• Journal of the Institute of Electronics Engineers of Korea SD
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• v.39 no.7
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• pp.81-88
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• 2002

A new pattern generator of BIST based on the pattern clustering is developed. The proposed technique embeds a pre-computed deterministic test set with low hardware overhead for test-per-clock environments. The test control logic is simple and can be synthesized automatically. Experimental results for the ISCAS benchmark circuits show that the effectiveness of the new pattern generator compared to the previous methods.

• Journal of the Korea Society for Simulation
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• v.10 no.1
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• pp.25-34
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• 2001

In this paper, we describe the generation method of interface logic which replace between IP & IP handshaking signal with asynchronous logic circuit. Especially, we suggest the new asynchronous sequential "Waveform to VHDL" code creation algorithm by flow chart conversion : Wave2VHDL - if only mixed asynchronous timing waveform is presented the level type input and pulse type input for handshaking, we convert waveform to flowchart and then replace with VHDL code according to converted flowchart. Also, we confirmed that asynchronous electronic circuits are created by applying extracted VHDL source code from suggest algorithm to conventional domestic/abroad CAD Tool, Finally, we assured the simulation result and the suggest timing diagram are identical.

• Progress in Superconductivity and Cryogenics
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• v.4 no.1
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• pp.8-12
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• 2002

Since the high performance analog-to-digital converter can be built with Rapid Single Flux Quantum (RSFQ) logic circuits the development of superconductive analog-to-digital converter has attracted a lot of interests as one of the most prospective area of the application of Josephson Junction technology. One of the main advantages in using Rapid Sng1e Flux Quantum logic in the analog-to-digital converter is the low voltage output from the Josephson junction switching, and hence the high resolution. To design an analog-digital converter, first we have used XIC tool to compose a circuit schematic, and then studied the operational principle of the circuit with WRSPICE tool. Through this process, we obtained the proper circuit diagram of an 1-bit analog-digital converter circuit. The optimized circuit was laid out as a mask drawing. Inductance values of the circuit layout were calculated with L-meter.

• The Transactions of the Korean Institute of Electrical Engineers P
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• v.60 no.1
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• pp.48-52
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• 2011

Over the years, traditionally, six-switch three-phase inverters have been widely utilized for variable speed alternating current motor drives. Recently, some efforts have been made on the application of four-switch three phase inverter for uninterruptible power supply and variable speed drives. This is due to some advantages of the four-switch three phase inverter over the conventional six-switch three-phase inverters such as reduced price due to reduction in number of switches, reduced switching losses, reduced number of interface circuits to supply logic signals for the switches, simpler control algorithms to generate logic signals, less chances of destroying the switches due to lesser interaction among switches, and less real-time computational burden. However such as slow di/dt and speed limitation, are the inherent characteristics and main drawbacks of the four-switch configuration. Those problems can be overcome in conjugation with Voltage-doublers which has additional advantage, such as unity power factor correction.

• Journal of Korea Society of Digital Industry and Information Management
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• v.13 no.3
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• pp.35-42
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• 2017

This paper presents hardware implementation of background timing-skew calibration technique for time-interleaved analog-to-digital converters (TI ADCs). The timing skew between any two adjacent analog-digital (A/D) channels is detected by using pure digital Finite Impulse Response (FIR) delay filter. This paper includes hardware architecture of the system, main units and small sub-blocks along with control logic circuits. Moreover, timing diagrams of logic simulations using ModelSim are provided and discussed for further understanding about simulations. Simulation process in MATLAB and Verilog is also included and provided with basic settings need to be done. For hardware implementation it not practical to work with all samples. Hence, the simulation is conducted on 512 TI ADC output samples which are stored in the buffer simultaneously and the correction arithmetic is done on those samples according to the time skew algorithm. Through the simulated results, we verified the implemented hardware is working well.

• Journal of the Korean Society of Industry Convergence
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• v.2 no.2
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• pp.103-108
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• 1999

The paper describes a implementation of space vector pulse-width modulation voltage source inverter and interfacing of DSP using field programmable gate array(FPGA) for a induction motor vector control system. The implemented chip is included logic circuits for SVPWM, dead time compensation and speed detection using Quick Logic, QLl6X24B. The maximum operating frequency and delay time can be set to 110MHz and 6 nsec. The designed Application Specific Integrated Circuit(ASIC) for SVPWM can be incorporated with a digital signal processing to provide a simple and effective solution for high performance induction motor drives with a voltage source inverter. Simulation and implementation results are shown to verify the usefulness of ASIC in a motor drive system and power electronics applications.

• Proceedings of the Korea Institute of Applied Superconductivity and Cryogenics Conference
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• 2003.02a
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• pp.92-94
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• 2003

In superconductive digital logic circuits, D2 cells can be used to compose a decoder an important component of an Arithmetic Logic Unit (ALU). In this wor, we simulated D2 cell by using WRspice. D2 cell has one input, one switch input, and two outputs (output1 and output2). D2 cell functions in such way that output1 follows the input and output2 is the complement of the input data, when the switch input is "0, ". However, when there is a switch input "1, " the opposite output signals are generated. In this paper, we optimized a D2 cell by using WRspice, and obtained the minimum margin of 26%. Our optimized D2 cell will play a key role in the ALU fabrication.the ALU fabrication.

• The Journal of Korean Institute of Communications and Information Sciences
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• v.12 no.3
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• pp.292-297
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• 1987

High-speed GaAs IC Logic Gates being widely studied and developed in the develped countries were reanalysed and reexamined through SPICE simulations. And, furthermore, the detailed examinations of their characteristics such as operation characteristics and conditions, integration densities, service-ableness, and the limitation of both fabrication and application, give us a clue of the feasibility and application of them in the real integrated circuits. This paper will provide a reasonably good guide to set-up one of goals or future development of high-speed GaAs IC's being led by the goverment recently in our country.

• Journal of the Korean Institute of Electrical and Electronic Material Engineers
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• v.19 no.11
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• pp.994-999
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• 2006

For low-cost embedded EEPROM, in this paper, single polysilicon EEPROM and n-channel high-voltage LDMOST device are developed in a $0.25{\mu}m$ standard CMOS logic process. Using these devices developed, the EEPROM chip is fabricated. The fabricated EEPROM chip is composed of 1 Kbit single polysilicon EEPROM away and high voltage driver circuits. The program and erase characteristics of the fabricated EEPROM chip are evaluated using 'STA-EL421C'. The fabricated n-channel high-voltage LDMOST device operation voltage is over 10 V and threshold voltage window between program and erase states of the memory cell is about 2.0 V.

• Journal of the Korean Institute of Telematics and Electronics A
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• v.33A no.3
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• pp.176-186
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• 1996

As the density of VLSI increases, the conventional logic testing is not sufficient to completely detect the new faults generated in design and fabrication processing. Recently, IDDQ testing becomes very attractive since it can overcome the limitations of logic testing. In this paper, G-ATPG (gyeongsang automatic test pattern genrator) is designed which is able to be adapted to IDDQ testing for combinational CMOS VLSI. In G-ATPG, stuck-at, transistor stuck-on, GOS (gate oxide short)or bridging faults which can occur within priitive gate or XOR is modelled to primitive fault patterns and the concept of a fault-sensitizing gate is used to simulate only gates that need to sensitize the faulty gate because IDDQ test does not require the process of fault propagation. Primitive fault patterns are graded to reduce CPU time for the gates in a circuit whenever a test pattern is generated. the simulation results in bench mark circuits show that CPU time and fault coverage are enhanced more than the conventional ATPG using IDDQ test.