• Title/Summary/Keyword: Non-Volatile memory

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Characterization of Pt/BLT/CeO2/Si Structures using CeO2 Buffer Layer (CeO2Buffer Layer를 이용한 Pt/BLT/CeO2/Si 구조의 특성)

  • 이정미;김경태;김창일
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.16 no.10
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    • pp.865-870
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    • 2003
  • The MFIS (Metal-Ferroelectric-Insulator-Semiconductor) capacitors were fabricated using a metalorganic decomposition method. Thin layers of CeO$_2$ were deposited as a buffer layer on Si substrate and BLT thin films were used as a ferroelectric layer. The electrical and structural properties of the MFIS structure were investigated. X -ray diffraction was used to determine the phase of the BLT thin films and the quality of the CeO$_2$ layer. The morphology of films and the interface structures of the BLT and the CeO$_2$ layers were investigated by scanning electron microscopy. The width of the memory window in the C-V curves for the MFIS structure is 2.82 V. The experimental results show that the BLT-based MFIS structure is suitable for non-volatile memory FETs with large memory window.

Self sustained n-type memory transistor devices based on natural cellulose paper fibers

  • Martins, R.;Barquinha, P.;Pereira, L.;Goncalves, G.;Ferreira, I.;Fortunato, E.
    • 한국정보디스플레이학회:학술대회논문집
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    • 2009.10a
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    • pp.1044-1046
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    • 2009
  • Here we report the architecture for a non-volatile n-type memory paper field-effect transistor. The device is built using the hybrid integration of natural cellulose fibers (pine and eucalyptus fibers embedded in an ionic resin), which act simultaneously as substrate and gate dielectric, with amorphous GIZO and IZO oxides as gate and channel layers, respectively. This is complemented by the use of continuous patterned metal layers as source/drain electrodes.

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Electrical characteristic for Phase-change Random Access Memory according to the $Ge_{1}Se_{1}Te_{2}$ thin film of cell structure (상변화 메모리 응용을 위한 $Ge_{1}Se_{1}Te_{2}$ 박막의 셀 구조에 따른 전기적 특성)

  • Na, Min-Seok;Lim, Dong-Kyu;Kim, Jae-Hoon;Choi, Hyuk;Chung, Hong-Bay
    • Proceedings of the KIEE Conference
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    • 2007.07a
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    • pp.1335-1336
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    • 2007
  • Among the emerging non-volatile memory technologies, phase change memories are the most attractive in terms of both performance and scalability perspectives. Phase-change random access memory(PRAM), compare with flash memory technologies, has advantages of high density, low cost, low consumption energy and fast response speed. However, PRAM device has disadvantages of set operation speed and reset operation power consumption. In this paper, we investigated scalability of $Ge_{1}Se_{1}Te_{2}$ chalcogenide material to improve its properties. As a result, reduction of phase change region have improved electrical properties of PRAM device.

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Fabrication of Tern bit level SONOS F1ash memories (테라비트급 SONOS 플래시 메모리 제작)

  • Kim, Joo-Yeon;Kim, Byun-Cheul;Seo, Kwang-Yell;Kim, Jung-Woo
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2006.06a
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    • pp.26-27
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    • 2006
  • To develop tera-bit level SONOS flash memories, SONOS unit memory and 64 bit flash arrays are fabricated. The unit cells have both channel length and width of 30nm. The NAND & NOR arrays are fabricated on SOI wafer and patterned by E-beam. The unit cells represent good write/erase characteristics and reliability characteristics. SSL-NOR array have normal write/erase operation. These researches are leading the realization of Tera-bit level non-volatile nano flash memory.

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A Hierarchical Binary-search Tree for the High-Capacity and Asymmetric Performance of NVM (비대칭적 성능의 고용량 비휘발성 메모리를 위한 계층적 구조의 이진 탐색 트리)

  • Jeong, Minseong;Lee, Mijeong;Lee, Eunji
    • IEMEK Journal of Embedded Systems and Applications
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    • v.14 no.2
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    • pp.79-86
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    • 2019
  • For decades, in-memory data structures have been designed for DRAM-based main memory that provides symmetric read/write performances and has no limited write endurance. However, such data structures provide sub-optimal performance for NVM as it has different characteristics to DRAM. With this motivation, we rethink a conventional red-black tree in terms of its efficacy under NVM settings. The original red-black tree constantly rebalances sub-trees so as to export fast access time over dataset, but it inevitably increases the write traffic, adversely affecting the performance for NVM with a long write latency and limited endurance. To resolve this problem, we present a variant of the red-black tree called a hierarchical balanced binary search tree. The proposed structure maintains multiple keys in a single node so as to amortize the rebalancing cost. The performance study reveals that the proposed hierarchical binary search tree effectively reduces the write traffic by effectively reaping the high capacity of NVM.

Effect of channel size on characteristics of Non-volatile SNOSFET Memories (채널크기가 비휘발성 SNOSFET 기억소자의 동작특성에 미치는 효과)

  • 이홍철;조성두;이상배;서광열
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 1991.10a
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    • pp.29-32
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    • 1991
  • Non-volatile SNOSFET memory devices using CMOS 1Mbit design rule(1.2$\mu\textrm{m}$), whose channel width and length are 15${\times}$1.5$\mu\textrm{m}$, 15${\times}$1.5$\mu\textrm{m}$, 2.0${\times}$15$\mu\textrm{m}$ and length are 15${\times}$1.7$\mu\textrm{m}$, respectivley, were fabricated. And the transfer, Id-Vd and switching characteristics of the devices were investigated. As a result, the 15${\times}$1.5$\mu\textrm{m}$ device was good in the transfer characteristics and the switching characteristics were favourable, which had $\Delta$V$\sub$TH/=6.3V by appling pulse voltage of V$\sub$w/=+34V, Tw=50msec.

Unpacking Technique for In-memory malware injection technique (인 메모리 악성코드 인젝션 기술의 언 패킹기법)

  • Bae, Seong Il;Im, Eul Gyu
    • Smart Media Journal
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    • v.8 no.1
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    • pp.19-26
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    • 2019
  • At the opening ceremony of 2018 Winter Olympics in PyeongChang, an unknown cyber-attack occurred. The malicious code used in the attack is based on in-memory malware, which differs from other malicious code in its concealed location and is spreading rapidly to be found in more than 140 banks, telecommunications and government agencies. In-memory malware accounts for more than 15% of all malicious codes, and it does not store its own information in a non-volatile storage device such as a disk but resides in a RAM, a volatile storage device and penetrates into well-known processes (explorer.exe, iexplore.exe, javaw.exe). Such characteristics make it difficult to analyze it. The most recently released in-memory malicious code bypasses the endpoint protection and detection tools and hides from the user recognition. In this paper, we propose a method to efficiently extract the payload by unpacking injection through IDA Pro debugger for Dorkbot and Erger, which are in-memory malicious codes.

Development of Flash Memory Management Algorithm (플래쉬 메모리 관리 알고리즘 개발)

  • Park, In-Gyu
    • Journal of the Institute of Electronics Engineers of Korea CI
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    • v.38 no.1
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    • pp.26-45
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    • 2001
  • The Flash memory market: is an exciting market that has quickly over the last 10 years. Recently Flash memory provides a high-density. truly non-volatile, high performance read write memory solutions, also is characterized by low power consumption, extreme ruggedness and high reliability. Flash memory is an optimum solution for large nonvolitilc storage operations such as solid file storage, digital video recorder, digital still camera, The MP3 player and other portable multimedia communication applications requiring non-volatility. Regardless of the type of Flash memory, Flash media management software is always required to manage the larger Flash memory block partitions. This is true, since Flash memory cannot be erased on the byte level common to memory, but must be erased on a block granularity. The management of a Flash memory manager requires a keen understanding of a Flash technology and data management methods. Though Flash memory's write performance is relatively slow, the suggested algorithm offers a higher maximum write performance. Algorithms so far developed is not suitable for applications which is requiring more fast and frequent accesses. But, the proposed algorithm is focused on the justifiable operation even in the circumstance of fast and frequent accesses.

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An Analog Memory Fabricated with Single-poly Nwell Process Technology (일반 싱글폴리 Nwell 공정에서 제작된 아날로그 메모리)

  • Chai, Yong-Yoong
    • The Journal of the Korea institute of electronic communication sciences
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    • v.7 no.5
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    • pp.1061-1066
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    • 2012
  • A digital memory has been widely used as a device for storing information due to its reliable, fast and relatively simple control circuit. However, the storage of the digital memory will be limited by the inablility to make smaller linewidths. One way to dramatically increase the storeage capability of the memory is to change the type of stored data from digital to analog. The analog memory fabricated in a standard single poly 0.6um CMOS process has been developed. Single cell and adjacent circuit block for programming have been designed and characterized. Applications include low-density non-volatile memory, control of redundancy in SRAM and DRAM memories, ID or security code registers, and image and sound memory.

Design of Asynchronous Non-Volatile Memory Module Using NAND Flash Memory and PSRAM (낸드 플래시 메모리와 PSRAM을 이용한 비동기용 불휘발성 메모리 모듈 설계)

  • Kim, Tae Hyun;Yang, Oh;Yeon, Jun Sang
    • Journal of the Semiconductor & Display Technology
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    • v.19 no.3
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    • pp.118-123
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    • 2020
  • In this paper, the design method of asynchronous nonvolatile memory module that can efficiently process and store large amounts of data without loss when the power turned off is proposed and implemented. PSRAM, which takes advantage of DRAM and SRAM, was used for data processing, and NAND flash memory was used for data storage and backup. The problem of a lot of signal interference due to the characteristics of memory devices was solved through PCB design using high-density integration technology. In addition, a boost circuit using the super capacitor of 0.47F was designed to supply sufficient power to the system during the time to back up data when the power is off. As a result, an asynchronous nonvolatile memory module was designed and implemented that guarantees reliability and stability and can semi-permanently store data for about 10 years. The proposed method solved the problem of frequent data loss in industrial sites and presented the possibility of commercialization by providing convenience to users and managers.