• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2003.07a
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• pp.485-488
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• 2003

Radiation degradation of Poly(ether ether ketone) (PEEK) has been studied by dielectric analysis and dynamic mechanical analysis. It has been observed that dielectric properties are influenced by radiation degradation of PEEK. For radiation degradation of PEEK, dynamic mechanical properties were insensible.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.40 no.10
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• pp.32-38
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• 2003

This works reports the measurement and analysis results on the hot electron induced device degradation in Gate-All-Around SOI MOSFET's, which were fabricated using commercially available SIMOX material. It is observed that the worst-case condition of the device degradation in nMOSFETs is $V_{GS}$ = $V_{TH}$ due to the higher impact ionization rate when the parasitic bipolar transistor action is activated. It is confirmed that the device degradation is caused by the interface state generation from the extracted degradation rate and the dynamic transconductance measurement. The drain current degradation with the stress gate voltages shows that the device degradation of pMOSFETs is dominantly governed by the trapping of hot electrons, which are generated in drain avalanche hot carrier phenomena.r phenomena.

• Journal of Soil and Groundwater Environment
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• v.20 no.6
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• pp.95-102
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• 2015

The purpose of this study is to compare the degradation characteristics by subcritical water of RDX contaminated soil using batch mode and dynamic mode devices. First, upon application of RDX contaminated soil, RDX treatment efficiency was increased with increasing the temperature in both modes. At 150℃, the treatment efficiency was 99.9%. RDX degradation efficiency got higher with lower ratio of solid to liquid. However, the treatment efficiency in the dynamic mode tended to be decreased at a certain ratio of solid to liquid or lower. The treatment efficiency was increased when it took longer time for the reactions in both modes. As the results of analysis on concentration of treated water after subcritical water degradation, the RDX recovery rate of dynamic and batch modes at 150℃ was 10.5% and 1.5%, respectively. However, both modes showed very similar recovery rates at 175℃ or higher. RDX degradation products were analyzed in treated water after it was treated with subcritical water. According to the results, RDX degradation mechanism was mostly oxidation reaction and reduction reaction was partially involved. Therefore, it suggested that most of RDX in soil was degraded by oxidation of subcritical water upon extraction. According to this result, it was found that both batch and dynamic modes were very effectively applied in the treatment of explosive contaminated soil.

• Proceedings of the Computational Structural Engineering Institute Conference
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• 2004.10a
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• pp.288-295
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• 2004

Concentrically braced steel frames are considered as being quite pone to soft-story response due to the degradation in brace compressive resistance after buckling under severe ground motions. When combined with the system P-Delta effects, collapse of the concentrically brsced frames by dynamic instability becomes highly probable. In this stidy, a new, relatively simple dynamic instability coefficient was proposed for diagonally braced steel flames by explicitly considering the strength degradation of the brace after buckling. Nonlinear dynamic analysis results showed that the dynamic instability coefficient proposed in this study predicted collapse limit state more consistently than the conventional one which ignores the strength degradation of the brace.

• Journal of the Korean Applied Science and Technology
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• v.24 no.3
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• pp.278-286
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• 2007

As a part of enhancing the performance of wood-plastic composites (WPC), polypropylene (PP)/ nanoclay (NC)/ wood flour (WF) nanocomposites were prepared using melt blending and injection molding process to evaluate their thermal stability. Thermogravimetric analysis (TGA) was employed to investigate thermal degradation kinetics of the nanocomposites both dynamic and isothermal conditions. Dynamic scans of the TGA showed an increased thermal stability of the nanocomposites at moderate wood flour concentrations (up to 20 phr, percentage based on hundred percent resin) while it decreased with the addition of 30 phr wood flour. The activation energy $(E_a)$ of thermal degradation of nanocomposites increased when nanoclay was added and the concentration of wood flour increased. Different equations were used to evaluate isothermal degradation kinetics using the rate of thermal degradation of the composites, expressed as weight loss (%) from their isothermal TGA curves. Degradation occurred at faster rate in the initial stages of about 60 min., and then proceeded in a gradual manner. However, nanocomposites with wood flour of 30 phr heated at $300^{\circ}C$ showed a drastic difference in their degradation behavior, and reached almost a complete decomposition after 40 min. of the isothermal heating. The degree of decomposition was greater at higher temperatures, and the residual weight of isothermal degradation of nanocomposites greatly varied from about 10 to 90%, depending on isothermal temperatures. The isothermal degradation of nanocomposites also increased their thermal stability with the addition of 1 phr nanoclay and of wood flour up to 20 phr. But, the degradation of PP100/NC1/MAPP3/WF30 nanocomposites with 30 phr wood flour occurs at a faster rate compared to those of the others, indicating a decrease in their thermal stability.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.42 no.2 s.332
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• pp.9-14
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• 2005

This paper reports the hot carrier induced RF performance degradation of bulk dynamic threshold voltage MOSFET (B-DTMOS) compared with bulk MOSFET (B-MOS). In the normal and moderate mode operations, the degradations of cut-off frequency $(f_{T})$ and minimum noise figure $(F_{min})$ of B-DTMOS are less significant than those of B-MOS devices. Our experimental results show that the RF performance degradation is more significant than the U performance degradation after hot carrier stressing. Also, the degradation characteristics of RF power Performance of B-DTMOS due to hot carrier effects are measured for the first time.

• Polymer(Korea)
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• v.29 no.5
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• pp.508-517
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• 2005

The thermal degradation behavior and reliability analysis were investigated using dynamic thermogravimetric analysis (TGA) and accelerated degradation test (ADT) to characterize the dynamic parameters related to thermal degradation of plastic meterials for household electric appliances. In addition, the weathering of the plastic were performed by ADT using Xenon uc, and the color difference of the samples after ADT were measured with Color Eye 3010 specoophotometer. he activation energy for thermal degradation of the samples increased with increasing the rate of weight loss. The Kim-Park method was found to be more effective analysis in describing thermal degradation of plastic meterials. Plastic materials were very sensitive to ultra-violet rays in faster degradation.

• Nuclear Engineering and Technology
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• v.54 no.11
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• pp.4111-4124
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• 2022

The control rod drive system is critical to the reactor's reliable operation. The performance of its control system and mechanical system will gradually deteriorate because of operational and environmental stresses, thus increasing the reactor's operational risk. Currently there are few researches on the aging-related degradation of the entire control rod drive system. Because it is difficult to quantify the effect of various environmental stresses and establish an accurate physical model when multiple mechanisms superimposed in the degradation process. Therefore, this paper investigates the aging-related degradation of a control rod drive system by integrating Dynamic Object-Oriented Bayesian Network and Hidden Markov Model. Uncertainties in the degradation of the control system and mechanical system are addressed by using fuzzy theory and the Hidden Markov Model respectively. A system which consists of eight control rod drive mechanisms divided into two groups is used to demonstrate the method. The aging-related degradation of the control rod drive system is analyzed by the Bayesian inference algorithm based on the accelerated life test data, and the impact of different operating schemes on the system performance is also investigated. Meanwhile, the components or units that have major impact on the system's performance are identified at different operational phases. Finally, several essential safety measures are suggested to mitigate the risk caused by the system degradation.

• IEMEK Journal of Embedded Systems and Applications
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• v.3 no.3
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• pp.158-166
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• 2008

These days, mobile embedded systems adopt flash memory capable of XIP feature since they can reduce memory usage, power consumption, and software load time. XIP provides direct access to ROM and flash memory for processors. However, using XIP incurs unnecessary degradation of applications' performance because direct access to ROM and flash memory shows more delay than that to main memory. In this paper, we propose a memory management framework, dynamic XIP, which can resolve the performance degradation of using XIP. Using a constrained RAM cache, dynamic XIP can dynamically change XIP region according to page access pattern to reduce performance degradation in execution time or energy consumption resulting from native XIP problem. The proposed framework consists of a page profiler gathering applications' memory access pattern using PMU and an XIP manager deciding that a page is accessed whether in main memory or in flash memory. The proposed framework is implemented and evaluated in Linux kernel. Our evaluation shows that our framework can reduce execution time at most 25% and energy consumption at most 22% compared with using XIP-only case adopted in general mobile embedded systems. Moreover, the evaluation shows that in execution time and energy consumption, our modified LRU algorithm with code page filters can reduce more than at most 90% and 80% respectively compared with applying just existing LRU algorithm to dynamic XIP.

• Proceedings of the Earthquake Engineering Society of Korea Conference
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• 2005.03a
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• pp.129-136
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• 2005

Concentrically braced steel frames are considered as being quite prone to soft-story response due to the degradation in brace compressive resistance after buckling under severe ground motions. When combined with the system P-Delta effects, collapse of the concentrically braced frames by dynamic instability becomes a highly probable. In this study, a new, relatively simple dynamic instability coefficient was proposed for diagonally braced steel frames by considering the strength degradation of the brace after buckling. Nonlinear dynamic analysis was conducted to check the robustness of the proposed index based on simulated ground motions. The analysis results showed that the dynamic instability index proposed predicts the collapse potential more consistently than the conventional one. Dynamic instability was triggered when the index value was close to 0.7.