• Title/Summary/Keyword: Circuits

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Testability of Current Testing for Open Faults Undetected by Functional Testing in TTL Combinational Circuits

  • Tsukimoto, Isao;Hashizume, Masaki;Mushiaki, Yukiko;Yotsuyanagi, Hiroyuki;Tamesada, Takeomi
    • Proceedings of the IEEK Conference
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    • 2002.07c
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    • pp.1972-1975
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    • 2002
  • A new test approach based on a supply current test method is proposed for testing open faults in bipolar logic circuits. In the approach, only the open faults are detected by the supply current test method, which are difficult to be detected by functional test methods. The effectiveness of the approach is examined experimentally on open fault detection in TTL combinational circuits. The results shows that higher fault coverage can be established by applying a small number of test input vectors of the supply current test method after test vectors of functional test methods based on stuck-at models.

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Manufacture of Custom IC and System for Multi-channel Biotelemeter (다채널 바이오텔레미터 개발을 위한 전용 IC 및 시스템 제작)

  • 서희돈;박종대
    • Journal of the Korean Institute of Telematics and Electronics B
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    • v.31B no.8
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    • pp.172-180
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    • 1994
  • Implantable biotelemetry systems are indispensable tools not only in animal research but also in clinical medicine as such systems enable the acquisition of otherwise unavailable physiological data. We present the manufacture of CMOS IC and its system for implantable multichannel biotelemeter system. The internal circuits of this system are designed not only to achieve as multiple functions and low power dissipation as possible but also to enable continuous measurement of physiological data. Its main functions are to enable continuous measurement of physiological data and to accomplish on-off power swiching of an implantable battery by receiving appropriate commanc signals from an external circuit. The implantable circuits of this system are designed and fabricated on a single silicon chip using $1.5\mu$m n-well CMOS process technology. The total power dissipation of implantable circuits for a continuous operation was 6.7mW and for a stand-by operation was 15.2$\mu$ W. This system used together with approriate sensors is expected to contribute to clinical medicine telemetry system of measuring and wireless transmitting such significant physiological parameters as pressure pH and temperature.

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One port resistor cell for CMOS analog integrated circuits (CMOS 아날로그 집적회로를 위한 새로운 구조의 One port 저항 셀)

  • Jo, Young-Chang;Kim, Sung-Hwan;Choi, Pyung
    • Journal of the Korean Institute of Telematics and Electronics A
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    • v.33A no.3
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    • pp.135-139
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    • 1996
  • It is difficult to fabricate precise resistors for the analog integrated circuits using MOS technology. Until now polysilicon resistors were used at the analog integrated circuits, but some deviations of resistance and sensitive variation processes still cause their misactions. In order to improve these misactions, we suggest a CMOS resistor cell which provides precise resistance and excellant linearity. Also we designed the second order active low pass filter using the CMOS resistor cells and verified their superior performances compared to the actual resistors.

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A topology-based circuit partitioning for field programmable circuit board (Field programmable circuit board를 위한 위상 기반 회로 분할)

  • 최연경;임종석
    • Journal of the Korean Institute of Telematics and Electronics C
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    • v.34C no.2
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    • pp.38-49
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    • 1997
  • In this paper, w describe partitioning large circuits into multiple chips on the programmable FPCB for rapid prototyping. FPCBs consists of areas for FPGAs for logic and interconnect components, and the routing topology among them are predetermined. In the partition problem for FPCBs, the number of wires ofr routing among chips is fixed, which is an additonal constraints to the conventional partition problem. In order to deal with such aconstraint properly we first define a new partition problem, so called the topologybased partition problem, and then propose a heuristic method. The heuristic method is based on the simulated annealing and clustering technique. The multi-level tree clustering technique is used to obtain faster and better prtition results. In the experimental results for several test circuits, the restrictions for FPCB were all satisfied and the needed execution time was about twice the modified K-way partition method for large circuits.

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A 1.2-V 0.18-${\mu}m$ Sigma-Delta A/D Converter for 3G wireless Applications

  • Kim, Hyun-Joong;Jung, Tae-Sung;Yoo, Chang-sik
    • Proceedings of the IEEK Conference
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    • 2006.06a
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    • pp.627-628
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    • 2006
  • A low-voltage switched-capacitor $2^{nd}$-order $\Sigma\Delta$ modulator using full feed-forward is introduced. It has two advantages: the unity signal transfer function and reduced signal swings inside the $\Sigma\Delta$ loop. These features greatly relax the DC gain and output swing requirements for Op-Amp in the low-voltage $\Sigma\Delta$ modulator. Implemented by a 0.18-${\mu}m$ CMOS technology, the $\Sigma\Delta$ modulator satisfies performance requirements for WCDMA and CDMA2000 standards.

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The Design of CMOS Multi-mode/Multi-band Wireless Receiver

  • Hwang, Bo-Hyeon;Jeong, Jae-Hun;Yu, Chang-Sik
    • Proceedings of the IEEK Conference
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    • 2006.06a
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    • pp.615-616
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    • 2006
  • Nowadays, the need of multi-mode/multi-band transceiver is rapidly increasing, so we design a direct conversion RF front-end for multi-mode/multi-band receiver that support WCDMA/CDMA2000/WIBRO standard. It consists of variable gain reconfigurable LNA and single input double balanced Mixer and complementary differential LC Oscillator. The circuit is implemented in 0.18 um RF CMOS technology and is suitable for low-cost mode/multi-band.

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5GHz CMOS Quadrature Up-Conversion Mixer

  • Lee, Jang-U;Kim, Sin-Nyeong;Yu, Chang-Sik
    • Proceedings of the IEEK Conference
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    • 2006.06a
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    • pp.617-618
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    • 2006
  • A CMOS quadrature Up-converter for a direct-conversion receiver of 5.15-5.825GHz wireless LAN is described. The Up-converter consists of two sub-harmonic mixers, for I and Q channels, and an LO generation network. In order to decrease the number of inductor, I and Q path are merged. The simulation results including all the parasitics show -17.3dB conversion gain at center and -8 dBv oIP3 while consuming 22.968mW under 1.8V supply. The quadrature Up-converter is under fabrication with the other transmitter blocks in a $0.18{\mu}m$ CMOS technology.

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Improved Circuits for Single-photon Avalanche Photodiode Detectors

  • Kim, Kyunghoon;Lee, Junan;Song, Bongsub;Burm, Jinwook
    • JSTS:Journal of Semiconductor Technology and Science
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    • v.14 no.6
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    • pp.789-796
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    • 2014
  • A CMOS photo detection bias quenching circuit is developed to be used with single photon avalanche photodiodes (SPADs) operating in Geiger mode for the detection of weak optical signals. The proposed bias quenching circuits for the performance improvement reduce the circuit size as well as improve the performance of the quenching operation. They are fabricated in a $0.18-{\mu}m$ standard CMOS technology to verify the effectiveness of this technique with the chip area of only $300{\mu}m^2$, which is about 60 % of the previous reported circuit. Two types of proposed circuits with resistive and capacitive load demonstrated improved performance of reduced quenching time. With a commercial APD by HAMAMATSU, the dead time can be adjusted as small as 50 ns.

IDDQ Testable Design of Static CMOS PLAs with tow rower Consumption

  • Hoshika, Hiroshi;Hashizume, Masaki;Yotsuyanagi, Hiroyuki;Tamesada, Takeomi
    • Proceedings of the IEEK Conference
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    • 2000.07a
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    • pp.351-354
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    • 2000
  • In the past, we proposed an IDDQ testable design method for static CMOS PLA circuits. All bridging faults can be detected in NOR planes of our testable designed PLA circuits by IDDQ testing with 4 kinds of test input vectors which are independent of the logical functions to be realized. However, the testable designed PLA circuits consume large power in the normal operation. In this paper, a new IDDQ testable design method is proposed and evaluated by some experiments. The experimental results show that the PLA circuit designed with our method can work with low power consumption than the previous one.

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Test Generation for Speed-Independent Asynchronous Circuits with Undetectable Faults Identification

  • Eunjung Oh;Lee, Dong-Ik;Park, Ho-Yong
    • Proceedings of the IEEK Conference
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    • 2000.07a
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    • pp.359-362
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    • 2000
  • In this paper, we propose a test pattern generation algorithm on the basis of the identification of undetectable faults for Speed-Independent(SI) asynchronous control circuits. The proposed methodology generates tests from the specification of a target circuit, which describes the behavior of the circuit in the form of Signal Transition Graph (STG). The proposed identification method uses only topological information of a target circuit and reachability information of a fault-free circuit, which is generated in the form of Binary Decision Diagram(BDD) during pre-processing. Experimental results show that high fault coverage over single input stuck-at fault model is obtained for several synthesized SI circuits and the use of the identification process as a preprocessing decreases execution time of the proposed test generation with negligible costs.

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