• Journal of Korean Society of Industrial and Systems Engineering
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• v.23 no.57
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• pp.123-129
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• 2000

The Bootstrap method proposed by Efron is non-parametric method which doesn't depend on the estimation of prior distribution refer to population. A typical statistical process control chart which is generally used is developed under the assumption that observations follow mutually independent and identically distributed within a sample and between samples. However, autocorrelation greatly affect the developed control chart under the assumption that observations are mutually independent. Many researchers showed that the result which was analyzed by using a typical control chart for the observations which has the correlation violated to the independence assumption can not be true. Therefore, we compared the standard method with bootstrap method and then evaluated them for x control chart and EWMA control chart by using bootstrap method which was proposed by Efron in the AR(1) model when the observations have correlation.

• Journal of Korean Society of Industrial and Systems Engineering
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• v.27 no.2
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• pp.114-122
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• 2004

In statistical process control applications, variable sample size (VSS) $\bar{X}$ chart is often used to detect the assignable cause quickly. However, it is usually assumed that only one assignable cause results in the out-of-control in the process. In this paper, we propose the algorithm to minimize the function of cost per unit time and compare the economic design and the statistical design by use of the value of cost per unit time. We consider double assignable causes to occur with compound in the process and adopt the Markov chain approach to investigate the statistical properties of VSS $\bar{X}$ chart. A procedure that can calculate the control chart's parameters is proposed by the economic design.

• Journal of Korean Society of Industrial and Systems Engineering
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• v.27 no.3
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• pp.14-20
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• 2004

The coefficient of variation(CV) which is a relatively dimensionless measure of variability is widely used to describe the variation of sample data. However, the properties of CV distribution are little available and few research has been done on estimation and interpretation of CV. In this paper, we give an outline of statistical properties of coefficient of variation and design of control chart based on this statistic. Construction procedures of control chart are presented. The proposed control chart is an efficient method to monitor a process variation for short production run situation. Futhermore, we evaluated the performance of CV control chart by average run length(ARL).

• Journal of Korean Society for Quality Management
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• v.40 no.3
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• pp.337-346
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• 2012

Purpose: A Control chart is one of the important statistical process control tools that can improve processes by reducing variability and defects. Methods: In the present study, we propose the local $T^2$ multivariate control chart that can efficiently detect abnormal observations by considering the local pattern of the in-control observations. Results: A simulation study has been conducted to examine the property of the proposed control chart and compare it with existing multivariate control charts. Conclusion: The results demonstrate the usefulness and effectiveness of the proposed control chart.

• International Journal of Quality Innovation
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• v.2 no.1
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• pp.69-86
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• 2001

The economic design of control charts has been researched for over four decades since Duncan proposed the concept in 1956. Few studies, however, have focused attention on the economic design of a moving average (MA) control chart. An MA control chart is more effective than the Shewhart chart in detecting small process shifts [9]. This paper provides an economic model for determining the optimal parameters of an MA control chart with multiple assignable causes and two failures in the production process. These parameters consist of the sample size, the spread of the control limit and the sampling interval. A numerical example is shown and the sensitivity analysis shows that the magnitude of shift, rate of occurrence of assignable causes and increasing cost when the process is out of control have a more significant effect on the loss cost, meaning that one should more carefully estimate these values when conducting an economic analysis.

• Journal of Korean Society for Quality Management
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• v.38 no.2
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• pp.190-201
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• 2010

This research proposes a method for designing VSI (Variable Sampling Interval) control charts with supplementary run rules. The basic idea is to apply various run rules and the VSI scheme to a control chart in order to increase the sensitivity. The sampling process of the VSI run rules chart is constructed by Markov chain approach. A procedure for designing the VSI run rules chart is proposed based on Lorenzen and Vance's model. Sensitivity study shows that the VSI run rules charts outperform the FSI (Fixed Sampling Interval) run rules charts for wide range of process mean shifts. A major advantage of the VSI run rules chart over other charts such as CUSUM, EWMA, and adaptive charts is it's simplicity in implementation. Some useful guidelines are proposed based on the sensitivity study.

• Journal of Korean Society of Industrial and Systems Engineering
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• v.21 no.47
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• pp.211-218
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• 1998

In start-up process control applications it may be necessary to limit the sample size to one measurement. A control chart for individual measurements is used whenever it is desirable to examine each individual value from the process immediately. A possible option would be to use an exponential weighted moving(EWM), using modifying statistics with individual measurement, chart for monitoring the process center, and using a moving range (MR) chart for monitoring process variability. In this paper it is shown that there is scheme in using the EWM procedure based on average run length. An expression for the ARL is given in terms of an integral equation, approximated using numerical quadrature. In this case, where it is reasonable to assume normality and negligible autocorrelation in the observations, provide graphs that simplify the design of EWM-MR chart and taking method of exponential smoothing constant(λ) and constant(K) are suggested. The charts suggested above evaluate using the conditional probability.

• Journal of the Korea Institute of Information and Communication Engineering
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• v.8 no.1
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• pp.200-212
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• 2004

Electronic Navigational Chart is a sophisticated digital chart which contains navigational information such as coastline, depth of water, and nautical mark. It contains high levels of textual, spatial and graphical data, and rapidly replaces traditional paper charts. Although Electronic Navigational Chart has been successfully applied to the navigation of ships, the specific data format, S-57, requires some specialized systems. Furthermore its usage may be limited to specific domains and experts with restrictions. To overcome these limitations resulting from the specific data format, S-57, of Electronic Navigational Chart, more general data format such as XML will be preferred. If Electronic Navigational Chart is transformed into the form of XML, it can be easily accessed and exchanged on the internet. Therefore it may be used for more users and applications. In this paper, we propose an XML. Schema to equivalently represent XML for the S-57 format of Electronic Navigational Chart and develop a program translating the S-57 Electronic Navigational chart to XML document according to the proposed XML schema.

• Proceedings of the Korean Geotechical Society Conference
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• 2006.10a
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• pp.509-514
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• 2006

Considering the risk management, there are many examples and various studies for the corporation risk. However, I have never seen the project risk management that applied a construction site for practical approach. Therefore, I have developed a chart (I-Chart) for the project risk management, and also built a model (I-Chart scenario analysis) that I could use. I applied this model to container yard reclaimed land in harbor construction with approaching of geotechnical engineering.

• Journal of the Korean Data and Information Science Society
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• v.18 no.3
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• pp.773-782
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• 2007

The statistical process control charts are very extensively used for monitoring of process mean, deviation, defect rate or reject rate. In this paper we consider a control chart to monitor the process reject rate in the high yield process, which is based on the observed cumulative probability of the number of items inspected until r defective items are observed. We first propose selection of the optimal value of r in the CPC-r charts, and also consider the usefulness of the chart in high yield process such as semiconductor or TFT-LCD manufacturing process.