• Title/Summary/Keyword: short-circuit test

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The study for function and operation of the excitation equipment for short circuit generator (단락발전기 용 여자장치의 조작과 기능에 대한 고찰)

  • Kim, Sun-Koo
    • Proceedings of the KIEE Conference
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    • 2008.07a
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    • pp.735-736
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    • 2008
  • There are many equipments for the Short Circuit Test, for example Short Circuit Generator, Induction Motor, Sequence Timer, CLR, Back Up Breaker, Making Switch and Excitation Equipment etc. Gradually an allowable tolerance of the short circuit test voltage is become smaller by the standards for short circuit test. The excitation equipment of short circuit generator is very important for test voltage is adjusted by the excitation equipment. Especially the excitation equipment must be possessed character of exactitude, durability and inalterability because some times around 10,000 times opening and closing short circuit test is requested by clint, which must be done within one minute. The purpose of this study for function and operation of the excitation equipment which rated DC voltage is 1,000V, rated DC current is 300A, rated out put is 30kW and type is YNEX 97S-441/609, is to help operation of short circuit generator.

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The study of a primary role of Back up Breaker and Making Switch for Short Circuit Test (단락시험에서 후비보호차단기와 투입스위치의 중요 역할)

  • Kim, Sun-Koo;Kim, Seon-Ho;Kim, Won-Man;Roh, Chang-Il;Lee, Dong-Jun;Jung, Heung-Soo
    • Proceedings of the KIEE Conference
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    • 2007.07a
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    • pp.915-916
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    • 2007
  • There are many equipments for the Short Circuit Test, for example Short Circuit Generator, Induction Motor, Sequence Timer, Exciter, CLR, Back Up Breaker, Making Switch and TRV etc. Especially Back up Breaker and Making Switch are very important equipments to test the short circuit test. A role of a Back up Breaker is to break high-voltage and high-current for short circuit test and a Making Switch should be operated always same speed/time and kept electrical-mechanical characteristics to make the voltage and current of short circuit test. This study introduces to the short circuit test also to kinds, principal movements and compare them of Back up Breaker and Making Switch.

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Study on the parameter estimation of short-circuit generator (단락발전기 파라미터 추정에 대한 고찰)

  • Kim, Sun-Ho;Kim, Sun-Koo;Roh, Chang-Il;Kim, Won-Man;Lee, Dong-Jun
    • Proceedings of the KIEE Conference
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    • 2008.07a
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    • pp.866-867
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    • 2008
  • Among many tests to verify the characteristics of power system apparatus, the short circuit test is performed to verify the performance characteristics of the apparatus under the short-circuited power system. The verification of the short-circuit performance is inevitable for the reliability of power system and the safety of the operator around. The short circuit performance test requires the suitable power source and Korea Electrotechnology Research Institute has 4000 MVA, 500 MVA short circuit generators for the short circuit performance test. This paper will study on the parameters of short-circuit generator and the estimation of them.

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The Study of Comparison with ANSI/IEEE and IEC for Short Circuit Test of Transformers (ANSI/IEEE와 IEC 규격(規格)에 따른 변압기(變壓器)의 단락강도시험(短絡强度試驗)의 비교(比較))

  • Kim, Sun-Koo;Kim, Sun-Ho;Kim, Won-Man;La, Dae-Ryeol;Roh, Chang-Il;Lee, Dong-Jun;Jung, Heung-Soo
    • Proceedings of the KIEE Conference
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    • 2006.07b
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    • pp.705-706
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    • 2006
  • Generally Short Circuit Test of transformers are tested according to IEEE std C57.12.00-2000, IEC 60076-5(2000-07), ES148(1998.6.26) or KS C4309(2003). But ES148(1998.6.26) is same as IEEE std C57. 12.00-2000 and KS C4309(2003) is revising coincidence with IEC 60076-5(2000-07). On this study condition of the transformers before short circuit test, calculation method for test current peak value, tolerance on the asymmetrical peak and r.m.s value, short circuit testing procedure, number of short circuit test, duration short circuit test, and detection of faults and evaluation of short circuit test result will be compared with ANSI and IEC.

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Analytical Examination of KERI Synthetic Short-circuit Current Making Test Circuit (KERI 합성투입시험회로의 해석적 고찰)

  • Lee, Yong-Han
    • Proceedings of the KIEE Conference
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    • 2003.07a
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    • pp.455-457
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    • 2003
  • In the present IEC 60427(2000), reduced applied voltage can be used for synthetic short-circuit making current tests if the maximum pre-arcing time of the test circuit breaker is less than $1/{\omega}$. But in the near future IEC, only the making tests with full test voltage shall be allowed. To meet this trend, KERI is preparing synthetic making test facilities using step-up transformer, ITMC and plasma making switch. This paper presents analytical characteristics of KERI's synthetic short-circuit making test circuits. The results of this paper can be useful for effective and adequate tests.

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Short-circuit Protection Circuit Design for SiC MOSFET Using Current Sensing Circuit Based on Rogowski Coil (Rogowski Coil 기반의 전류 센싱 회로를 적용한 SiC MOSFET 단락 보호 회로 설계)

  • Lee, Ju-A;Byun, Jongeun;Ann, Sangjoon;Son, Won-Jin;Lee, Byoung-Kuk
    • The Transactions of the Korean Institute of Power Electronics
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    • v.26 no.3
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    • pp.214-221
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    • 2021
  • SiC MOSFETs require a faster and more reliable short-circuit protection circuit than conventional methods due to narrow short-circuit withstand times. Therefore, this research proposes a short-circuit protection circuit using a current-sensing circuit based on Rogowski coil. The method of designing the current-sensing circuit, which is a component of the proposed circuit, is presented first. The integrator and input/output filter that compose the current-sensing circuit are designed to have a wide bandwidth for accurately measuring short-circuit currents with high di/dt. The precision of the designed sensing circuit is verified on a double pulse test (DPT). In addition, the sensing accuracy according to the bandwidth of the filters and the number of turns of the Rogowski coil is analyzed. Next, the entire short-circuit protection circuit with the current-sensing circuit is designed in consideration of the fast short-circuit shutdown time. To verify the performance of this circuit, a short-circuit test is conducted for two cases of short-circuit conditions that can occur in the half-bridge structure. Finally, the short-circuit shutdown time is measured to confirm the suitability of the proposed protection circuit for the SiC MOSFET short-circuit protection.

Three-phase Making Test Method for Common Type Circuit Breaker

  • Ryu, Jung-Hyeon;Choi, Ike-Sun;Kim, Kern-Joong
    • Journal of Electrical Engineering and Technology
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    • v.7 no.5
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    • pp.778-783
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    • 2012
  • The synthetic short-circuit making test to adequately stress the circuit breaker has been specified as the mandatory test duty in the IEC 62271-100. The purpose of this test is to give the maximum pre-arcing energy during making operation. And this requires the making operation with symmetrical short-circuit current that is established when the breakdown between contact gap occurs near the crest of the applied voltage. Also, if the interrupting chamber of circuit breakers is designed as the type of common enclosure or the operation is made by the gang operated mechanism that three-phase contacts are operated by one common mechanism, three-phase synthetic making test is basically required. Therefore, several testing laboratories have developed and proposed their own test circuits to properly evaluate the breaker performance. With these technical backgrounds, we have developed the new alternative three-phase making circuit.

A Study on Optimization of the Weil-Dobkes Synthetic Short-Circuit Tests (Weil-Dobke 합성단락시험로의 최적화 연구)

  • 김맹현;고희석
    • The Transactions of the Korean Institute of Electrical Engineers A
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    • v.50 no.6
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    • pp.287-292
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    • 2001
  • This paper deals with the configuration, operating principles, systematic calculation method of parameter and optimization method of test circuit for parallel current injection method, series voltage injection method and hybrid synthetic test method as the method for performance test of circuit breaker with extra high interrupting capacity. The test method depicted above is applied to short-circuit making and breaking test (operating sequence :Os CdOs, Od-CdOs) and out-of-phase tests(operating sequence :Os, CdOs) for performance test of the newly-developed 420kV, 50kA and 800kV 50kV puffer-type gas circuit-breaker according to IEC 60056 and IEC 60427. The testing results, evaluation of equivalence for test and analyzed results are also presented in this paper.

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Reignition system for synthetic short-circuit test (합성단락시험용 재점호장치)

  • Park, Seung-Jae;Kim, Maeng-Hyun;Kang, Young-Sig;Shin, Young-June;Koh, Heui-Sek
    • Proceedings of the KIEE Conference
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    • 2000.07c
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    • pp.1856-1858
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    • 2000
  • This paper describes the principles of reignition system which has newly been developed and used as KERI's high power testing facilities. Synthetic short-circuit testing method is generally adopted to perform the short-circuit test of the ultra high-voltage circuit breakers, which consists of two separated sources such as the current source from short-circuit generator and the voltage source from charged energy in capacitor. And, in case of synthetic short-circuit test, it will be necessary to use the reignition system in order to extending the arcing time of the circuit breaker and provide the arc energy equivalent to the direct testing method.

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The Transient Analysis of Instant Short-Circuit Test Equipment For Earth Leakage Circuit Breaker (IEC60947-2에 따른 누전차단기의 순시단락시험 과도현상에 대한 연구)

  • Ryu, Haeng-Soo;Kim, Myeong-Seok;Han, Gyu-Hwan
    • Proceedings of the KIEE Conference
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    • 2003.07a
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    • pp.357-359
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    • 2003
  • This paper is for the transient analysis of instant short-circuit test equipment according to the test of tripping limits and characteristics under IEC 60947-2. The in-rush current is harmful to almost equipments and the exact testing is not made because of it. LGIS has a instant short-circuit test equipment, but it is not suitable for carrying out instant short-circuit test on ELB(Earth Leakage Circuit breaker) by reason of that. Now, I am going to show a solution for that problem. After applying this method, manufacturer is going to acquire the exact testing result according to the IEC standard. Moreover, Testing laboratory will be trusted by clients.

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