it to define the set-up parameters related with over-current inhibition.

Operation properties of high $T_c$ superconductive current limiting fuse (고온 초전도 한류퓨즈의 동작특성)

  • Choi, Hyo-Sang;Hyun, Ok-Bae;Kim, Hye-Rim;Hwang, Si-Dole;Park, Kwon-Bae
    • Proceedings of the KIEE Conference
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    • 2001.04a
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    • pp.67-68
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    • 2001
  • We present the basic properties of a superconductive current limiting fuse (SCLF) based on YBCO/Au films. The SCLF consists of meander type YBCO stripes covered with an Au layer for current shunt. The fault current was first limited to a designed value in less than 0.4 msec by resistance development in YBCO/Au upon quenching. This enables the SCLF to transfer small fault power and the suppressed current was sustained for more than 0.5 msec while Au layer melting and arcing. The arcing time was less than 2.5 msec, that is short enough to do self-interruption.

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Character Analysis of Micro Fuse Fusing as a function of De-Rating technique (디레이팅 기법에 의한 마이크로 퓨즈 용단의 특성 분석)

  • Kim, Do-Kyeong;Kim, Jong-Sick
    • Journal of the Korean Institute of Illuminating and Electrical Installation Engineers
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    • v.29 no.6
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    • pp.8-13
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    • 2015
  • Recently, Illumination industry of LED module has been focused to industry technology for energy conservation of nation. The LED device is excellent to power efficiency due to semiconductor light source element. And the application to the lighting circuit technology can be designed to the sensitive lighting system for human sensitivity control. In this paper, as a process for analyzing the operating temperature of standardized electronic device including LED device has analyzed about fusing character with in designed micro fuse for electronic device protection from the over current. Using the de-rating technique, which is performed to micro fuse fusing test in the range of $-30^{\circ}C{\sim}120^{\circ}C$ thermostatic chamber. To the output data in each temperature zone, it is performed to first-order linear fitting. Additionally, applying the resistance temperature coefficient and statistical data for the reliable analysis has derived to the metal element resistance of micro fuse with temperature change of the thermostatic chamber. As a research result, The changed temperature effect of thermostatic chamber was confirmed regarding fusing time change.

Design of eFuse OTP IP for Illumination Sensors Using Single Devices (Single Device를 사용한 조도센서용 eFuse OTP IP 설계)

  • Souad, Echikh;Jin, Hongzhou;Kim, DoHoon;Kwon, SoonWoo;Ha, PanBong;Kim, YoungHee
    • Journal of IKEEE
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    • v.26 no.3
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    • pp.422-429
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    • 2022
  • A light sensor chip requires a small capacity eFuse (electrical fuse) OTP (One-Time Programmable) memory IP (Intellectual Property) to trim analog circuits or set initial values of digital registers. In this paper, 128-bit eFuse OTP IP is designed using only 3.3V MV (Medium Voltage) devices without using 1.8V LV (Low-Voltage) logic devices. The eFuse OTP IP designed with 3.3V single MOS devices can reduce a total process cost of three masks which are the gate oxide mask of a 1.8V LV device and the LDD implant masks of NMOS and PMOS. And since the 1.8V voltage regulator circuit is not required, the size of the illuminance sensor chip can be reduced. In addition, in order to reduce the number of package pins of the illumination sensor chip, the VPGM voltage, which is a program voltage, is applied through the VPGM pad during wafer test, and the VDD voltage is applied through the PMOS power switching circuit after packaging, so that the number of package pins can be reduced.

Fuse Protection of IGBT Modules against Explosions

  • Blaabjerg Frede;Iov Florin;Ries Karsten
    • Proceedings of the KIPE Conference
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    • 2001.10a
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    • pp.703-707
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    • 2001
  • The demand for protection of power electronic applications has during the last couple of years increased regarding the high-power IGBT modules. Even with an active protection, a high power IGBT still has a risk of exhibiting a violent rupture in the case of a fault if IGBT Fuses do not protect it. By introducing fuses into the circuit this will increase the circuit inductance and slight increase the over-voltage during the turn-off of the diode and the IGBT. It is therefore vital when using fuses that the added inductance is kept at a minimum. This paper discuss three issues regarding the IGBT Fuse protection. First, the problem of adding inductance of existing High-Speed and new Typower fuses in DC-link circuit is treated, second a short discussion of the protection of the IGBT module is done, and finally, the impact of the high frequency loading on the current carrying capability of the fuses is presented.

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PUF Logic Employing Dual Anti-fuse OTP Memory for High Reliability (신뢰성 향상을 위한 듀얼 안티퓨즈 OTP 메모리 채택 D-PUF 회로)

  • Kim, Seung Youl;Lee, Je Hoon
    • Convergence Security Journal
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    • v.15 no.3_1
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    • pp.99-105
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    • 2015
  • A typical SRAM-based PUF is used in random number generation and key exchange process. The generated out puts should be preserved, but the values are changed owing to the external environment. This paper presents a new D-PUF logic employing a dual anti-fuse OTP memory to the SRAM-based PUF. The proposed PUF can enhance the reliability of the logic since it can preserve the output values. First, we construct the OTP memory using an anti-fuse. After power up, a SRAM generates the random values owing to the mismatch of cross coupled inverter pair. The generated random values are programed in the proposed anti-fuse ROM. The values that were programed in the ROM at once will not be changed and returned. Thus, the outputs of the proposed D-PUF are not affected by the environment variable such as the operation voltage and temperature variation, etc. Consequently, the reliability of the proposed PUF will be enhanced owing to the proposed dual anti-fuse ROM. Therefore, the proposed D-PUF can be stably operated, in particular, without the powerful ECC in the external environment that are changed.

COS MEMS System Design with Embedded Technology (Embedded 기술을 이용한 COS MEMS 시스템 설계)

  • Hong, Seon Hack;Lee, Seong June;Park, Hyo Jun
    • KEPCO Journal on Electric Power and Energy
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    • v.6 no.4
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    • pp.405-411
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    • 2020
  • In this paper, we designed the COS MEMS system for sensing the falling detection and explosive noise of fuse link in COS (Cut Out Switch) installing on the power distribution. This system analyzed the failure characteristics and an instantaneous breakdown of power distribution. Therefore, our system strengths the industrial competence and guaranties the stable power supply. In this paper, we applied BLE (Bluetooth Low Energy) technology which is suitable protocol for low data rate, low power consumption and low-cost sensor applications. We experimented with LSM6DSOX which is system-in-module featuring 3 axis digital accelerometer and gyroscope boosting in high-performance mode and enabling always-on low-power features for an optimal motion for the COS fuse holder. Also, we used the MP34DT05-A for gathering an ultra-compact, low power, omnidirectional, digital MEMS microphone built with a capacitive sensing element and an IC interface. The proposed COS MEMS system is developed based on nRF52 SoC (System on Chip), and contained a 3-axis digital accelerometer, a digital microphone, and a SD card. In this paper of experiment steps, we analyzed the performance of COS MEMS system with gathering the accelerometer raw data and the PDM (Pulse Data Modulation) data of MEMS microphone for broadcasting the failure of COS status.