• Journal of KIISE:Computer Systems and Theory
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• v.29 no.6
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• pp.361-368
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• 2002

This paper presents a new data path synthesis algorithm which takes into account simultaneously three important design criteria: testability, design area, and total execution time. We define a goodness measure on the testability of a circuit based on three rules of thumb introduced in prior work on synthesis for testability. We then develop a stepwise refinement synthesis algorithm which carries out the scheduling and allocation tacks in an integrated fashion. Experimental results for benchmark and other circuit examples show that we are able to enhance the testability of circuits with very little overheads on design area and execution time.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.42 no.10 s.340
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• pp.47-54
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• 2005

In this paper, a new synthesis method for testability of synchronous sequential circuits is suggested on an incompletely-specified state transition graph (STG) by reducing the number of redundant faults. In the suggested synthesis method, 1) a given STG is modified by adding undefined states and unspecified input transitions using distinguishable transition, 2) the STG is modified to be strongly-connected as much as possible. Experimental results with MCNC benchmark show that the number of redundant faults of gate-level circuits synthesized by our modified STGs are reduced, and much higher fault coverage is obtained.

• Proceedings of the IEEK Conference
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• 1998.06a
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• pp.875-878
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• 1998

In this thesis, we present efficient techniques to reduce the switching activity in a CMOS combinational logic network based on local logic transforms. But this techniques is not appropriate in the view of testability because of deteriorating the random pattern testability of a circuit. This thesis proposes a circuit design method having two operation modes. For the sake of power dissipation(normal operation mode), a gate output switches as rarely as possible, implying highly skewed signal probabilities for 1 or 0. On the other hand, at test mode, signals have probabilities of being 1 or 0 approaching 0.5, so it is possible to exact both stuck-at faults on the wire. Therefore, the goals of synthesis for low power and random pattern testability are achieved. The hardware overhead sof proposed design method are only one primary input for mode selection and AND/OR gate for each redundant connection.

• Journal of Electrical Engineering and information Science
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• v.3 no.1
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• pp.8-13
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• 1998

Often ESOP(Exclusive Sum of Products) expressions provide more compact representations of logic functions and implemented circuits are known to be highly testable. Motivated by the merits of using XOR(Exclusive-OR) gates in circuit design, ESOP(Exclusive Sum of Products) expressions are considered s the input to the logic synthesis for random pattern testability. The problem of interest in this paper is whether ESOP expressions provide better random testability than corresponding SOP expressions of the given function. Since XOR gates are used to collect product terms of ESOP expression, fault propagation is not affected by any other product terms in the ESOP expression. Therefore the test set for a fault in ESOP expressions becomes larger than that of SOP expressions, thereby providing better random testability. Experimental results show that in many cases, ESOP expressions require much less random patterns compared to SOP expressions.

• Proceedings of the IEEK Conference
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• 2000.07a
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• pp.355-358
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• 2000

In this paper we propose procedures to enhance testability by modifying state transition tables. In these procedures, transitions about undefined states, which are not described in state transition tables but exist in a synthesized gate level circuit, are added to a state transition table. Experimental results for MCNC benchmarks are shown.

• Journal of the Korean Institute of Telematics and Electronics A
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• v.32A no.11
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• pp.94-104
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• 1995

In this paper, we present a new multi-level logic synthesis method for producing the multi-level circuits which can be easily tested by the pseudoexhaustive testing techniques. The method consists of four stages. In the first stage, it generates the minimum variable supports for each output of a multiple-output function. In the second stage, it removes the minimum variable supports which if used to implement the outputs, lead to inefficient pseudoexhaustive test. In the third stage, it determines the minimum variable support and logic (uncomplementary or complementary logic) for each output. In the fourth stage, it performs the multi-level logic synthesis so that each output. In the fourth stage, it performs the multi-level logic synthesis so that each output has the minimum variable support and logic determined in the third stage. To evaluate the performance and quality of the proposed method, we have experimented on the 56 benchmark examples. The results show that for 56 examples, our method obtains better results than MIS in terms of testability. Moreover, the method produces better results for 19 examples and the same results for 12 examples compared with MIS in terms of literal count although it has been developed to improve the testability.

• Journal of the Institute of Electronics Engineers of Korea TE
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• v.39 no.4
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• pp.329-334
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• 2002

For the testability, this paper proposed the algorithm at autonomous synthesis which includes the data path structure as the self testing as possible on high level synthesis method when VHDL, coding is used in the system design area. In the proposed algorithm of this paper, MUXs and registers are assigned to the data path of designed system. And the designed data path could be mapped the H/W specification of described VHDL coding to the testable library. As a results, it was mapped H/W to the assign algorithm that is minimized MUX and the registers in collision graph.

• The Transactions of the Korea Information Processing Society
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• v.3 no.3
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• pp.640-654
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• 1996

This paper presents a synthesis method for multi-level Reed-Muller circuits using BDDs(Binary Decision Diagrams). The existing synthesis tool for Reed circuits, FACTOR, is not appropriate to the synthesis of large circuits because it uses matrix (map-type) to represent given logic functions, resulting in the exponential time and space in number of imput to the circuits. For solving this problems, a syntheisis method based on BDD is presented. Using BDDs, logic functions are represented compactly. Therefor storage spaces and computing time for synthesizing logic functions were greatly decreased, and this technique can be easily applied to large circuits. Using BDD representations, the proposed method extract best patterns to minimize multi-level Reed Muller circuits with good performance in area optimization and testability. Experimental results using the proposed method show better performance than those using previous methods〔2〕. For large circuits of considering the best input partition, synthesis results have been improved.

• Journal of the Korea Institute of Information and Communication Engineering
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• v.16 no.12
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• pp.2731-2740
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• 2012

ASIC(application specific integrated circuit) process is a set of various technologies for fabricating a chip. Generally there have been many researches for RTL design, synthesis, floor plan & routing, low power scheme, clock tree synthesis, and testability which are widely researched in recent. In this paper we propose a new methodology of power strap routing in basis of design experience and experiment. First the power strap for vertical VDD and VSS and horizontal VDD and VSS is routed, and then after the problems which are generated in this process are analyzed, we propose a new process for resolving them. For this, the strap guide is inserted to protect the unnecessary strap routing and dumped for next steps. Next the unnecessary power straps which are generated the first inserting process are removed, and the pre-routing is performed for the macro cells. Finally the resultant power straps are routed using the dumped routing guide. Through the proposed process we identified the efficient and stable route of the power straps.