Bias stress effect in organic thin-film transistors with cross-linked PVA gate dielectric and its reduction method using $SiO_2$ blocking layer
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- 한국정보디스플레이학회:학술대회논문집
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- 한국정보디스플레이학회 2006년도 6th International Meeting on Information Display
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- pp.445-448
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- 2006