• 한국표면공학회지
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• 제36권6호
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• pp.491-499
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• 2003

Copper-based leadframe sheets were oxidized in a hot alkaline solution to form brown-oxide layer on the surface and molded with epoxy molding compound (EMC). The brown-oxide-coated leadframe/EMC joints were machined to form sandwiched double-cantilever beam (SDCB) specimens and sandwiched Brazil-nut (SBN) specimens for the purpose of measuring the fracture toughness of leadframe/EMC interfaces. The SDCB and the SBN specimens were designed to measure the fracture toughness of the leadframe/EMC interfaces under nearly mode-I loading and mixed-mode (mode I ＋ mode II) loading conditions, respectively. Fracture surfaces were analyzed by various equipment such as glancing-angle XRD, SEM, AES, EDS and AFM to elucidate failure path. Results showed that failure occurred irregularly in the SDCB specimens, and oxidation time of 2 minutes divided the types of irregular failures into two classes. The failure in the SBN specimens was quite different from that in the SDCB specimens. The failure path in the SBN specimens was not dependent on the phase angle as well as the distance from tips of pre-cracks.

• 마이크로전자및패키징학회지
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• 제7권2호
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• pp.7-12
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• 2000

Copper-based leadframe sheets were oxidized in a black-oxide forming solution, and molded with epoxy molding compound (EMC) to form sandwiched double-cantilever beam (SDCB) specimens. The adhesion strength of leadframe/EMC interface was measured in terms of fracture toughness by using SDCB specimens and the fracture surfaces were analyzed by various equipments such as glancing-angle XRD, AFM, and SEM. Results showed that three types of failure paths, which were closely related to the surface condition of leadframes before molding.

• 한국재료학회:학술대회논문집
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• 한국재료학회 1995년도 추계 학술발표 강연 및 논문개요집
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• pp.3-3
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• 1995

Plastic IC encapsulation utilizing lead on chip(LOC) die attach technique allows higher device density per unit package area, and faster current speed and easter leadframe design. Nevertheless, since the top surface of the chip is directly attached to the area of the leadframe with a double-sided adhesive tape in the LOC package, it tends to be easily damaged by the leadframe, leading to limitation in its utilization. In this work, it is detailed how the damage of the chip surface occurs, and it is influenced and improved by the LOC construct.

• 한국산업융합학회 논문집
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• 제15권1호
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• pp.37-42
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• 2012

Trends in semiconductor equipment industry are to reduce the cost of producing semiconductor, semiconductor process development, facility development, and the minimum investment in terms of cost and quality. Semiconductor equipments are being considered to review and development is proceeding at the same time. In the first part of the semiconductor assembly process, in which the importance of die bonding process is emerging, a wide leadframe type die bonding machine is demanded for productivity. Die bonding machine was designed through experiments and by trial and error. It costs a lot of time and financial burden. The purpose of this study is to solve these problems by using the CAE tool 3G. By using finite element method, thermal analysis of die bonding machine to the various widths leadframe die bonder machine rail is performed for design.

• 한국전기전자재료학회논문지
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• 제13권12호
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• pp.983-988
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• 2000

The leadframe of thin plate fabricated by stamping method generates a lot of burr and stress in the processing surface because of the mold. The electropolishing equipment was produced in order to increase accuracy and surface roughness for 42%Ni-Fe leadframe. An electrolyte consisted of phosphoric acid, ethylene glycol and deionized water. Experiments were accomplished as polishing conditions were changed such as current density, polishing time, electrode gap and sample shape. The burr from the cutting was eliminated and surface characteristics of high flatness and high luster wre obtained after electropolishing. In addition, the electroplishing had good characteristic in 1.0 A current density and 4㎜ of electrode spaces, and it was affected by the composition of electrolyte and the sample shape.

• Transactions on Electrical and Electronic Materials
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• 제2권3호
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• pp.28-32
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• 2001

It was studied in the present work how the thermal cycling performance of LOC (lead on chip) packages depends on the package construct or leadframe materials. First, package body thickness and Au wire diameter were manipulated for the selection of proper package design. Secondly, two different types of leadframe materials (i.e. copper and 52%Fe-48%Ni alloy) were tested to determine the better material for improved reliability margin of plastically encapsulated microelectronic packages. This work shows that manipulating package body thickness was more effective than an increase of Au wire from 23$\mu\textrm{m}$ to 33$\mu\textrm{m}$ for the prevention of wire debonding failure. Further, this work indicates that the LOC packages including the copper leadframes can be more susceptible to thermal cycling reliability degradation due to chip cracking than those including the alloy leadframes.

• 한국표면공학회지
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• 제33권4호
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• pp.241-250
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• 2000

Popcorn cracking phenomena frequently occur in thin plastic packages during the solder reflow process, which are definitely affected by poor adhesion of Cu-based leadframe to epoxy molding compounds (EMCs). In the present work, in order to enhance the adhesion strength, a brown-oxide treatment on the Cu-based leadframe was carried out and the adhesion strength of leadframe/EMC interface was measured in terms of fracture toughness by using sandwiched double-cantilever beam (SDCB) specimens. After the adhesion tests, fracture surfaces were analyzed by SEM, AES, EDS and AFM to make the failure path clear. Results showed that failure path was closely related to the oxidation time and the interfacial fracture toughness.

• 마이크로전자및패키징학회지
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• 제7권3호
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• pp.45-54
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• 2000

Stamped Leadframe에 전해연마를 적용하여 가공면에 존재하는 버어(burr)의 제거와 그에따른 잔류응력 완화효과를 보았다. 또한 표면 청정화에 따른 은(Ag)도금면 및 리드프레임 표면 품질의 향상이 있었다. 인산 60% 전해연마액에 고정 전류값 5A와 극간거리 3.0 cm의 조건하에 Alloy42 원소재 리드프레임은 $70^{\circ}C$에서 120초간, C194 원소재 리드프레임은 $50^{\circ}C$에서 90초간 전해연마 하였다. XRD 반가폭(FWHM)을 이용한 잔류응력 측정결과 전해 연마 처리후의 잔류응력값이 스탬핑 이전상태로 회복되었으며, AFM를 이용하여 표면 거칠기 측정결과 Alloy42원소재 리드프레임은 0.079 $\mu\textrm{m}$, C-194원소재 리드프레임은 0.014 $\mu\textrm{m}$의 R$_{근}$값으로 거칠기의 향상이 있었다. XRF를 이용한 도금두께 측정 결과 0.4~0.5 $\mu\textrm{m}$ 정도 두께편차 균일성의 향상이 있었으며, wire bonding온도에서의 bake test결과 금선(gold wire) 과의 접합강도를 높일수 있는 적절한 크기로의 결정립 성장이 관찰되었다 3차원 자동측정 및 표면 경도 측정 통하여 전해연마로 인한 리드프레임 중요부위 치수변화의 신뢰성을 확인할수 있었다.다.

• 마이크로전자및패키징학회지
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• 제8권4호
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• pp.67-72
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• 2001

반도체 칩 캡슐화성형시 칩 캐비티에서의 유동을 보다 엄밀하게 모델링하고 해석하기 위한 연구가 이루어졌다. 리드프레임에서의 구멍부위를 통과하는 유동의 모델링을 시도하였고 리드프레임에서의 열 경계조건을 정확하게 취급하였다. 유동의 이론적 해석을 위해 헬레쇼오 모델을 채택하였고 리드프레임에 의해 아래 위로 분리된 각각의 캐비티로 가정하여 해석하였다. 리드프레임에서 구멍부위를 통과하는 유동은 헬레쇼오 모델링시에 질량 소스(source) 항으로 삽입되었다. 유동해석 프로그램과 콤플렉스 방법에 기반을 둔 최적화 프로그램을 연계하여 미성형 방지를 위한 최적 공정조건을 성공적으로 정확하게 얻어낼 수 있었다.

• 한국재료학회지
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• 제14권5호
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• pp.322-327
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• 2004

Copper-based leadframe sheets were oxidized in two kinds of hot alkaline solutions to form brown-oxide or black-oxide layer on the surface. The oxide coated leadframe sheets were molded with epoxy molding compound (EMC). After post mold curing, the oxide-coated EMC-leadframe joints were machined to form sandwiched Brazil-nut (SBN) specimens. The SBN specimens were used to measure the fracture toughness of the EMC/leadframe interfaces under mixed-mode (mode I + mode II) loading conditions. Fracture surfaces were analyzed by various equipment to investigate failure path. The results revealed that the failure paths were strongly dependent on the oxide type. In case of brown oxide, hackle-type failure was observed and failure path lay near the EMC/CuO interface with a little inclining to CuO at all case. On the other hand, in case of black oxide, quite different failure path was observed with respect to the distance from the tip of pre-crack and phase angle. Different failures occurred with oxide type is presumed to be due to the difference in microstructure of the oxides.