• Proceedings of the Korean Institute of Surface Engineering Conference
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• 2008.11a
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• pp.81-82
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• 2008

하이브리드 코팅 시스템을 이용하여 $CrMoC_xN_{1-x}$ 박막을 AISI D2와 실리콘 웨이퍼 모재 위에 증착하였다. 박막 내 탄소 함량은 $CH_4/(CH_4+N_2)$ 가스 유량 증가에 비례하여 증가했다. 탄소 함량이 0.33일 때 44GPa의 최대강도 및 -4.4GPa의 잔류응력을 나타내었다. CrMoN 박막의 평균 마찰계수는 0.42이지만, 탄소함량을 증가함에 따라 0.31까지 감소 하였다. 이것은 박막 표면과 스틸볼 사이에서 탄소가 풍부한 층이 형성되어 일종의 고체윤활제 역할을 했기때문이다. 박막의 미세조직은 X-ray diffraction, Scanning electron microscopy, 그리고 X-ray photoelectron spectroscopy를 이용하여 분석하였다.

• 연구논문집
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• s.22
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• pp.107-113
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• 1992

The $\alpha$-alumina/fused alumina/$\beta$"-alumina specimens were fabricated by addition of fused alumina to $\alpha$-alumina/$\beta$"-alumina system. The sintered densities with and without fused alumina were almost same. But, the bending strength was decreased due to the presense of defects caused by the inhomogeneous dispersion of large fused alumina particles. And the fracture toughness was also decreased because the crack propagated through the fused alumina particles due to the imperfection of $\beta$"-alumina coating around them.

• Proceedings of the Korean Institute of Surface Engineering Conference
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• 2007.11a
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• pp.128-129
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• 2007

Cr-Al-N, Cr-Si-N 그리고 Cr-Al-Si-N 코팅막을 WC-Co 모재위에 AIP법과 DC 마그네트론 스퍼터링 법을 결합한 하이브리드 시스템을 이용하여 합성하였으며, Si함량에 따른 Cr-Al-Si-N 코팅막의 미세구조, 기계적 특성과 마찰 거동에 관해 비교 연구하였다. Cr-Si-N(${\sim}35GPa$)과 Cr-Al-Si-N(${\sim}55GPa$) 코팅막의 경도값은 CrN(${\sim}23GPa$)과 Cr-Al-N(${\sim}25GPa$) 코팅막과 비교하여 각각 증가하였고, CrN(${\sim}0.50$)과 Cr-Al-N(${\sim}0.84$)의 평균 마찰계수는 Si 함량이 9 at.% 일때, Cr-Si-N(${\sim}0.30$)과 Cr-Al-Si-N(${\sim}0.57$)으로 각각 감소하였다.

• Journal of Surface Science and Engineering
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• v.50 no.5
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• pp.421-426
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• 2017

Herein, we investigated surface morphological characteristics of anodic films on Al6061 alloy prepared by unipolar pulsed Micro-arc oxidation (MAO) in a mixed solution of $Na_2SiO_3$ + KOH. The number and size of pores as well as craters on anodic alumina surface were studied as a function of different voltages, duty cycles and applied anodic current densities. The morphological characteristics of all samples were investigated by scanning electron microscopy, conforming that the most uniform surface morphology of MAO films on Al1050 alloy was obtained at high applied current density with low duty cycle.

• Proceedings of the Korean Institute of Surface Engineering Conference
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• 2015.05a
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• pp.76-76
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• 2015

PVD에 의한 증착 대상 물질인 Ti, AlSi, Cr 및 각각의 타겟 전류, 바이어스, 압력 조건 들을 설계하여 적용시켰으며 PECVD와 CBC 코팅을 조합하여 발생되는 새로운 나노 멀티박막의 특성을 본 연구에서는 시험분석 및 평가하였다. 코팅층 깊이에 따른 조성 변화는 XPS를 이용하였으며 미세조직 및 표면 상태는 FE-SEM을 이용한 정밀 분석을 실시하였다. 또한, 박막의 경도는 나노인덴터를 이용하여 박막 자체의 경도만을 분석하였다. 한편, Pin-on-disk 방식의 마모시험기를 이용하여 표면조도와 상대재의 처리 상태에 따른 마찰계수를 시험 평가하였다.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2007.11a
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• pp.103-104
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• 2007

Nanometer-scaled polymer beads, such as polystyrene beads, were used as nanometer fabrication materials due to their some advantages such as self-assembled monolayer, nanometer scaled size and excellent compatibility with silicon based devices. Thus, the investigation on these properties of polymer beads was required. It is difficult to control the array of polystyrene beads on silicon substrate. In this study, we investigated the condition of selective array of polystyrene beads on nanometer-scaled hydrophilic surface which was obtained by APS coating. A tilting method was used to array the polystyrene beads selectively on the substrate. The polystyrene beads could be arrayed selectively by this method. From these results, we verified that there are possibilities to fabricate unique tools for the nanometer-scaled electrical devices.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2007.06a
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• pp.385-386
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• 2007

We prepared the Al doped ZnO coating Ag multilayer thin films on glass without substrate heating using FTS system. The structure of multilayer thin films has Al doped ZnO/Ag/Al doped ZnO(AZO/Ag/AZO). The thickness of top and bottom AZO thin films were fixed to 50 nm, respectively and controlled the thickness of Ag thin films with deposition time. As-doped multilayer thin films were prepared at 1mTorr and input power (DC) of 100W at room temperature. To investigate the film properties, we employed four-point probe, UVNIS spectrometer, X-ray diffractometer (XRD), scanning electron microscopy (SEM), Hall Effect measurement system and Atomic Force Microscope (AFM).

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2007.06a
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• pp.313-314
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• 2007

Ga-doped ZnO(GZO) multilayer coatings were prepared on glass by DC sputtering. Optimization of the deposition conditions of both AZO and Au layers were performed for better electrical and optical characteristics. The properties of multilayer were affected by the deposition process of both GZO and Au layers. The best multilayer coating exhibits low resistivity of $2.72{\times}10^{-3}\;{\Omega}-cm$ and transmittance of 77%. From these results, we can confirm a possibility of the application as transparent conductive electrodes.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2000.07a
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• pp.43-46
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• 2000

In this study, (Ba, Sr)$TiO_3$ (BST) ceramics thin films were prepared by Sol-Gel method. BST solution was made and spin-coated on Pt/$TiO_2$/Si substrate at 4000 [rpm] for 10 seconds. Coated specimens were dried at 150[$^{\circ}C$] for 5 minutes. Coating process was repeated 3 times and then sintered at 750[$^{\circ}C$] for 30 minutes. Structure and electrical characteristics of specimen was analyzed by Fractal Process. Thickness of BST ceramics thin films are about 2800[$\AA$]. Dielectric constant and loss of thin films was little decreased at 1[kHz]~1[MHz]. Dielectric constant and loss to frequency were 250 and 0.02 in BST3. The property of leakage current as the relation between the current and the voltage was that change of the leakage current was stable when the applied voltage was 0~3[V].

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 1999.11a
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• pp.311-314
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• 1999

Ferroelectric PZT heterolayered thin films were fabricated by spin coating method on the Pt/Ti/SiO$_2$/Si substrate using PZT(10/90) and PZT(90/10) metal alkoxide solutions. All PZT heterolayered films showed a homogeneous grain structure without presence of the rosette structure. It can be assumed that the lower PZT layers a role of nucleation site or seeding layer for the formation of the upper PZT layer. Zr and Ti diffusion into the Pt electrode were mainly distributed at the surface of Pt electrode beneath the PZT/Pt interface. The PZT/Pt interfacial layer showed a microstructure characterized by a grain phase surrounded by a Pb-deficient pyrochlore matrix phase. The relative dielectric constant and the dielectric loss of the PZT-6 film were 567 and 3.6, respectively.