• Steel and Composite Structures
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• v.9 no.3
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• pp.255-274
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• 2009

This paper presents an experimental study of a newly developed composite floor system, built up from thin-walled C-profiles and upper concrete deck. Trapezoidal sheeting provides the formwork and the fastening of the sheet transmits the shear forces between the C-profiles and the deck. The modified formation of the standard self-drilling screw in the beam-to-sheet connection is applied as shear connector. Push-out tests are completed to study the composite behaviour of the different connection arrangements. On the basis of the test results the behaviour is characterized by the observed failure modes. The design values of the connection stiffness and strength are calculated by the recommendation of Eurocode 4. In the next phase of the experimental study six full-scale composite beams are tested. The global geometry is based on the proposed geometry of the developed floor system. The applied shear connections are selected as the most efficient arrangements obtained from the push-out tests. The experimental behaviour of the composite beams are discussed and evaluated. As a conclusion of the experimental study the Eurocode 4 plastic design method is validated for the developed composite floor.

• Proceedings of the IEEK Conference
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• 2001.06b
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• pp.125-128
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• 2001

In this paper, we propose a low power Scan-based Built-ln Self Test based on circuit partitioning and pattern suppression using modified test control unit. To partition a CUT(Circuit Under Testing), the MHPA(Multilevel Hypergraph Partition Algorithm) is used. As a result of circuit partition, we can reduce the total length of test pattern, so that power consumptions are decreased in test mode. Also, proposed Scan-based BIST architecture suppresses a redundant test pattern by inserting an additional decoder in BIST control unit. A decoder detects test pattern with high fault coverage, and applies it to partitioned circuits. Experimental result on the ISCAS benchmark circuits shows the efficiency of proposed low power BIST architecture.

• ETRI Journal
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• v.36 no.6
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• pp.942-952
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• 2014

This paper presents a novel test point insertion (TPI) method for a pseudo-random built-in self-test (BIST) to reduce the area overhead. Recently, a new TPI method for BISTs was proposed that tries to use functional flip-flops to drive control test points instead of adding extra dedicated flip-flops for driving control points. The replacement rule used in a previous work has limitations preventing some dedicated flip-flops from being replaced by functional flip-flops. This paper proposes a logic cone analysis-based TPI approach to overcome the limitations. Logic cone analysis is performed to find candidate functional flop-flops for replacing dedicated flip-flops. Experimental results indicate that the proposed method reduces the test point area overhead significantly with minimal loss of testability by replacing the dedicated flip-flops.

• Tribology and Lubricants
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• v.10 no.3
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• pp.29-38
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• 1994

The friction and wear of mild steel at dry sliding surfaces under different vacuum conditions have been investigated to understand the wear mechanisms. For the test, a ball-ondisk typed wear-rig has been built and implemented, allowing control of sliding speed, load and vacuum. Results show that, at a high sliding velocity, friction of low carbon steel (SS41) under a high vacuum is much higher than that of ambient condition and wear is much severer. It is due to lack of effective oxidation film formation on which steel surfaces could protect themselves against the severe wear. It has been shown, however, that there is a critical regime with contact conditions (at a low sliding velocity, a low load, and under a medium vacuum) at which effective, protective films of low carbon steel have been built on the surfaces in a friction process with a self-regulating way, resulting in both very low coefficients of friction (about 0.3) and mild wear. In order to investigate the protective films on steel surfaces, the worn surfaces and the wear debris have been experimentally analyzed with SEM, AES/SAM and XRD. A theoretical analysis of frictional heating at sliding surfaces, and an experimental analysis of the influence of oxidation wear under various vacuum conditions are described. The important variables on which self-formations of protective films at dry sliding surfaces depend, and the wear mechanisms are also investigated.

• JSTS:Journal of Semiconductor Technology and Science
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• v.16 no.5
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• pp.713-718
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• 2016

Predicting precise specifications of differential mixed-signal circuits is a difficult problem, because analytically derived correlation between process variations and conventional specifications exhibits the limited prediction accuracy due to the phase unbalance, for most self-tests. This paper proposes an efficient prediction technique to provide accurate specifications of differential mixed-signal circuits in a system-on-chip (SoC) based on a nonlinear statistical nonlinear regression technique. A spectrally pure sinusoidal signal is applied to a differential DUT, and its output is fed into another differential DUT through a weighting circuitry in the loopback configuration. The weighting circuitry, which is employed from the previous work [3], efficiently produces different weights on the harmonics of the loopback responses, i.e., the signatures. The correlation models, which map the signatures to the conventional specifications, are built based on the statistical nonlinear regression technique, in order to predict accurate nonlinearities of individual DUTs. In production testing, once the efficient signatures are measured, and plugged into the obtained correlation models, the harmonic coefficients of DUTs are readily identified. This work provides a practical test solution to overcome the serious test issue of differential mixed-signal circuits; the low accuracy of analytically derived model is much lower by the errors from the unbalance. Hardware measurement results showed less than 1.0 dB of the prediction error, validating that this approach can be used as production test.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.44 no.2
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• pp.127-138
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• 2007

In this paper, we propose a new X-masking scheme for utilizing logic built-in self-test The new scheme exploits the phase-shifting network which is based on the shift-and-add property of maximum length pseudorandom binary sequences(m-sequences). The phase-shifting network generates mask-patterns to multiple scan chains by appropriately shifting the m-sequence of an LFSR. The number of shifts required to generate each scan chain mask pattern can be dynamically reconfigured during a test session. An iterative simulation procedure to synthesize the phase-shifting network is proposed. Because the number of candidates for phase-shifting that can generate a scan chain mask pattern are very large, the proposed X-masking scheme reduce the hardware overhead efficiently. Experimental results demonstrate that the proposed X-masking technique requires less storage and hardware overhead with the conventional methods.

• The Journal of the Acoustical Society of Korea
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• v.20 no.1E
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• pp.14-19
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• 2001

We have proposed BIST method and circuit for embedded 16M SDRAM with logic. It can test the AC parameter of embedded 16M SDRAM using the BIST circuit capable of detecting the address of a fail cell installed in an Merged Memory with Logic(MML). It generates the information of repair for redundancy circuit. The function and AC parameter of the embedded memory can also be tested using the proposed BIST method. It is possible to test the embedded SDRAM without external test pin. The total gate of the BIST circuit is approximately 4,500 in the case of synthesizing by 0.25μm cell library and is verified by Verilog simulation. The test time of each one AC parameter is about 200ms using 2Y-March 14n algorithm.

• Proceedings of the KIEE Conference
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• 2009.07a
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• pp.91_92
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• 2009

As the increasing integrity of VLSI, the BIST(Built-In Self Test) is used as an effective method to test chips. Generally the pseudo-random test pattern generation is used for BIST. But it requires too many test patterns when there exist random resistant faults. Therefore we propose a mixed test scheme which applies to the circuit under test, a deterministic test sequence followed by a pseudo-random one. This scheme allows the maximum fault coverage detection to be achieved, furthermore the silicon area overhead of the mixed hardware generator can be reduced.

• The Transactions of The Korean Institute of Electrical Engineers
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• v.60 no.4
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• pp.796-800
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• 2011

As the increasing integrity of VLSI, the BIST(Built-In Self Test) is used as an effective method to test chips. Generally the pseudo-random test pattern generation is used for BIST. But it requires too many test patterns when there exist random resistant faults. Therefore we propose a mixed test scheme which applies to the circuit under test, a deterministic test sequence followed by a pseudo-random one. This scheme allows the maximum fault coverage detection to be achieved, furthermore the silicon area overhead of the mixed hardware generator can be reduced.

• Proceedings of the IEEK Conference
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• 2003.11b
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• pp.27-30
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• 2003

The recent technology developments introduce new difficulties into the test process by the increased complexity of the chip. Most widely used method for testing high complexity and embedded systems is built-in self-test(BIST). In this paper, we describe 5-stage pipeline system as circuit under testing(CUT) and proposed a BIST scheme for the hazard detection unit of the pipeline system. The proposed BIST scheme can generate sequential instruction sets by pseudo-random pattern generator that can detect all hazard issues and compare the expected hazard signals with those of the pipelined system. Although BIST schemes require additional area in the system, it proves to provide a low-cost test solution and significantly reduce the test time.