• Journal of Applied Reliability
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• v.14 no.4
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• pp.220-224
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• 2014

A Bayesian zero-failure reliability demonstration test method for products with Weibull lifetime distribution is presented. Inverted gamma prior distribution for the scale parameter of the Weibull distribution is used to design the Bayesian test plan and selecting a prior distribution using a prior test information is discussed. A test procedure with zero-failure acceptance criterion is developed that guarantee specified reliability of a product with given confidence level. An example is provided to illustrate the use of the developed Bayesian reliability demonstration test method.

• Journal of Applied Reliability
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• v.13 no.1
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• pp.1-10
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• 2013

A Bayesian zero-failure reliability demonstration test method for products with exponential lifetime distribution is presented. Beta prior distribution for reliability of a product is used to design the Bayesian test plan and selecting a prior distribution using a prior test information is discussed. A test procedure with zero-failure acceptance criterion is developed that guarantees specified reliability of a product with given confidence level. An example is provided to illustrate the use of the developed Bayesian reliability demonstration test method.

• Journal of Applied Reliability
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• v.12 no.1
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• pp.47-56
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• 2012

Reliability demonstration tests with zero-failure acceptance criterion are most commonly used in the field of reliability application since they require fewer test samples and less test time compared to other test methods that guarantee the same reliability with a given confidence level. For products with lognormal lifetime distribution, an economic zero-failure test plan is developed that minimizes the total cost related to perform a life test to guarantee a specified reliability of a product with a given confidence level. A numerical example is provided to illustrate the use of the proposed test plan.

• Journal of Korean Society for Quality Management
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• v.39 no.1
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• pp.71-77
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• 2011

In the fields of reliability application, the most commonly used test methods for reliability qualification are zero failure tests since they require fewer test samples and less test time compared to other test methods that guarantee the same reliability with a given confidence level. An economic zero failure test plan is developed that minimizes the total cost related to perform a life test to guarantee a specified reliability of a product with a given confidence level and a numerical example is provided to illustrate the use of the proposed test method.

• Journal of Applied Reliability
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• v.14 no.1
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• pp.53-57
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• 2014

In the fields of reliability application, the most commonly used test methods for reliability demonstration are zero-failure acceptance tests since they require fewer test samples and less test time compared to other test methods that guarantee the same reliability with a given confidence level. For products with lognormal lifetime distribution, the value of scale parameter is usually assumed to be known in designing reliability demonstration tests. It is important to select correct values of scale parameters to guarantee the specified reliability with given confidence level exactly. The effect of using wrong values of scale parameters in designing reliability demonstration test for products with lognormal lifetime distribution is examined and selecting proper values of scale parameters for conservative reliability demonstration is discussed.

• Journal of Applied Reliability
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• v.11 no.3
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• pp.225-234
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• 2011

In the fields of reliability application, the most commonly used test methods for reliability qualification are zero-failure acceptance tests since they require fewer test samples and less test time compared to other test methods that guarantee the same reliability with a given confidence level. Usually values of shape parameters are assumed to be known in designing reliability qualification tests for Weibull lifetime distribution. It is important to select correct values of shape parameters to guarantee the specified reliability with given confidence level exactly. The effect of using wrong values of shape parameters in designing reliability qualification test for products with Weibull lifetime distribution is examined and selecting proper values of shape parameters for conservative reliability qualification is discussed.

• Journal of Applied Reliability
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• v.15 no.3
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• pp.170-175
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• 2015

Reliability demonstration tests (RDT's) are widely employed in design verification and process validation stages of industry. New mixed attribute-variable RDT plans that compromise demerits of the corresponding zero and zero or one failure plans which are common in practice are developed for the exponential distribution. The proposed mixed plans are compared with the typical RDT plans in terms of probability of acceptance and expected test termination time. A numerical example is provided to illustrate the mixed plans and a procedure to extend these plans to the Weibull distribution with known shape parameter is also presented.

• Proceedings of the Korean Reliability Society Conference
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• 2005.06a
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• pp.379-384
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• 2005

신뢰성 보증을 위한 인증시험(reliability qualification test)이나 수락시험(reliability acceptance test)에 있어서 가장 널리 사용되는 시험방식 중의 하나가 무고장 시험방식(zero-failure test)이다. 무고장 시험방식이 선호되는 이유는 요구수명을 주어진 신뢰수준으로 보장하는 시험방식들 중에서 적용이 비교적 수월하며 상대적으로 시험기간이나 시료수를 줄일 수 있다는 점 때문이다. 그러나 무고장 시험의 경우, 시험을 의뢰하는 입장에서는 고장이 하나라도 발생하면 불합격 된다는 부담감을 가질 수 있으며 생산자 위험이 커진다는 단점도 가지고 있다. 본 연구에서는 이러한 문제를 보완한 2단계 시험방식을 설계, 제안하고 시험시간, OC곡선 등 시험방식의 특성을 무고장 시험방식과 비교, 분석하였다.

• International Journal of Reliability and Applications
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• v.17 no.1
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• pp.85-105
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• 2016

In this paper accelerated life testing is incorporated in quality control technique of acceptance sampling plan to induce early failures in high reliability products.Stress under accelerated condition can be applied in constant-stress, step-stress and progressive-stress or combination of such loadings. A ramp-stress results when stress is increased linearly (from zero) with time. In this paper optimum failure-censored ramp-stress accelerated life test sampling plan for log-logistic distribution has been formulated with cost considerations. The log-logistic distribution has been found appropriate for insulating materials. The optimal plans consist in finding optimum sample size, sample proportion allocated to each stress, and stress rate factor such that producer's and consumer's interests are safeguarded. Variance optimality criterion is used when expected cost per lot is not taken into consideration, and bilevel programming approach is used in cost optimization problems. The methods developed have been illustrated using some numerical examples, and sensitivity analyses carried out in the context of ramp-stress ALTSP based on variable SSP for proportion nonconforming.

• Journal of Korean Institute of Industrial Engineers
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• v.43 no.2
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• pp.147-153
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• 2017

In order to demonstrate a target reliability with a specified confidence level, a new two-stage Bayesian Reliability Demonstration Test (RDT) plans that is known to be more effective than a corresponding single-stage one is proposed and developed by Bayesian framework with beta prior distribution for Weibull life time distribution. A numerical example is provided to illustrate the proposed RDT plans and compared with other non-Bayesian and Bayesian plans. Comparative results show that the proposed Bayesian two-stage plans have some merits in terms of required and expected testing time and probability of acceptance.