Proceedings of the IEEK Conference (대한전자공학회:학술대회논문집)
- 1999.11a
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- Pages.637-640
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- 1999
A Study on the Implementation of LCD Defect Inspection Algorithm
LCD 결함검사 알고리즘에 관한 연구
Abstract
In this Paper we show the LCD simulator for defect inspection using image processing algorithm and neural network. The defect inspection algorithm of the LCD consists of preprocessing, feature extraction and defect classification. Preprocess removes noise from LCD image, using morphology operator and neural network is used for the defect classification. Sample images with scratch, pinhole, and spot from real LCD color filter image are used. The proposed algorithms show that defect detected and classified in the ratio of 92.3% and 94.6 respectively.
Keywords