• Proceedings of the KIEE Conference
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• 2007.07a
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• pp.1850-1851
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• 2007

To the Boundary Scan, this architecture in Scan testing of design under the control of boundary scan is used in boundary scan design to support the internal scan chain. The internal scan chain has single scan-in port and single scan-out port that multiple scan chain cannot be used. Internal scan design has multiple scan chains, those chains must be stitched to form a scan chain as this paper. We propose an efficient Boundary Scan test structure for multiple clock testing in design.

• The Transactions of The Korean Institute of Electrical Engineers
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• v.56 no.5
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• pp.980-986
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• 2007

Boundary scan test structure(JTAG IEEE 1149.1 standard) that supports an internal scan chain is generally being used to test CUT(circuit under test). Since the internal scan chain can only have a single scan-in port and a single scan-out port; however, existing boundary test methods can not be used when multiple scan chains are present in CUT. Those chains must be stitched to form a single scan chain as shown in this paper. We propose an efficient boundary scan test structure that adds a circuit called Clock Group Register(CGR) for multiple clocks testing within the design of multiple scan chains. The proposed CGR has the function of grouping clocks. By adding CGR to a previously existing boundary scan design, the design is modified. This revised scan design overcomes the limitation of supporting a single scan-in port and out port, and it bolsters multiple scan-in ports and out ports. Through our experiments, the effectiveness of CGR is proved. With this, it is possible to test more complicated designs that have high density with a little effort. Furthermore, it will also benefit in designing those complicated circuits.

• Proceedings of the KIEE Conference
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• 2007.07a
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• pp.1840-1841
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• 2007

To the Boundary Scan, this architecture in Scan testing of design under the control of boundary scan is used in boundary scan design to support the internal scan chain. The internal scan chain has single scan-in port and single scan-out port that multiple scan chain cannot be used. Internal scan design has multiple scan chains, those chains must be stitched to form a scan chain as this paper. We propose an efficient Boundary Scan test structure for multiple clock testing in design.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.41 no.11
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• pp.115-121
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• 2004

GenJTAG implemented in this paper is an automatic web-based boundary scan circuit generator. GenJTAG supports all the public instructions for the boundary scan technique, and also private instructions for other DFT techniques to be applied. Users can easily edit the generated boundary scan circuit code because it is described in behavioral level with the Verilog-HDL. GenJTAG has another advantage that any one can generate the boundary scan circuit by simply accessing to the web site.

• The Transactions of the Korean Institute of Electrical Engineers D
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• v.49 no.11
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• pp.637-642
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• 2000

IEEE 1149.1 boundary scan architecture is used as a standard in board-level system testing. The simplicity of this architecture is an advantage in system testing, but at the same time, it it makes a limitation of applications. Because of several problems such as 3-state net conflicts, or ambiguity issues, interconnect testing for multi-drop multi-board systems is more difficult than that of single board systems. A new approach using IEEE 1149.1 boundary scan architecture for multi-drop multi-board systems is developed in this paper. Adding boundary scan cells on backplane bus lines, each board has a complete scan-chain for interconnect test. This new scan-path insertion method on backplane bus using limited 1149.1 test bus less area overhead and mord efficient than previous approaches.

• Journal of Korea Multimedia Society
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• v.4 no.6
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• pp.570-578
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• 2001

Boundary scan architecture test methodology was introduced to facilitate the testing of complex printed circuit board. The boundary scan architecture has a tremendous potential for real time monitoring of the operational status of a system without interference of normal system operation. In this paper, a new type of embedded controller for real time monitoring of the operational status of a system is proposed and designed by using boundary scan architecture. The proposed real time monitoring embedded controller consists of test access port controller and an embedded controller proposed real time monitoring embedded controller using boundary scan architecture can save the hard-wire resource and can easily interface with boundary scan architecture chip. Experimental results show that the real time monitoring using proposed embedded controller is more effective then the real time monitoring using host computer.

• Journal of the Institute of Electronics and Information Engineers
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• v.52 no.6
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• pp.70-76
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• 2015

This paper introduces an FPGA self-test architecture reusing FPGA boundary scan chain as self-test circuits. An FPGA boundary scan cell is two or three times bigger than a normal boundary scan cell because it is used for configuring the function of input/output pins functions as well as testing and debugging. Accordingly, we analyze the architecture of an FPGA boundary scan cell in detail and design a set of built-in self-test (BIST) circuits in which FPGA boundary scan chain and a small amount of FPGA logic elements. By reusing FPGA boundary scan chain for self-test, we can reduce area overhead and perform a processor based on-board FPGA testing/monitoring. Experimental results show the area overhead comparison and simulation results.

• Proceedings of the KIEE Conference
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• 1998.11b
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• pp.669-671
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• 1998

Due to the serial nature of scan chains, the use of the boundary scan chain leads the high application costs. And with 3-state net, it is important to avoid enabling the two drivers in a net. In this paper, the new test method for 3-state nets in the multiple boundary scan chains is presented. This method configures the boundary scan cells as multiple scan chains and the test application time can be reduced. Also three efficient algorithms are proposed for testing the interconnects in a board without the collision of the test data in 3-state nets.

• Journal of the Korean Institute of Telematics and Electronics A
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• v.31A no.6
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• pp.199-208
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• 1994

This paper proposes a delay fault test technique for ICs and PCBs with the boundary-scan architectures supporting ANSI/IEEE Std 1149.1-1990. The hybrid delay fault model, which comprises both of gate delay faults and path delay faults, is selected. We developed a procedure for testing delay faults in the circuits with typical boundary scan cells supporting the standard. Analyzing it,we concluded that it is impractical because the test clock must be 2.5 times faster than the system clock with the cell architect-ures following up the state transition of the TAP controller and test instruction set. We modified the boundary-scan cell and developed test instructions and the test procedure. The modified cell and the procedure need test clock two times slower than the system clock and support the ANSI/IEEE standard perfectly. A 4-bit ALU is selected for the circuits under test. and delay tests are simulated by the SILOS simulator. The simulation results ascertain the accurate operation and effectiveeness of the modified mechanism.

• JSTS:Journal of Semiconductor Technology and Science
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• v.12 no.3
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• pp.286-292
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• 2012

Scan techniques are almost mandatorily adopted in designing current System-on-a-Chip (SoC) to enhance testability, but inadvertently secret keys can be stolen through the scan test channels of crypto SoCs. An efficient scan design technique is proposed in this paper to protect the secret key of an Advanced Encryption Standard (AES) core embedded in an SoC. A new instruction is added to IEEE 1149.1 boundary scan to use a fake key instead of user key, in which the fake key is chosen with meticulous care to improve the testability as well. Our approach can be implemented as user defined logic with conventional boundary scan design, hence no modification is necessary to any crypto IP core. Conformance to the IEEE 1149.1 standards is completely preserved while yielding better performance of area, power, and fault coverage with highly robust protection of the secret user key.