Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference (한국전기전자재료학회:학술대회논문집)

The Korean Institute of Electrical and Electronic Material Engineers (한국전기전자재료학회)
권호 표지

Lifetime estimation for current sensor by accelerated life test

가속수명시험을 통한 전류센서의 수명 예측

  • Kim, Je-Min (Reliability Technology Research Center, Korea Electronics Technology Institute (KETI)) ;
  • Choi, Sung-Soon (Reliability Technology Research Center, Korea Electronics Technology Institute (KETI)) ;
  • Ma, Byung-Jin (Reliability Technology Research Center, Korea Electronics Technology Institute (KETI)) ;
  • Lee, Kwan-Hun (Reliability Technology Research Center, Korea Electronics Technology Institute (KETI)) ;
  • Song, Byeong-Suk (Reliability Technology Research Center, Korea Electronics Technology Institute (KETI))
  • 김제민 (전자부품연구원 신뢰성연구센터) ;
  • 최성순 (전자부품연구원 신뢰성연구센터) ;
  • 마병진 (전자부품연구원 신뢰성연구센터) ;
  • 이관훈 (전자부품연구원 신뢰성연구센터) ;
  • 송병석 (전자부품연구원 신뢰성연구센터)
  • Published : 2008.11.06
Download PDF
⟨ Previous Next ⟩

Abstract

Hall-type current sensors have been widely used in many fields such as elevator and train system. To estimate lifetime of hall-type current sensors, an accelerated life test with real-time monitoring system simultaneously was designed and performed in high temperature environment with three different temperatures. From the experimental results, activation energy was about 0.9 eV, and acceleration factor was about 450 based on Arrhenius model. As a results, $B_{10}$ lifetime of hall-type current sensor is estimated to be 65,460 hours.

Keywords