• 전기학회논문지
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• 제58권1호
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• pp.199-202
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• 2009

Scan design is currently the most widely used structured Design For Testability approach. In scan design, all storage elements are replaced with scan cells, which are then configured as one or more shift registers(also called scan chains) during the shift operation. As a result, all inputs to the combinational logic, including those driven by scan cells, can be controlled and all outputs from the combinational logic, including those driving scan cells, can be observed. The scan inserted design, called scan design, is operated in three modes: normal mode, shift mode, and capture mode. Circuit operations with associated clock cycles conducted in these three modes are referred to as normal operation, shift operation, and capture operation, respectively. In spite of these, scan design methodology has defects. They are power dissipation problem and test time during test application. We propose a new methodology about scan shift clock operation and present low power scan design and short test time.

• 전자공학회논문지
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• 제54권1호
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• pp.41-45
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• 2017

본 논문에서는 조합논리스템의 효율적인 다중출력스위칭함수 구성의 한 가지 방법을 제안하였다. 제안한 방법의 시간영역기반의 멀티플렉싱을 기반으로 공통다중종단노드확장논리결정도를 도출하여 최종 조합논리시스템의 다중출력스위칭함수를 구하므로 기존의 시간영역기반의 멀티플렉싱에 비해 최적화된 입력변수의 쌍과 출력변수 쌍을 상당히 줄일 수 있으며, 또한 코스트 면에서도 유리하다. 또한, 입출력단자 수의 감소, 회로구성의 간략화, 연산속도의 향상 등의 이점이 있으며 기존의 방법에 비해 좀 더 정규성과 확장성이 용이하다.

• 대한전자공학회:학술대회논문집
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• 대한전자공학회 2002년도 ITC-CSCC -1
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• pp.220-223
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• 2002

The digital logic systems(DLS) is classified into digital combinational logic systems(CDLS) and digital sequential logic systems(SDLS). This paper presents a method of constructing the digital sequential logic systems without feedback. Firstly we assign all elements in Finite Fields to P-valued digit codes using mathematical properties of Finine Fields. Also, we discuss the operarional properties of the building block T-gate that is used to realizing digital sequential logic systems over Finite Fields. Then we realize the digital sequential logic systems without feedback. This digital sequential logic systems without feedback is constructed ny following steps. Firstly, we assign the states in the state-transition diagram to state P-valued digit dodo, then we obtain the state function and predecessor table that is explaining the relationship between present state and previous states. Next, we obtained the next-state function and predecessor table. Finally, we realize the circuit using T-gate and decoder.

• 대한전자공학회논문지
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• 제26권11호
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• pp.1839-1849
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• 1989

An optimal variable assignment algorithm is presented as a decomposition method of MVL functions. A given 3-valued combinational logic function is disintegrated into subfunction composed of the function dependant relation, then extracted implicant output elements from subfunctions are assigned to a T-gates. As a circuit implementation tool, a programmable integarated T-gate module is proposed, and the construction procedure of combinational MVL functions is systematized in each step. This method is expected to give properties of the systematic procedure, possibility of T-gate number reduction, unification of module, and flexibility of module composition. Specially variable decomposition method can be pointed out as an approach to solving the limitation problem of the input and output terminal number in VLSI implementations.

• 대한전기학회논문지
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• 제33권2호
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• pp.47-55
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• 1984

This paper is concerned with a computer-aided state assignment, that is, coding race-free internal states of asynchronous sequential circuits, and a method for minimizing the combinational network of asynchronous sequential circuits. The FORTRAN version of the peoposed algorithm results in race-free state assignments and reduction of the number of connections and gates with near minimal hardware cost. Some examples are designed by the proposed computer program to illustrate the algorithm in this paper. Finally, results are compared with those of the other methods.

• 전자공학회논문지A
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• 제33A권10호
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• pp.177-185
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• 1996

This paper describes several algorithms for technolgoy mapping of logic functions into interesting and popular FPGAs that use look-up table memories. In order to improved the technology mapping for FPGA, some existing multi-level logic synthesis, decomposition reduction and packing techniques are analyzed and compared. And then new algorithms such as merging fanin, unified reduction and multiple disjoint decomposition which are used for combinational logic design, are proposed. The cost function is used to minimize the number of CLBs and edges of the network. The cost is a linear combination of each weight that is given by user. Finally we compare our new algorithm with previous logic design technique. In an experimental comparison our algorithm requires 10% fewer CLB and nets than SIS-pga.

• 한국통신학회논문지
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• 제22권8호
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• pp.1613-1621
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• 1997

Many studies on internal data expression to process logic functions efficiently on computer have been doing actively. In this paper, we propose an efficient logic function manipulation system made on the Objected-Oriented manner, where Binary Decision Diagrams(BDD's) are adopted for internal data espressionof logic functions. Thus it is easy to make BDD's presenting combinational problems. Also, we propose a method of applying filtering function for reducing the size of BDD's instead of attributed bits, and add it to the mainpultion system. As a resutls, the space of address is expanded so that the number of node that can be used in the mainpulation system is increased up to 2/sup 27/. Finally, we apply the implemented system to One-Shot state assignment problems of asynchronous sequential circuits and show that it is efficient for the filtering method to reduce the size of BDD's.

• Journal of Electrical Engineering and Technology
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• 제4권4호
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• pp.559-565
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• 2009

Power dissipation during scan testing is becoming an important concern as design sizes and gate densities increase. The high switching activity of combinational circuits is an unnecessary operation in scan shift mode. In this paper, we present a novel architecture to reduce test power dissipation in combinational logic by blocking signal transitions at the logic inputs during scan shifting. We propose a unique architecture that uses dmuxed scan flip-flop (DSF) and transmission gate as an alternative to muxed scan flip-flop. The proposed method does not have problems with auto test pattern generation (ATPG) techniques such as test application time and computational complexity. Moreover, our elegant method improves performance degradation and large overhead in terms of area with blocking logic techniques. Experimental results on ITC99 benchmarks show that the proposed architecture can achieve an average improvement of 30.31% in switching activity compared to conventional scan methods. Additionally, the results of simulation with DSF indicate that the powerdelay product (PDP) and area overhead are improved by 28.9% and 15.6%, respectively, compared to existing blocking logic method.

• 전자공학회논문지C
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• 제36C권10호
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• pp.29-38
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• 1999

본 논문은 조합 논리회로에서의 시험 불가능한 결함(untestable faults)을 확인하는 새로운 알고리즘 RICP(Redundancy Identification using Critical-pair Paths)를 제시한다. 조합 논리회로에서의 시험 불가능 결합은 회로의 과잉(redundancy)에 의해서 발생한다. 회로의 과잉은 팬 아웃 스템(fanout stem)과 재결집 게이트(reconvergent gate)의 영역을 분석함으로서 찾을 수 있다. 시험 불가능한 결함들은 임계 경로의 확장된 개념인 임계-쌍 경로를 이용하여 스템 영역을 분석함으로써 확인되어진다. RICP 알고리즘이 FIRE(Fault Independent REdundancy identification) 알고리즘보다 효율적이라는 것을 보여준다. ISCAS85 벤치마크 테스트 회로에 대한 두 알고리즘의 실험 결과를 비교하였다

• 전자공학회논문지B
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• 제30B권5호
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• pp.82-89
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• 1993

In this paper, we proposed the autonomous algorithm of pseudo-exhaustive testing for the multi-level combinational logic circuits. For the processing of shared-circuit that existed in each cone-circuit when it backtracked the path from PO to PI of CUT at the conventional verification testing, the dependent relation of PI-P0 is presented by a dependence matrix so it easily partitioned the sub-circuits for the pseudo-exhaustive testing. The test pattern of sub-circuit's C-inputs is generated using a binary counter and the test pattern of I-inputs is synthesized using a singular cover and consistency operation. Thus, according to the test patterns presented with the recipe cube, the number of test pattrens are reduced and it is possible to test concurrently each other subcircuits. The proposed algorithm treated CUT's net-list to the source file and was batch processed from the sub-circuit partitioning to the test pattern generation. It is shown that the range of reduced ration of generated pseudo-exhaustive test pattern exhibits from 85.4% to 95.8% when the average PI-dependency of ISACS bench mark circuits is 69.4%.