• Journal of Surface Science and Engineering
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• v.49 no.2
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• pp.111-118
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• 2016

A method to quantitatively analyze the defects formed by the hydrogen evolution during electroplating was suggested based on the theoretical approach of the small angle neutron scattering technique. In case of trivalent chrome layers, an isolated defect size due to the hydrogen evolution was about 40 nm. Direct and pulse plating conditions gave the average defect size of about 4.9 and $4.5{\mu}m$ with rod or calabash shape, respectively. Current density change of the pulse plating from $1.5A/dm^2$ to $2.0A/dm^2$ enlarged the average defect size from 3.3 to $7.8{\mu}m$. The defect morphology like rod or calabash was originated by inter-connecting the isolated defects. Small angle neutron scattering was useful to quantitatively evaluate defect morphology of the deposit.

• Journal of Periodontal and Implant Science
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• v.38 no.sup2
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• pp.385-394
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• 2008

Purpose: The aim of this study was to evaluate the factors affecting healing patterns of surgically created circumferential gap defects around implants in dogs. Materials and Methods: In four mongrel dogs, all mandibular premolars were extracted. After 8 weeks of healing periods, implants were submerged. According to the surface treatment, turned surface was designated as a group A and rough surface as a group B. In each dog, surgical defects on the left side were made with a customized tapered step drill and on the right with a customized paralleled drill. Groups were also divided according to the width of the coronal gaps: 1.0mm, 1.5mm, or 2.0mm. The dogs were sacrificed following 8 weeks and the specimens were analyzed histologically and histomorphometrically. Results: During the postoperative period, healing was uneventful and implants were well-maintained. As the size of the coronal gap was increased, the amount of bone-to-implant contact was decreased. The bone healing was greater in rough surface implants compared to the turned ones. About the defect morphology, tapered shape showed much bone healing and direct bone to implant contact even in the smooth surface implants. Conclusion: Healing of the circumferential defect around dental implant is influenced by the implant surface, defect width and the morphology of the defect. When using rough surface implants, circumferential gap defects within 2 mm do not need any kinds of regenerative procedures and the healing appeared to be faster in the tapered defect morphology than the paralleled one.

• The Transactions of the Korea Information Processing Society
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• v.7 no.6
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• pp.1973-1979
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• 2000

Driving the need for machine vision system is growing consumer demand for quality and defect-free products. Especially it is the most important in tarpaulin's manufacturing process achieves automatically by machine vision instead of by man vision. In this paper pinholes detection is performed by using morphology algorithms. Top hat transform is one of morphology applications. This transform take high performance of defect detection in the case that unexpected changes occur in some non-uniform background. For pinholes defect, automatic visual inspection system has been developed, which was composed by a line-scan camera, illumination, a frame grabber, a motor driver and control units. This system has excellent capacity to defect pinholes to the 0.1 mm by 0.5 mm in size and to work in moving objects by maximum 20 m/min in speed.

• Journal of the Korean Institute of Telematics and Electronics B
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• v.33B no.4
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• pp.141-147
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• 1996

In this paper an improved morphological algorithm for directional defect detection is proposed, where the defect is parallel to the texture image. The algorithm is based on obtaining the background image while removing the defect by comparing every directional morphological result with max or min except that of defect. The defect can of defect and the background image. For a computer simulation, it is shown that the proposed method has better performance than the conventional algorithm.

• Proceedings of the IEEK Conference
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• 1999.11a
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• pp.637-640
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• 1999

In this Paper we show the LCD simulator for defect inspection using image processing algorithm and neural network. The defect inspection algorithm of the LCD consists of preprocessing, feature extraction and defect classification. Preprocess removes noise from LCD image, using morphology operator and neural network is used for the defect classification. Sample images with scratch, pinhole, and spot from real LCD color filter image are used. The proposed algorithms show that defect detected and classified in the ratio of 92.3% and 94.6 respectively.

• Journal of the Korean Ceramic Society
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• v.26 no.5
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• pp.661-669
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• 1989

The defect structure in LiNbO3 single crystals grown by Czochralski method from the congruently melting composition were investigated. Chemical etching patterns were studied in x-plane, z-plane, and major cleavage plane, respectively, dislocation density was higher at the periphery of crystals than at the center because the thermal stress due to radial temperature gradient had a main effect on it, as compared with dislocations formed from the solid-liquid interface. Many dislocation lineages were arranged along several directions.

• Clinical and Experimental Pediatrics
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• v.57 no.7
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• pp.297-303
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• 2014

Transcatheter closure of atrial septal defects has become a popular procedure. The availability of a preprocedural imaging study is crucial for a safe and successful closure. Both the anatomy and morphology of the defect should be precisely evaluated before the procedure. Three-dimensional (3D) echocardiography and cardiac computed tomography are helpful for understanding the morphology of a defect, which is important because different defect morphologies could variously impact the results. During the procedure, real-time 3D echocardiography can be used to guide an accurate closure. The safety and efficiency of transcatheter closures of atrial septal defects could be improved through the use of detailed imaging studies.

• Transactions on Electrical and Electronic Materials
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• v.5 no.4
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• pp.143-147
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• 2004

Surface defects and bulk defects on SOI wafers are studied. Two new metrologies have been proposed to characterize surface and bulk defects in epitaxial layer transfer (ELTRAN) wafers. They included the following: i) laser scattering particle counter and coordinated atomic force microscopy (AFM) and Cu-decoration for defect isolation and ii) cross-sectional transmission electron microscope (TEM) foil preparation using focused ion beam (FIB) and TEM investigation for defect morphology observation. The size of defect is 7.29 urn by AFM analysis, the density of defect is 0.36 /cm$^2$ at as-direct surface oxide defect (DSOD), 2.52 /cm$^2$ at ox-DSOD. A hole was formed locally without either the silicon or the buried oxide layer (Square Defect) in surface defect. Most of surface defects in ELTRAN wafers originate from particle on the porous silicon.

• 전자공학회논문지 IE
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• v.48 no.4
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• pp.1-6
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• 2011

In this paper we show the LCD simulator for defect inspection using image processing algorithm and neural network. The defect inspection algorithm of the LCD consists of preprocessing, feature extraction and defect classification. Preprocess removes noise from LCD image, using morphology operator and neural network is used for the defect classification. Sample images with scratch, pinhole, and spot from real LCD color filter image are used. From some experiments results, the proposed algorithms show that defect detected and classified in the ratio of 92.3% and 94.5 respectively. Accordingly, in this paper, a possibility of practical implementation of the LCD defect inspection system is finally suggested.

• 전자공학회논문지 IE
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• v.48 no.2
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• pp.26-31
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• 2011

In this paper we show the LCD simulator for defect inspection using image processing algorithm and neural network. The defect inspection algorithm of the LCD consists of preprocessing, feature extraction and defect classification. Preprocess removes noise from LCD image, using morphology operator and neural network is used for the defect classification. Sample images with scratch, pinhole, and spot from real LCD color filter image are used. From some experiments results, the proposed algorithms show that defect detected and classified in the ratio of 92.3% and 94.5 respectively. Accordingly, in this paper, a possibility of practical implementation of the LCD defect inspection system is finally suggested.