• Journal of Korean Society of Industrial and Systems Engineering
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• v.21 no.45
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• pp.201-213
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• 1998

We address the problem of choosing the most economic mean value for an automatic filling operation on a production line through the sampling inspection. If quality characteristic of a unit is less than inspection specification then the goods is not accepted. Otherwise, it is accepted. The lots that the numbers of non-conforming units in a sample are larger than the allowable number of non-conforming units are rejected. The non-conforming units in the rejected lots are separated by the screening inspection. The non-conforming units separated are sold in discount price. We assume that quality characteristic is larger-the-better characteristic, the distribution of quality characteristic is normal distribution, and the standard deviation of the distribution is known. This paper presents total expected profit function model considering sales revenue, inspection costs, and material costs. The manufacturing process mean value maximizing total expected profit is determined, and the results of the process target value and total expected profit is analyzed as coefficients change.

• Journal of International Society for Simulation Surgery
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• v.3 no.1
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• pp.16-21
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• 2016

Computed tomography (CT) can completely digitize the interior and the exterior of nearly any object without any destruction. Generally, the resolution for industrial CT is below a few microns. The industrial CT scanning, however, has a limitation because it requires long measuring and processing time. Whereas, 2D X-ray imaging is fast. In this paper, we propose a novel concept of 3D non-destructive inspection technique using the advantages of both micro-CT and dual X-ray images. After registering the master object’s CT data and the sample objects’ dual X-ray images, 3D non-destructive inspection is possible by analyzing the matching results. Calculation for the registration is accelerated by parallel computing using graphics processing unit (GPU).

• Journal of Korean Society of Industrial and Systems Engineering
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• v.21 no.46
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• pp.119-125
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• 1998

In this study, a traditional concept of sampling inspection plan for the quality assurance system is extended to a consideration of economic aspects in total production system by representing and analyzing the effects between proceeding / succeeding production process including inspection. This approach recognizes that the decision to be made at one manufacturing process (or assembly process) determine not only the cost and the average outgoing quality level of that process but also the input parameters of the cost and the incoming quality to the succeeding process. By analyzing the effects of the average incoming and outgoing quality, manufacturing / assembly quality level and sampling inspection plan on the production system, mathematical models and solution technique to minimize the total production cost for a single product manufacturing system with specified average outgoing quality limit(AOQL) are suggested.

• Journal of Korean Society for Quality Management
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• v.24 no.2
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• pp.25-43
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• 1996

This paper presents the optimal and practical constant-stress accelerated life test plans for the lognormal lifetime distribution tinder assumptions of intermittent inspection and Type-I censoring. In an optimal plan, the low stress level and the proportions of test units allocated at each stress are determined under given inspection scheme and number of inspections such that the asymptotic variance of the maximum likelihood estimator of a certain quantile at use condition is minimized. Although the practical plan adopts the same design criterion, it involves three rather than two overstress levels in order to compromise the practical deficiencies of the optimal plan. Computational experiments are conducted to choose an allocation plan and a inspection scheme of the practical plan and to compare with test plans over a range of parameter values.

• Journal of Korean Institute of Industrial Engineers
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• v.16 no.2
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• pp.45-50
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• 1990

A replacement policy with repair cost limit is discussed. When a system fails, the repair cost is estimated by inspection and repair is then undertaken if the estimated cost is less than a predetermined limit L ; otherwise the system is replaced. After repair, the system is as good as new with probability(l-p) or is minimally repaired with probability p. It is assumed that repair cost can not be estimated exactly because of inspection error. When the failure time follows a Weibull distribution and repair cost a normal distribution, the value of repair cost limit minimizing the expected cost rate is shown to be finite and unique.

• Journal of Korean Society of Industrial and Systems Engineering
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• v.22 no.50
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• pp.267-279
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• 1999

In 1995, 100PPM Quality Certification System(QCS) has been established by the Industrial Advancement Administration. This study shows the tangible and intangible effects of 100PPM QCS in Korea. 100PPM QCS has been introduced to observe the substantial objects and to solve problems. To achieve this goal, problems of certification system were classified by certification inspection items, certification inspection, post management and inspection methods. This set of problems are also found when enterprise carrying out 100PPM. It is suggested to utilize the proposed problems and improvements which are to upgrade and correct the 100PPM QCS in the beginning stage.

• Journal of Institute of Control, Robotics and Systems
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• v.19 no.12
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• pp.1072-1080
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• 2013

In a the present day, many vision inspection techniques are used in productive industrial areas. In particular, in the semiconductor industry the vision inspection system for wafers is a very important system. Also, inspection techniques for semiconductor wafer production are required to ensure high precision and fast inspection. In order to achieve these objectives, parallel processing of the inspection algorithm is essentially needed. In this paper, we propose the GPU (Graphical Processing Unit)-based parallel processing algorithm for the fast inspection of semiconductor wafers. The proposed algorithm is implemented on GPU boards made by NVIDIA Company. The defect detection performance of the proposed algorithm implemented on the GPU is the same as if by a single CPU, but the execution time of the proposed method is about 210 times faster than the one with a single CPU.

• Journal of the Korean Society of Industry Convergence
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• v.23 no.3
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• pp.463-471
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• 2020

Recently, various tries to apply ROV (Remotely Operated Vehicle) into underwater are being developed. However, due to underwater environment uniqueness, the additional problem must be taken into account when designing an ROV for the inspection of the underwater structure. This is because a GPS-based information method cannot be applied, and the obtainable image is also dependent on the turbidity. Also, it is necessary to be able to satisfy waterproof and operating speeds in consideration of most practical application environments. This paper describes the design results of the ROV system for underwater structure inspection considering the above problems. The designed system applied INS / DVL for location recognition and was configured to support 3D mapping and stereo camera-based image information using sonar depending on visibility. To satisfy the waterproof, a pressure vessel using a composite material was applied. And over-actuated system using eight thrusters to maintain a stable posture and operating speed was applied also. The designed system was verified by structural analysis and flow analysis also.

• Proceedings of the KIEE Conference
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• 2005.10b
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• pp.64-66
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• 2005

In this paper, some automatic inspection algorithms for LCD module are suggested. Human eyes are very good for the inspection in many industrial areas. However, very bright LCD back lighting may cause permanent damage to the human eyes. Also, the growing size of the LCD make it more difficult for the human inspectors. Therefore, using camera set, automatic inspection process becomes very essential for the future LCD industry.

• IE interfaces
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• v.9 no.1
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• pp.63-71
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• 1996

A wire harness is an assembly cables and/or wires to transmit signals between electronic assemblies in automobiles and electronic appliances. Inspection of such a wire harness is to check the sequence of assembled cabled each of which is identified by its own color. This paper presents an automated visual inspection system for wire harnesses incorporating back-propagation neural network as a color identification device. The tests performed by using real test specimens show that the inspection system works well enough.