Proceedings of the IEEK Conference (대한전자공학회:학술대회논문집)

The Institute of Electronics and Information Engineers (대한전자공학회)
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Testability of Current Testing for Open Faults Undetected by Functional Testing in TTL Combinational Circuits

  • Tsukimoto, Isao (Dept. of Electronic Engineering, Takuma National College of Technology) ;
  • Hashizume, Masaki (Dept. of Electrical and Electronic Engineering, Faculty of Engineering, The Univ. of Tokushima) ;
  • Mushiaki, Yukiko (Dept. of Electrical and Electronic Engineering, Faculty of Engineering, The Univ. of Tokushima) ;
  • Yotsuyanagi, Hiroyuki (Dept. of Electrical and Electronic Engineering, Faculty of Engineering, The Univ. of Tokushima) ;
  • Tamesada, Takeomi (Dept. of Electrical and Electronic Engineering, Faculty of Engineering, The Univ. of Tokushima)
  • Published : 2002.07.01
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Abstract

A new test approach based on a supply current test method is proposed for testing open faults in bipolar logic circuits. In the approach, only the open faults are detected by the supply current test method, which are difficult to be detected by functional test methods. The effectiveness of the approach is examined experimentally on open fault detection in TTL combinational circuits. The results shows that higher fault coverage can be established by applying a small number of test input vectors of the supply current test method after test vectors of functional test methods based on stuck-at models.

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