Journal of the Korean Institute of Electrical and Electronic Material Engineers (한국전기전자재료학회논문지)

The Korean Institute of Electrical and Electronic Material Engineers (한국전기전자재료학회)
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The Aging Diagnostic Technology for Predicting Lifetime of Thyristor Devices

사이리스터 소자의 수명예측을 위한 열화진단기술

  • 김병철 (진주산업대학교 전자공학과) ;
  • 김형우 (한국전기연구원 전력반도체연구그룹) ;
  • 서길수 (한국전기연구원 전력반도체연구그룹)
  • Published : 2007.03.01
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Abstract

The accelerated aging test equipment which is possible to apply voltage and temperature at the same time, is fabricated to predict lifetime of high capacity thyristor in short time. The variations of the forward/reverse breakdown voltage and the leakage current are investigated as an aging diagnostic tool. Lifetimes of the devices which are predicted from the reverse breakdown voltage with an accelerated aging time, have shown 3-15 years.

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References

  1. M. Ohring, 'Reliability and Failure of Electronic Materials and Devices', Academic Press, 1998
  2. M. Cepek and C. P., Krishnayya, 'Thyristor aging', Power System Technology, p. 18, 1998
  3. B. J. Baliga, 'Power Semiconductor Devices', John Wiley & Sons, 1987
  4. B. J. Baliga, 'Analysis of insulated gate transistor turn-off characteristics', IEEE Electron Device Lett., EDL-6, p. 74, 1985
  5. Endicott, H., Hatch, B., and Sohmer, R., 'Application of the eyring model to capacitor aging data', IEEE Trans. Component Part, Vol. 12, p. 34, 1965 https://doi.org/10.1109/TCP.1965.1135088
  6. 김형우, 서길수 외, '대용량 사이리스터의 열화메카니즘', 대한전기학회 합동추계학술대회논문집, p. 82, 2003
  7. 김형우, 서길수, 김기현, 이양재, 최낙권, 김은동, 'Thyristor 소자의 열화에 따른 특성저하 분석기법에 관한 연구', 한국전기전자재료학회 2005하계학술대회논문집, p. 99, 2005
  8. 김형우, 서길수, 김상철, 강인호, 김남균, 김은동, 'Thyristor 소자의 스트레스에 따른 소자파괴 메커니즘 연구', 한국전기전자재료학회 2005하계학술대회논문집, p. 129, 2005
  9. 社團法人 電氣協同硏究曾 '電力系統用 power electronics 設備の現場と設計.保守基準', 電氣協同硏究 第 57券,第 2號, 평성 13년 10월