• Transactions of the Korean Society of Mechanical Engineers A
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• v.34 no.3
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• pp.273-281
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• 2010

In this paper, a method to predict the fatigue life of an axle drive shaft by the calibrated accelerated life test (CALT) method is proposed. The CALT method is very effective for predicting lifetimes, significantly reducing test time, and quantifying reliability. The fatigue test is performed by considering two high stress and one low stress levels, and the lifetime at the normal stress level is predicted by extrapolation. In addition, in this study, the major reliability parameters such as the lifetime, accelerated power index, shape parameter, and scale parameter are determined by conducting various experiments. The lifetime prediction of the axle drive shaft is verified by comparing the experimental results with load spectrum data. The results confirm that the CALT method is effective for lifetime prediction and requires a short test time.

• Carbon letters
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• v.28
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• pp.9-15
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• 2018

In the aerospace field, Carbon/Cork composites have been used for rocket propulsion systems as a light weight structural component with a high bending stiffness and high thermal insulation properties. For the fabrication of a carbon composite with a heat insulation cork part, the bonding properties between them are very important to determine the service life of the Carbon/Cork composite structure. In this study, the changes in the interfacial adhesion and mechanical properties of Carbon/Cork composites under accelerated aging conditions were investigated. The accelerated aging experiments were performed with different temperatures and humidity conditions. The properties of the aged Carbon/Cork composites were evaluated mainly with the interfacial strength. Finally, the lifetime prediction of the Carbon/Cork composites was performed with the long-term property data under accelerated conditions.

• Journal of Applied Reliability
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• v.9 no.1
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• pp.37-45
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• 2009

Recently mechanical watt-hour meters are being replaced by electronic watt-hour meters. The replacement period of mechanical watt-hour meters is 7 years. This period is based on long term historical data. The replacement period of electronic watt-meters is also 7 years. This period is determined using the replacement period of mechanical watt-hour meters. However lifetime of mechanical watt-hour meters is different from the lifetime of electronic meters. In order to determine desirable replacement period of electronic watt-hour meters, accelerated life tests of major components in electronic watt-hour meters were performed. The test results showed that LCD was the component which had the shortest lifetime. In this paper, lifetime of electronic watt-hour meters manufactured by 3 company was estimated and life test standard for LCD was developed.

• Journal of the Korean Data and Information Science Society
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• v.7 no.1
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• pp.37-46
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• 1996

In this paper, we introduce the goodness of fit test procedure for lifetime distribution using step stress accelerated lifetime data. Using the nonpapametric estimate of acceleration factor, we prove the strong consistence of empirical distribution function under null hypothesis. The critical vailues of Kolmogorov-Smirnov, Anderson-Darling, Cramer-von Mises statistics are computed when the lifetime distibution is assumed to be exponential and Weibull. The power of test statistics are compared through Monte-Cairo simulation study.

• Journal of the Korean Institute of Electrical and Electronic Material Engineers
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• v.20 no.3
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• pp.197-201
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• 2007

The accelerated aging test equipment which is possible to apply voltage and temperature at the same time, is fabricated to predict lifetime of high capacity thyristor in short time. The variations of the forward/reverse breakdown voltage and the leakage current are investigated as an aging diagnostic tool. Lifetimes of the devices which are predicted from the reverse breakdown voltage with an accelerated aging time, have shown 3-15 years.

• Journal of Korean Institute of Industrial Engineers
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• v.14 no.2
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• pp.91-97
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• 1988

In accelerated life testing, a relationship is usually assumed between the stress and a parameter of the lifetime distribution. However, the true relationship is not usually known, and therefore, the experimenter may wish to provide protections against the likely departures from the assumed relationship. This paper considers an accelerated life test in which two stress levels are involved, and the lifetime of each test item at a stress level is assumed to have an independent, identical, exponential distribution. For the case where a first order relationship is assumed while the true one is quadratic, a procedure is developed for allocating test items to stress levels such that the bias and/or the variance of the estimated(log-transformed) mean lifetime at the use condition is minimized.

• Proceedings of the KIEE Conference
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• 2005.07c
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• pp.1945-1947
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• 2005

This study considers find out best accelerated life testing and lifetime prediction of electrolytic capacitors. We proved about relation between failure and deterioration mechanism from last thesis. Beside we performed test that temperature and voltage press higher than allowance specification. Failure distribution acquired from those test. And wiebull function and Minitab program applied to accelerated constant and lifetime by means of calculation. At the result, goodness of fit affect to weibull function and acceleration factor therefore fitting is important factor in reliability testing.

• Proceedings of the Korean Reliability Society Conference
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• 2004.07a
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• pp.129-137
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• 2004

This paper presents an accelerated life test for burnout of tungsten filament of incandescent lamp. From failure analyses of field samples, it is shown that their root causes are local heating or hot sports in the filament caused by tungsten evaporation and wire sag. Finite element analysis is performed to evaluate the effect of vibration and impact for burnout, but any points of stress concentration or structural weakness are not found in the sample. To estimate the burnout life of lamp, an accelerated life test is planned by using quality function deployment and fractional factorial design, where voltage, vibration, and temperature are selected as accelerating variables. We assumed that Weibull lifetime distribution and a generalized linear model of life-stress relationship hold through goodness of fit test and test for common shape parameter of the distribution. Using accelerated life testing software, we estimated the common shape parameter of Weibull distribution, life-stress relationship, and accelerating factor.

• Journal of Korean Institute of Industrial Engineers
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• v.24 no.3
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• pp.367-379
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• 1998

This paper considers two modes of partially accelerated life tests for items having Weibull lifetime distributions. In a use-to-acclerated mode each item is first run at use condition and, if it does not fail for a specified time, then it is run at accelerated condition until a predetermined censoring time. In an accelerated-to-use mode each one is first run at accelerated condition and, if it does not fail for a specified time, then it is run at use condition. Maximum likelihood estimators of the parameters of the lifetime distribution at use condition, and the 'acceleration factor' are obtained. The stress change time for each mode is determined to minimize the asymptotic variance of the acceleration factor, and the two modes are compared. For selected values of the design parameters the optimum plans are obtained, and the effects of the incorrect pre-estimates of the design parameters are investigated. Minimizing the generalized asymptotic variance of the estimators of the model parameters is also considered as an optimality criterion.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2008.11a
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• pp.257-258
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• 2008

Hall-type current sensors have been widely used in many fields such as elevator and train system. To estimate lifetime of hall-type current sensors, an accelerated life test with real-time monitoring system simultaneously was designed and performed in high temperature environment with three different temperatures. From the experimental results, activation energy was about 0.9 eV, and acceleration factor was about 450 based on Arrhenius model. As a results, $B_{10}$ lifetime of hall-type current sensor is estimated to be 65,460 hours.