• Journal of the Korean Institute of Electrical and Electronic Material Engineers
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• v.20 no.3
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• pp.197-201
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• 2007

The accelerated aging test equipment which is possible to apply voltage and temperature at the same time, is fabricated to predict lifetime of high capacity thyristor in short time. The variations of the forward/reverse breakdown voltage and the leakage current are investigated as an aging diagnostic tool. Lifetimes of the devices which are predicted from the reverse breakdown voltage with an accelerated aging time, have shown 3-15 years.

• Journal of Advanced Marine Engineering and Technology
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• v.39 no.8
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• pp.828-832
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• 2015

This study is conducted for the evaluation of corrosion and lifetime prediction of fire extinguishing pipelines in residential buildings. The fire extinguishing pipeline is made of carbon steel. Twenty-four samples were selected among all the fire extinguishing pipelines in a building; the selection was based on specimenspositions, pipeline diameters, and pipeline thickness. Analysis was conducted by using the results of visual inspection, electrochemical potentiodynamic anodic polarization test, pitting depth measurements, and extreme value statistics with the Gumbel distribution. The maximum pitting depth and remaining life were statistically predicted using extreme value statistics. During visual inspection, pitting corrosion was observed in several samples. In addition, extreme value statistics demonstrated that there were several pipelines that were very sensitive to pitting corrosion. However, the pitting corrosion was not critical in all the pipelines; thus, it was necessary to change only those pipelines that were severely corroded.

• Journal of Ubiquitous Convergence Technology
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• v.1 no.1
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• pp.35-41
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• 2007

In mobile ad-hoc wireless networks, one of the most important challenging issues is how to conserve energy, maximizing the lifetime of route(networks) in the view points of both power and mobility of nodes. However, many transmission methods presented in the previous works can not satisfy these two objectives simultaneously. To obtain these two goals, in this paper we propose an architecture to support power saving transmission services with route stability in mobile ad-hoc wireless networks. The proposed architecture consists of two parts, the underlying route stability method to support route(network) lifetime and the power saving transmission methods. The performance evaluation of the proposed architecture is achieved via simulation and analysis.

• Journal of Korean Vacuum Science & Technology
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• v.7 no.2
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• pp.39-44
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• 2003

Recent ULSI and multilevel structure trends in microelectronic devices minimize the line width down to a quarter micron and below, which results in the high current densities in thin film interconnections. Under high current densities, an EM(electromigration) induced failure becomes one of the critical problems in a microelectronic device. This study is to improve thin film interconnection materials by investigating the EM characteristics in PSG(phosphosilicate glass)/SiO$_2$ passivated Al-l%Si thin film interconnections. Straight line patterns, wide and narrow link type patterns, and meander type patterns, etc. were fabricated by a standard photholithography process. The main results are as follows. The current crowding effects result in the decrease of the lifetime in thin film interconnections. The electric field effects accelerate the decrease of lifetime in the double-layered thin film interconnections. The lifetime of interconnections also depends upon the current conditions of P.D.C.(pulsed direct current) frequencies applied at the same duty factor.

• Journal of Korean Institute of Industrial Engineers
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• v.14 no.2
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• pp.91-97
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• 1988

In accelerated life testing, a relationship is usually assumed between the stress and a parameter of the lifetime distribution. However, the true relationship is not usually known, and therefore, the experimenter may wish to provide protections against the likely departures from the assumed relationship. This paper considers an accelerated life test in which two stress levels are involved, and the lifetime of each test item at a stress level is assumed to have an independent, identical, exponential distribution. For the case where a first order relationship is assumed while the true one is quadratic, a procedure is developed for allocating test items to stress levels such that the bias and/or the variance of the estimated(log-transformed) mean lifetime at the use condition is minimized.

• Journal of Sensor Science and Technology
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• v.19 no.5
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• pp.369-374
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• 2010

It is important to efficiently elect the cluster header in Hierarchical Sensor Network, because it largely affects on the lifetime of the network. Therefore, recent research is focused on the lifetime extension of the whole network for efficient cluster header election. In this paper, we propose the new Cluster Header Election Scheme in which the cluster is divided into Group considering Distance from Upper Node, and a cluster header will be elected by node density of the Group. Also, we evaluate the performance of this scheme, and show that this proposed scheme improves network lifetime in Zigbee environment.

• Proceedings of the Korea Technology Innovation Society Conference
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• 2011.06a
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• pp.161-173
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• 2011

• 한국정보디스플레이학회:학술대회논문집
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• 2004.08a
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• pp.684-687
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• 2004

We have developed multi-layer passivation films of UV-polymerized film/inorganic composite film to improve the long lifetime of passivated OLEDs for very thin flat panel applications. Preliminary lifetime to half initial luminance ($L_{o}{\sim}\;3,000\;cd/m^2$) of order 300 Hr is achieved on the conventional encapsulated test pixel using a passive matrix drive at room temperature; 570 Hr lifetime is achieved on a de tested multi-layer passivated 9$mm^2$ test pixel.

• Smart Structures and Systems
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• v.4 no.5
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• pp.641-653
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• 2008

This paper proposes a practical and realistic method to establish an optimal lifetime maintenance strategy for deteriorating bridges by considering the life-cycle performance as well as the life-cycle cost. The proposed method offers a set of optimal tradeoff maintenance scenarios among other conflicting objectives, such as minimizing cost and maximizing performance. A genetic algorithm is used to generate a set of maintenance scenarios that is a multi-objective combinatorial optimization problem related to the lifetime performance and the life-cycle cost as separate objective functions. A computer program, which generates optimal maintenance scenarios, was developed based on the proposed method using the life-cycle costs and the performance of bridges. The subordinate relation between bridge members has been considered to decide optimal maintenance sequence and a corresponding algorithm has been implemented into the program. The developed program has been used to present a procedure for finding an optimal maintenance scenario for steel-girder bridges on the Korean National Road. Through this bridge maintenance scenario analysis, it is expected that the developed method and program can be effectively used to allow bridge managers an optimal maintenance strategy satisfying various constraints and requirements.

• Journal of the Korean Institute of Electrical and Electronic Material Engineers
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• v.19 no.1
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• pp.7-12
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• 2006

Local minority carrier lifetime control by means of particle irradiation is an useful technology for Production of modern silicon Power devices. Crystal damage due to ion irradiation can be easily localized by choosing appropriate irradiation energy and minority tarrier lifetime can be reduced locally only in the damaged layer. In this work, proton irradiation technology was used for improving the switching characteristics of a un diode. The irradiation was carried out with various energy and dose condition. The device was characterized by current-voltage, capacitance-voltage, and reverse recovery time measurements. Forward voltage drop was increased to 1.1 V at forward current of 5 A, which was $120\%$ of its original device. Reverse leakage current was 64 nA at reverse voltage of 100 V, and reverse breakdown voltage was 670 V which was the same voltage as original device without irradiation. The reverse recovery time of device was reduced to about $20\%$ compared to that of original device without irradiation.