• Title/Summary/Keyword: in-circuit test

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A Study on the Steel Anticorrosive Effect of Fiber-Reinforced Cement Composite (FRCC) by using Metal Fibers (금속섬유를 이용한 섬유보강 시멘트 복합재료(FRCC)의 철근 방식 효과)

  • Choi, Hyeong-Gil;Choi, Hee-Sup
    • Journal of the Korea institute for structural maintenance and inspection
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    • v.23 no.4
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    • pp.23-30
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    • 2019
  • Fiber-Reinforced Cement Composite (FRCC) is known to be effective in mechanical effects such as cracking width control as well as steel anticorrosive effect. In this study, we examined about steel anticorrosive effect by using metal fibers including zinc fibers by accelerated corrosion test. Moreover, it was examined for salt penetration, sacrificial anode effect and formation of electric circuit that was significant effect on the steel anticorrosive effect. As a result, Steel anticorrosive effect was confirmed with mixed metal fibers on FRCC. Especially, In the case of zinc fibers with a high sacrificial anode effect, it was confirmed that the suppression of penetration and corrosion resistance were improved.

Built-In Self-Test Circuit Design for 24GHz Automotive Collision Avoidance Radar System-on-Chip (24GHz 차량 추돌 예방 시스템-온-칩용 자체 내부검사회로 설계)

  • Lee, Jae-Hwan;Kim, Sung-Woo;Ryu, Jee-Youl;Noh, Seok-Ho
    • Proceedings of the Korean Institute of Information and Commucation Sciences Conference
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    • 2012.05a
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    • pp.713-715
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    • 2012
  • 본 논문은 24GHz 차량 추돌 예방 레이더 시스템-온-칩을 위한 입력 임피던스, 전압이득 및 잡음지수를 자동으로 측정할 수 있는 새로운 형태의 고주파 자체 내부검사(BIST, Built-In Self-Test) 회로를 제안한다. 이러한 BIST 회로는 TSMC $0.13{\mu}m$ 혼성신호/고주파 CMOS 공정 ($f_T/f_{MAX}$=140/120GHz)으로 설계되어 있다. 알고리즘은 LabVIEW로 구현되어 있다. BIST 알고리즘은 입력 임피던스 정합과 출력 직류 전압 측정원리를 이용한다. 본 논문에서 제안하는 방법은 자동으로 쉽게 고주파 회로의 성능변수를 측정할 수 있기 때문에 시스템-온-칩의 저가 성능 검사의 대안이 될 것으로 기대한다.

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A study on the circuit design for DC characteristic inspection of semiconductor devices (반도체 소자의 DC 특성 검사용 회로설계에 관한 연구)

  • 김준식;이상신;전병준
    • Journal of the Korean Institute of Illuminating and Electrical Installation Engineers
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    • v.18 no.1
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    • pp.105-114
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    • 2004
  • In this paper, we design the circuits for DC parameter test of semiconductor devices. The DC parameter tester is the system which inspects the DC parameters of semiconductor devices. In the designed circuits, voltage(current) forcing current(voltage) sensing methods are used to inspect the parameters. The designed circuits are simulated by OR-CAD. The simulation results have good performance.

A Study on the Development of Abnormal Power Source Generator to Evaluate Electronic Appliances (시험용 이상전원(異狀電源) 발생장치의 개발에 관한 연구)

  • Park, Chan-Won;Rho, Jea-Kwan
    • Journal of Industrial Technology
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    • v.24 no.A
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    • pp.83-90
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    • 2004
  • Generally, electronic appliances are used on the basis of normal power source supply. The power source inevitably includes the abnormal condition, such as, sudden voltage sagging, power interrupt, and induced noises. As the electronic appliances which include micro-controller-based circuits are being increased recently, the controller circuit sometimes malfunctions by the abnormal condition of the power source. This situation causes serious problems such as hitch of electric appliance, fire and medical instrument glitch, which produces serious situations. In this paper, development of power interrupt tester which is highly suitable for an endurance test device under abnormal power source to microprocessor-based circuits is proposed 89C2051 microcontroller is performed to make power interrupt signal, and software controls peripheral hardwares and built-in functions. Experimental results of this study will offer a good application to electronic appliance maker as a test device of hardware and software debugging use.

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PERFORMANCE TEST OF THE KAO CCD IMAGING SYSTEM (천문대 극미광영상장비의 성능 시험)

  • JIN HO;HAN WONYONG;LEE SEOGU;LEE WOO-BAIK
    • Publications of The Korean Astronomical Society
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    • v.13 no.1 s.14
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    • pp.99-109
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    • 1998
  • Korea Astronomy Observatory (KAO) recently developed a new model of CCD imaging system for astronomical purpose. This paper presents system structure and electrical circuit descriptions with the performance of the CCD imaging system. The developed system can handle astronomical image acquisition with additional functions of on-chip binning, sub-image acquisition using a SITe $1024\times1024$ CCD chip. Particularly the controller design of the system allows us great flexibility and versatility with the software system control and it is possible to cope with any format CCDs by any manufactures, in principle. The system performances are derived by mean variance test in our laboratory, which shows that the total system noise 10.5e-(R.M.S), Gain 1.9e-/ ADD, non-linearity $0.37\%$

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Design of a high-precision MOSFET threshold voltage extractor (고정밀 MOSFET 문턱전압 추출회로 설계)

  • 하장용;전석희;박종태;유종근
    • The Journal of Korean Institute of Communications and Information Sciences
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    • v.21 no.12
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    • pp.3246-3255
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    • 1996
  • A threshold voltage extraction scheme which does not need matched replica of the MOSFET under test is proposed. In contrast to alternative methods, the accuracy of the proposed scheme does not depend on the matching of the test transistors. The proposed scheme has been implemented in a matching-free way using a switched-capacitor subtracting ampliier and a dynmic current mirror. Nonideal effects associated with these circuits, such as non-zero offset voltages and finite gains of op-amps, capcitor mismateches, and charge injection of MOS switches, are investigated and compensated. The circuit has been designed using ISRC 1.5.mu.m CMOS process parameters andfabricated at Inter-University semiconductor Research Center, and its performance has been evaluated.

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Evaluation technique for phase displacement of current transformer comparator (전류변성기 비교기의 위상오차 평가 기술)

  • Kim, Yoon-Hyoung;Han, Sang-Gil;Jung, Jae-Kap;Han, Sang-Ok
    • Proceedings of the KIEE Conference
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    • 2008.07a
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    • pp.2032-2033
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    • 2008
  • We have developed an evaluation technique for phase displacement of current transformer (CT) comparator by using the precise standard capacitors and resistors. By applying this technique for equivalent circuit of CT comparator evaluation system, we can obtain the calculated and measured phase displacement in the CT comparator. Thus we can evaluate phase displacement of CT comparator by comparing the calculated and measured phase displacement. The method was applied to CT comparator under test with the phase displacement ranges of $0{\sim}{\pm}7.5$ crad. Finally we have compared the phase displacement of the CT comparator under test theoretically obtained in this method with the specification.

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Performance Test of 200-MW Pulse Transformer for 80-MW Klystron Load (80-MW 클라이스트론 부하용 200-MW 펄스 트랜스포머의 성능시험)

  • Jang, S.D.;Oh, J.S.;Son, Y.G.;Cho, M.H.
    • Proceedings of the KIEE Conference
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    • 1999.07e
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    • pp.2167-2169
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    • 1999
  • A pulse transformer producing pulses with the peak power of 200-MW (400 kV 500 A at load side with $4.4{\mu}s$ flat-top) is required to drive the 80-MW pulsed klystron in the PLS linac. We have designed and manufactured the high power pulse transformer with 1 : 17 turn ratio. Its primary functions are to match the impedance of klystron tube to the modulators, and to provide step-up of the voltage. To obtain a fast rise time of the pulse voltage. Low leakage inductance and low distributed capacitance design is very important. In this paper, we discuss the equivalent circuit analysis of the pulse transformer, and present the full power performance test results of pulse transformer.

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The Development of Decal Panel for Night Vision Imaging System of Aircraft (항공기 야시조명계통 데칼패널 개발)

  • 권종광
    • Journal of the Korea Institute of Military Science and Technology
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    • v.6 no.2
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    • pp.35-44
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    • 2003
  • A Decal Panel is developed for the Night Vision Imaging System of XKO-1 aircraft. The Decal Panel is a kind of lighting system kits and is installed on each system switch box in crewstation. The Decal Panel consists of upper panel made of polycarbonate and lower panel which is a printed circuit board. This paper includes the design, manufacture, test and evaluation of Decal Panel in addition to items and conditions of environmental test. Besides it is confirmed the Key for manufacturing a decal panel, is depth of paint, dry time period and frequency, and diffusion material for spreading of light.

A Simple Random Signal Generator Employing Current Mode Switched Capacitor Circuit

  • Yamakawa, Takeshi;Suetake, Noriaki;Miki, Tsutomu;Uchino, Eiji;Eguchi, Akihiro
    • Proceedings of the Korean Institute of Intelligent Systems Conference
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    • 1993.06a
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    • pp.865-868
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    • 1993
  • This paper describes a simple random signal generator employing by CMOS analog technology in current mode. The system is a nonlinear dynamical system described by a difference equation, such as x(t+1) = f(x(t)) , t = 0,1,2, ... , where f($.$) is a nonlinear function of x(f). The tent map is used as a nonlinear function to produce the random signals with the uniform distribution. The prototype is implemented by using transistor array devices fabricated in a mass product line. It can be easily realized on a chip. Uniform randomness of the signal is examined by the serial correlation test and the $\chi$2 test.

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