Cleanroom Contamination Control using Particle Composition Analysis

입자 성분분석을 통한 클린룸 오염제어

  • 이현철 (삼성전기 생산기술연구소 MCC TG) ;
  • 김대영 (삼성전기 생산기술연구소 MCC TG) ;
  • 이성훈 (삼성전기 생산기술연구소 MCC TG) ;
  • 노광철 (서울시립대학교 산업기술연구소) ;
  • 오명도 (서울시립대학교 기계정보공학과)
  • Published : 2007.05.30

Abstract

The practical studies on the method of particle contamination control for yield enhancement in the cleanroom were carried out. The method of the contamination control was considered, which is composed of data collection, data analysis, improvement action, verification, and implement control. The composition analysis for data collection and data analysis was used in the cellular phone module packaging lines. And this method was evaluated by the variation of yield loss between before and after improvement action. In case that the composition analysis was applied, the critical sources were selected and yield loss reduction through improvement actions was also investigated. From these results, it is concluded that the composition analysis is effective solutions for particle contamination control in the cleanroom.

Keywords