• 한국전자현미경학회:학술대회논문집
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• 한국현미경학회 2004년도 제35차 추계학술대회 및 제2회 HVEM 이용자 워크샵
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• pp.133-135
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• 2004

• Bulletin of the Korean Chemical Society
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• 제29권2호
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• pp.335-338
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• 2008

New efficient red emitter having short p?-conjugation length and asymmetric bulky structure, 2-(7-diphenylamino-benzo[1,2,5]thiadiazole-4-ylmethylene)-malononitrile, was synthesized and characterized. Using this material as a dopant, we fabricated electroluminescence device with a structure of ITO/DNTPD/NPD/BTZA (5 wt% in Alq3)/Alq3/LiF/Al. The device exhibited a high brightness of 761 cd/m2 at a driving voltage of 4.8 V, and current efficiency is 0.75 cd/A. The Commission International de IEclairage (CIE) coordinates of the EL device were found to be (0.62, 0.37) at 10 mA/cm2.

• JSTS:Journal of Semiconductor Technology and Science
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• 제1권1호
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• pp.40-49
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• 2001

We have developed a repeatable process of forming uniform, small-size and high-density self-assembled Si nano-crystals. The Si nano-crystals were fabricated in a conventional LPCVD (low pressure chemical vapor deposition) reactor at $620^{\circ}c$ for 15 sec. The nano-crystals were spherical shaped with about 4.5 nm in diameter and density of $5{\times}l0^{11}/$\textrm{cm}^2$. More uniform dots were fabricated on nitride film than on oxide film. To take advantage of the above-mentioned characteristics of nitride film while keeping the high interface quality between the tunneling dielectrics and the Si substrate, nitride-oxide tunneling dielectrics is proposed in n-channel device. For the first time, the single electron effect at room temperature, which shows a saturation of threshold voltage in a range of gate voltages with a periodicity of ${\Delta}Ｖ_{GS}\;{\approx}\;1.7{\;}V$, corresponding to single and multiple electron storage is reported. The feasibility of p-channel nano-crystal memory with thin oxide in direct tunneling regime is demonstrated. The programming mechanisms of p-channel nano-crystal memory were investigated by charge separation technique. For small gate programming voltage, hole tunneling component from inversion layer is dominant. However, valence band electron tunneling component from the valence band in the nano-crystal becomes dominant for large gate voltage. Finally, the comparison of retention between programmed holes and electrons shows that holes have longer retention time.

• 대한기계학회논문집A
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• 제35권5호
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• pp.479-485
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• 2011

열 전자 방출 형 전자 빔 장치에서 영상을 획득하기 위해서는 텅스텐 필라멘트에서 발생한 전자빔을 스캔 할 장치가 필요하다. 이때, 스캔 되는 주파수에 따라서 시료 표면에서 튀어 나오는 2 차 전자신호에 대하여 잡음 성분의 발생이 다르게 나타난다. 본 연구에서는 잡음 성분 제거를 위한 필터 설계를 위해서 2 차 전자신호에 대한 실시간 주파수 분석을 통해 신호와 잡음 성분을 구분했다. 그리고 부동 소수점 연산이 가능한 DSP 에서 디지털 필터 설계를 통하여 신호대비 잡음 성분 제거를 통하여 고배율로 획득한 전자현미경의 영상의 질을 향상 시켰다.

• Macromolecular Research
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• 제13권5호
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• pp.435-440
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• 2005

This study describes a method where the match of two different length scales, i.e., the patterns from self-assembled block copolymer (<50 nm) and electron beam writing (>50 nm), allow the nanometer scale pattern mask. The method is based on using block copolymers containing a poly(methyl methacrylate) (PMMA) block, which is subject to be decomposed under an electron beam, as a pattern resist for electron beam lithography. Electron beam on self assembled block copolymer thin film selectively etches PMMA microdomains, giving rise to a polymeric nano-pattern mask on which subsequent evaporation of chromium produces the arrays of Cr nanoparticles followed by lifting off the mask. Furthermore, electron beam lithography was performed on the micropatterned block copolymer film fabricated by micro-imprinting, leading to a hierarchical self assembled pattern where a broad range of length scales was effectively assembled, ranging from several tens of nanometers, through submicrons, to a few microns.

• KEPCO Journal on Electric Power and Energy
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• 제1권1호
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• pp.175-180
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• 2015

본 연구에서는 간단한 화학적 합성 방법을 통하여 스테인레스 기판 위에 nano-bud 형태의 수산화 구리 박막을 형성하였다. 그리고 또 다른 합성 방법인 chemical bath deposition을 이용하여 수산화 구리 나노 구조를 간단하고 친환경적으로 형성하였다. 수산화 구리 박막의 구조적 연구는 X-ray diffraction (XRD), X-ray photoelectron spectroscopy (XPS), field emission scanning electron microscopy (FESEM) 방법을 통하여 이루어졌으며 다결정의 nano-bud 형상을 확인할 수 있었다. 또한 나노 구조로 합성된 수산화구리 전극의 전기화학적 측정은 1M KOH의 전해질 조건에서 cyclic voltammetry (CV) and galvanostatic charge-discharge (GCD)에서 측정되었으며 $340Fg^{-1}$의 높은 비 용량을 보였다. 또한 $1mA\;cm^{-2}$ 의 전력 밀도에서 ${\sim}83Wh\;kg^{-1}$의 높은 에너지 밀도와 ${\sim}3.1kW\;kg^{-1}$의 높은 출력 밀도를 가지며 향상된 전극의 성능을 보였다. 이러한 뛰어난 의사 캐패시터의 성능은 수산화 구리의 nano-bud 형상에 의한 효과로 확인할 수 있었다. 본 연구를 통하여 화학적 합성 방법의 확장을 통하여 수산화 구리 전극의 에너지 저장 장치로써의 성능을 확인할 수 있었다.

• 대한전자공학회논문지SD
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• 제41권7호
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• pp.21-29
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• 2004

본 논문에서는 Dual oxide를 갖는 Nano-scale CMOSFET에서 각 소자의 Hot carrier 특성을 분석하여 두 가지 중요한 결과를 나타내었다. 하나는 NMOSFET Thin/Thick인 경우 CHC stress 보다는 DAHC stress에 의한 소자 열화가 지배적이고, Hot electron이 중요하게 영향을 미치고 있는 반면에, PMOSFET에서는 특히 Hot hole에 의한 영향이 주로 나타나고 있다는 것이다. 다른 하나는, Thick MOSFET인 경우 여전히 NMOSFET의 수명이 PMOSFET의 수명에 비해 작지만, Thin MOSFET에서는 오히려 PMOSFET의 수명이 NMOSFET보다 작다는 것이다. 이러한 분석결과는 Charge pumping current 측정을 통해 간접적으로 확인하였다. 따라서 Nano-scale CMOSFET에서의 NMOSFET보다는 PMOSFET에 대한 Hot camel lifetime 감소에 관심을 기울여야 하며, Hot hole에 대한 연구가 진행되어야 한다고 할 수 있다.

• 한국재료학회:학술대회논문집
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• 한국재료학회 2000년도 추계학술발표강연 및 논문개요집
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• pp.62-62
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• 2000

• 한국진공학회:학술대회논문집
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• 한국진공학회 2006년도 제31회 학술논문발표회 초록집
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• pp.175-175
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• 2006

• 한국진공학회:학술대회논문집
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• 한국진공학회 2009년도 제38회 동계학술대회 초록집
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• pp.31-32
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• 2010

In our previous reports [1-3], electron transport for the switching and memory devices using alkyl thiol-tethered Ru-terpyridine complex compounds with metal-insulator-metal crossbar structure has been presented. On the other hand, among organic memory devices, a memory based on the OFET is attractive because of its nondestructive readout and single transistor applications. Several attempts at nonvolatile organic memories involve electrets, which are chargeable dielectrics. However, these devices still do not sufficiently satisfy the criteria demanded in order to compete with other types of memory devices, and the electrets are generally limited to polymer materials. Until now, there is no report on nonvolatile organic electrets using nano-interfaced organic monomer layer as a dielectric material even though the use of organic monomer materials become important for the development of molecularly interfaced memory and logic elements. Furthermore, to increase a retention time for the nonvolatile organic memory device as well as to understand an intrinsic memory property, a molecular design of the organic materials is also getting important issue. In this presentation, we report on the OFET memory device built on a silicon wafer and based on films of pentacene and a SiO2 gate insulator that are separated by organic molecules which act as a gate dielectric. We proposed push-pull organic molecules (PPOM) containing triarylamine asan electron donating group (EDG), thiophene as a spacer, and malononitrile as an electron withdrawing group (EWG). The PPOM were designed to control charge transport by differences of the dihedral angles induced by a steric hindrance effect of side chainswithin the molecules. Therefore, we expect that these PPOM with potential energy barrier can save the charges which are transported to the nano-interface between the semiconductor and organic molecules used as the dielectrics. Finally, we also expect that the charges can be contributed to the memory capacity of the memory OFET device.[4]