한국전자현미경학회:학술대회논문집

Korean Society of Microscopy (한국현미경학회)
권호 표지

Evaluation of manganese distribution in ferromagnetic (Ga,Mn)N semiconductor by convergent electron beam diffraction study

  • Chang, Joon-Yeon (Nano Device Research Center, Korea Institute of Science and Technology) ;
  • Kim, Gyeung-Ho (Nano Material Research Confer, Korea Institute Science and Technology)
  • Published : 2004.11.01
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