• Journal of IKEEE
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• v.11 no.1 s.20
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• pp.38-45
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• 2007

A new 8-bit single-slope ADC using analog RAMP generator with digitally controllable dynamic range has been proposed and simulated for column level or per-pixel CMOS image sensor application. The conversion gain of ADC can he controlled easily by using frequency divider with digitally controllable diviber ratio, coarse/fine RAMP with class-AB op-amp, resistor strings, decoder, comparator, and etc. The chip area and power consumption can be decreased by simplified analog circuits and passive components. Proposed frequency divider has been implemented and verified with 0.65um, 2-poly, 2-metal standard CMOS process. And the functional verification has been simulated and accomplished in a 0.35$\mu$m standard CMOS process.

• Proceedings of the IEEK Conference
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• 2001.06b
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• pp.253-256
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• 2001

This paper introduces the design of high-speed analog- to-digital converter for high-definition TV, camcorders, portable equipments and implemented in a 0.65${\mu}{\textrm}{m}$ CMOS technology. Key circuits developed for low power and high speed A/D converter are a dynamic comparator that consumes no static power, a source follower buffered op amp that achives wide bandwidth using large input devices. The converter achieves low power dissipation of 40-mW at 3.3-V power supply. Measured performance includes 0.53 LSB of INL and 0.48 LSB of DNL while sampling at 60MHz.

• The Journal of Korean Institute of Communications and Information Sciences
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• v.32 no.10C
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• pp.1019-1024
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• 2007

In this paper, the 10bit 20MHz pipelined analog-to-digital converter that is able to apply to WLAN system was modeled for ADC design. Each blocks in converter such as sample and hold amplifier(SHA), comparator, multiplyng DAC(MDAC), and digital correction logic(DCL) was modeled. The pipelined ADC with these modeled blocks takes 1/50 less time than the one of simulation using HSPICE.

• Proceedings of the IEEK Conference
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• 2006.06a
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• pp.963-964
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• 2006

By combining a digital DLL and an analog DLL in 2-stage, an improved DLL is implemented in this paper. The proposed DLL is composed of a RDLL (Register Controlled DLL) and a conventional analog DLL. The phase comparator used in the DLL is built with sense-amp based D flip-flops for high speed operation. The proposed DLL circuits have been designed, simulated in 0.18um, 1.8V TSMC CMOS library. The implemented DLL have demonstrated the fast lock-on time of 1us and low jitter of 72ps.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.47 no.5
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• pp.16-23
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• 2010

This paper presents 6bit 250MS/s flash A/D converter which can be applied to wireless communication system. To solve the problem of large power consumption in flash A/D converter, control algorithm by input signal level is used in comparator stage. Also, input voltage range detector circuit is used in reference resistor array to minimize the dynamic power consumption in the comparator. Compared with the conventional A/D converter, the proposed A/D converter shows 4.3% increase of power consumption in analog and a seventh power consumption in digital, which leads to a half of power consumption in total. The A/D converter is implemented in a $0.18{\mu}m$ CMOS 1-poly 6-metal technology. The measured results show 106mW power dissipation with 1.8V supply voltage. It shows 4.1bit ENOB at sampling frequency 250MHz and 30.27MHz input frequency.

• Journal of the Institute of Electronics and Information Engineers
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• v.50 no.6
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• pp.85-90
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• 2013

In this paper, 6bit SAR ADC tolerant to ionizing radiation is presented. Radiation tolerance is achieved by using the Dummy Gate Assisted (DGA) MOSFET which was proposed to suppress the leakage current induced by ionizing radiation and its comparing sample is designed with the conventional MOSFET. The designed ADC consists of binary capacitor DAC, dynamic latch comparator, and digital logic and was fabricated using a standard 0.35um CMOS process. Irradiation was performed by Co-60 gamma ray. After the irradiation, ADC designed with the conventional MOSFET did not operate properly. On the contrary, ADC designed with the DGA MOSFET showed a little parametric degradation of which DNL was increased from 0.7LSB to 2.0LSB and INL was increased from 1.8LSB to 3.2LSB. In spite of its parametric degradation, analog to digital conversion in the ADC with DGA MOSFET was found to be possible.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.45 no.12
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• pp.22-28
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• 2008

This paper designed a efficient 8-bit CMOS analog-to-digital converter(ADC) for an SOC(System On Chip) application. The architecture consists of two modified 4-bit full-flash ADCs, it has been designed using a more efficient architecture. This is to predict roughly the range in which input signal residers and can be placed in the proximity of input signal based on initial prediction. The prediction of input signal is made available by introducing a voltage estimator. For 4-bit resolution, the modified full-flash ADC need only 6 comparators. So a 8-bit ADC require only 12 comparators and 32 resistors. The speed of this ADC is almost similar to conventional full-flash ADC, but the die area consumption is much less due to reduce numbers of comparators and registors. This architecture uses even fewer comparator than half-flash ADC. The circuits which are implemented in this paper is simulated with LT SPICE tool of computer.

• The Journal of the Korea institute of electronic communication sciences
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• v.8 no.8
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• pp.1227-1234
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• 2013

An analog array with a 1.2 double poly floating gate transistor has been developed with a standard CMOS fabrication process. The programming of each cell by means of an efficient control circuit eliminates the unnecessary erasing operation which has been widely used in conventional analog memories. It is seen that the path of the signal for both the programming and the reading is almost exactly the same since just one comparator supports both operations. It helps to eliminate the effects of the amplifier input-offset voltage problem on the output voltage for the read operation. In the array, there is no pass transistor isolating a cell of interest from the adjacent cells in the array. Instead of the extra transistors, one extra bias voltage, Vmid, is employed. The experimental results from the memory shows that the resolution of the memory is equivalent to the information content of at least six digital cells. Programming/erasing of each cell is achieved with no detectable disturbance of adjacent cells. Finally, the unique shape of the injector structure in a EEPROM is adopted as a cell of analog array. It reduces the programming voltage below the transistor breakdown voltage without any special fabrication process.

• The Journal of Korean Institute of Communications and Information Sciences
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• v.24 no.8A
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• pp.1259-1264
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• 1999

In this paper, the High-speed, Low-power Analog-Digital Conversion Archecture is porposed using the Pipelined archecture for High-speed conversion rate and the Successive-Approximation archecture for Low-power consumption. This archecture is the Successive-Approximation archecture using Pipelined Comparator array to change reference voltage during Holding Time. The Analog-to-Digital Converter for video processing is designed using 0.8${\mu}{\textrm}{m}$ CMOS tchnology. When an 6-bit 10MS/s Analog-to-Digital Converter is simulatined, the INL/DNL errors are $\pm$0.5/$\pm$1, respectively. The SNR is 37dB at a sampling rate of 10MHz with 100KHz sine input signal. The power consumption is 1.46mW at 10MS/s. When an 8-bit 10MS/s Analog-to Digital Converter is simulatined, the INL/DNL errors are $\pm$0.5/$\pm$1, respectively. The SNR is 41dB at a sampling rate of 100MHz with 100KHz sine input signal. The power consumption is 4.14m W at 10MS/s.

• 제어로봇시스템학회:학술대회논문집
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• 2005.06a
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• pp.1417-1422
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• 2005

Among the sensors mainly used for displacement measurement, there are a linear CCD(Charge Coupled Device) and a PSD(Position Sensitive Detector) as a non-contact type. Their structures are different very much, which means that the signal processing of both sensors should be applied in the different ways. Most of the displacement measurement systems to get the 3-D shape profile of an object using a linear CCD are a computer-based system. It means that all of algorithms and mathematical operations are performed through a computer program to measure the displacement. However, in this paper, the developed system has microprocessor and other digital components that make the system measure the displacement of an object without a computer. The thing different from the previous system is that AVR microprocessor and FPGA(Field Programmable Gate Array) technology, and a comparator is used to play the role of an A/D(Analog to Digital) converter. Furthermore, an ATC(Automatic Threshold Control) algorithm is applied to find the highest pixel data that has the real displacement information. According to the size of the light circle incident on the surface of the CCD, the threshold value to remove the noise and useless data is changed by the operation of AVR microprocessor. The total system consists of FPGA, AVR microprocessor, and the comparator. The developed system has the improvement and shows the better performance than the system not using the ATC algorithm for displacement measurement.