• Title/Summary/Keyword: Device lifetime

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High Efficiency and Long Lifetime for Organic Light-Emitting Diode Using a New Electron Transport Material

  • Miyashita, Yuichi;Mochizuki, Osamu;Tanaka, Tsuyoshi;Aihara, Hidenori
    • 한국정보디스플레이학회:학술대회논문집
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    • 2008.10a
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    • pp.428-430
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    • 2008
  • We demonstrated high power efficiency and long lifetime for organic light-emitting diode (OLED) using a new electron transport material (ETM-1). A power efficiency of the device with ETM-1 was improved compared to a standard device using tris(8-hydroxy-quinolinate)aluminum ($Alq_3$). Moreover, the lifetime was 4 times longer than the standard device.

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A Study on the Lifetime Prediction of Device by the Method of Bayesian Estimate (베이지안 추정법에 의한 소자의 수명 예측에 관한 연구)

  • 오종환;오영환
    • The Journal of Korean Institute of Communications and Information Sciences
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    • v.19 no.8
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    • pp.1446-1452
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    • 1994
  • In this paper, Weibull distribution is applied to the lifetme distribution of a device. The method of Bayesian estimate used to estimate requiring parameter in order to predict lifetime of device using accelerated lifetime test data, namely failure time of device. The method of Bayesian estimate needs prior information in order to estimate parameter. But this paper proposed the method of parameter estimate without prior information. As stress is temperature, Arrhenius model is applied and the method of linear estimate is applied to predict lifetime of device at the state of normal operation.

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A study on the method of OLED device's lifetime test (OLED 소자의 수명 평가법에 관한 연구)

  • Choi, Young-Tae;Cho, Jai-Rip
    • Journal of the Korea Safety Management & Science
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    • v.10 no.4
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    • pp.145-152
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    • 2008
  • According to the Korea Agency for Technology and Standards under the Commerce Ministry, OLED device's lifetime is defined 50% drop of luminance. OLED device is self-emitting operating device, that means it becomes different color between pixels under using environment. That's reason of the different luminance drop ratio & chromaticity coordinates shift ratio with time. The problem is there is not recovered after luminance drop and color shift. We can recognize the difference of color as image sticking. First we studied when human recognize the difference of color and second we apply the method of OLED device's lifetime test that's able to check different color between pixels.

A study on the method of OLED device's lifetime test (OLED 소자의 수명 평가법에 관한 연구)

  • Choi, Young-Tae;Cho, Jai-Rip
    • Proceedings of the Safety Management and Science Conference
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    • 2008.11a
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    • pp.131-143
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    • 2008
  • According to the Korea Agency for Technology and Standards under the Commerce Ministry, OLED device's lifetime is defined 50% drop of luminance. OLED device is self-emitting operating device, that means it becomes different color between pixels under using environment. That's reason of the different luminance drop ratio & chromaticity coordinates shift ratio with time. The problem is there is not recovered after luminace drop and color shift. We can recognize the difference of color as image sticking. First we studied when human recognize the difference of color and second we apply the method of OLED device's lifetime test that's able to check different color between pixels

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High Efficiency and Long Lifetime for Organic Light-Emitting Diode Using New Electron Transport Materials

  • Tanaka, Tsuyoshi;Sato, Masaru;Aihara, Hidenori;Yanai, Naoko;Yamakawa, Tetsu
    • 한국정보디스플레이학회:학술대회논문집
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    • 2007.08a
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    • pp.625-627
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    • 2007
  • We demonstrated high power efficiency and long lifetime in organic light-emitting diode (OLED) using new electron transport materials (ETMs). Electroluminescent device with these ETMs showed lower driving voltage than that with $Alq_3$. The device lifetime with a new ETM was 2 times longer than that with $Alq_3$.

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Development of Solid State Relay(SSR) Life Prediction Device for Glass Forming Machine (유리 성형기의 무접점릴레이(SSR) 수명 예측장치 개발)

  • Yang, Sung-Kyu;Kim, Gab-Soon
    • Journal of the Korean Society of Manufacturing Process Engineers
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    • v.21 no.2
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    • pp.46-53
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    • 2022
  • This paper presents the design and manufacture of a Solid State Relay (SSR) life prediction device that can predict the lifetime of an SSR, which is a key component of a glass forming machine. The lifetime of an SSR is over when the current supplied to the relay is overcurrent (20 A or higher), and the operating time is 100,000 h or longer. Therefore, the life prediction device for the SSR was designed using DSP to accurately read the current and temperature values from the current and temperature sensors, respectively. The characteristic test of the manufactured non-contact relay life prediction device confirmed that the current and temperature were safely measured. Thus, the SSR lifetime prediction device developed in this study can be used to predict the lifetime of an SSR attached to a glass forming machine.

Personalized Battery Lifetime Prediction for Mobile Devices based on Usage Patterns

  • Kang, Joon-Myung;Seo, Sin-Seok;Hong, James Won-Ki
    • Journal of Computing Science and Engineering
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    • v.5 no.4
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    • pp.338-345
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    • 2011
  • Nowadays mobile devices are used for various applications such as making voice/video calls, browsing the Internet, listening to music etc. The average battery consumption of each of these activities and the length of time a user spends on each one determines the battery lifetime of a mobile device. Previous methods have provided predictions of battery lifetime using a static battery consumption rate that does not consider user characteristics. This paper proposes an approach to predict a mobile device's available battery lifetime based on usage patterns. Because every user has a different pattern of voice calls, data communication, and video call usage, we can use such usage patterns for personalized prediction of battery lifetime. Firstly, we define one or more states that affect battery consumption. Then, we record time-series log data related to battery consumption and the use time of each state. We calculate the average battery consumption rate for each state and determine the usage pattern based on the time-series data. Finally, we predict the available battery time based on the average battery consumption rate for each state and the usage pattern. We also present the experimental trials used to validate our approach in the real world.

A study on OLED device's accelerated lifetime test (OLED 소자의 가속수명 시험에 관한 연구)

  • Choi, Young-Tae;Joe, Jae-Rib
    • Journal of the Korea Safety Management & Science
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    • v.10 no.3
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    • pp.73-79
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    • 2008
  • Display's life time is defined as the time of 50% luminance drop. It was used luminance and temperature as accelerated factor to accelerated lifetime at test. When it's working jule-heat is generated and device's temperature is growing as any temperature because OLED is self-luminance display device. So we decided temperature condition is 25, $70^{\circ}C$, and luminance condition is $60{\sim}300cd/m^2$ in test. It's assumed accelerated lifetime model by result of the test.

Switching Characteristics Enhancement of PT Type Power Diode using Proton Irradiation Technique (양성자 주입기술을 이용한 PT형 전력다이오드의 스위칭 특성 향상)

  • Kim Byoung-Gil;Choi Sung-Hwan;Lee Jong-Hun;Bae Young-Ho
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.19 no.3
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    • pp.216-221
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    • 2006
  • Lifetime control technique by proton implantation has become an useful tool for production of modern power devices. In this work, punch-through type diodes were irradiated with protons for the high speed power diode fabrication. Proton irradiation which was capable of controlling carrier's lifetime locally was carried out at the various energy and dose conditions. Characterization of the device was performed by current-voltage, capacitance-voltage and reverse recovery time measurement. We obtained enhanced reverse recovery time characteristics which was about $45\;\%$ of original device reverse recovery time and about $73\;\%$ of electron irradiated device reverse recovery time. The measurement results showed that proton irradiation technique was able to effectively reduce minority carrier lifetime without degrading the other characteristics.

Modified Poly(3,4-ethylenedioxythiophene) with Poly(ionic liquid)s as a new hole injecting materials in organic light emitting diodes (OLEDs)

  • Kim, Earl;Kim, Tae-Young;Suh, Kwang-Seok
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2010.06a
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    • pp.132-132
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    • 2010
  • In a previous report, we demonstrated that poly (3,4-ethylenedioxythiophene) derived from poly (ionic liquid) (PEDOT:PIL) constitutes a polymeric hole-injecting material capable of improving device lifetime in organic light-emitting diodes (OLEDs).was attributed to aprotection characteristic of PEDOT:PIL for the indium extraction from ITO electrodes, which frequently occurrs in the OLED device with the conventional PEDOT materials. In this study, we report the OLED device lifetime as well asvice efficiencycan be further improved with the modified PEDOT:PIL in whichorganic compounds are incorporated. The deviced performance will be presented in terms of device lifetime and efficiencies.

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