• Title/Summary/Keyword: bias stress stability

Search Result 56, Processing Time 0.032 seconds

Light and bias stability of c-IGO TFTs fabricated by rf magnetron sputtering

  • Jo, Kwang-Min;Lee, Joon-Hyung;Kim, Jeong-Joo;Heo, Young-Woo
    • Proceedings of the Korean Vacuum Society Conference
    • /
    • 2016.02a
    • /
    • pp.265.2-265.2
    • /
    • 2016
  • Oxide thin film transistors (TFTs) have attracted considerable interest for gate diver and pixel switching devices of the active matrix (AM) liquid crystal display (LCD) and organic light emitting diode (OLED) display because of their high field effect mobility, transparency in visible light region, and low temperature processing below $300^{\circ}C$. Recently, oxide TFTs with polycrystalline In-Ga-O(IGO) channel layer reported by Ebata. et. al. showed a amazing field effect mobility of $39.1cm^2/Vs$. The reason having high field effect mobility of IGO TFTs is because $In_2O_3$ has a bixbyite structure in which linear chains of edge sharing InO6 octahedral are isotropic. In this work, we investigated the characteristics and the effects of oxygen partial pressure significantly changed the IGO thin-films and IGO TFTs transfer characteristics. IGO thin-film were fabricated by rf-magnetron sputtering with different oxygen partial pressure ($O_2/(Ar+O_2)$, $Po_2$)ratios. IGO thin film Varies depending on the oxygen partial pressure of 0.1%, 1%, 3%, 5%, 10% have been some significant changes in the electrical characteristics. Also the IGO TFTs VTH value conspicuously shifted in the positive direction, from -8 to 11V as the $Po_2$ increased from 1% to 10%. At $Po_2$ was 5%, IGO TFTs showed a high drain current on/off ratio of ${\sim}10^8$, a field-effect mobility of $84cm^2/Vs$, a threshold voltage of 1.5V, and a subthreshold slpe(SS) of 0.2V/decade from log(IDS) vs VGS.

  • PDF

Irreversible Charge Trapping at the Semiconductor/Polymer Interface of Organic Field-Effect Transistors (유기전계효과 트랜지스터의 반도체/고분자절연체 계면에 발생하는 비가역적 전하트래핑에 관한 연구)

  • Im, Jaemin;Choi, Hyun Ho
    • Journal of Adhesion and Interface
    • /
    • v.21 no.4
    • /
    • pp.129-134
    • /
    • 2020
  • Understanding charge trapping at the interface between conjugated semiconductor and polymer dielectric basically gives insight into the development of long-term stable organic field-effect transistors (OFET). Here, the charge transport properties of OFETs using polymer dielectric with various molecular weights (MWs) have been investigated. The conjugated semiconductor, pentacene exhibited morphology and crystallinity, insensitive to MWs of polymethyl methacrylate (PMMA) dielectric. Consequently, transfer curves and field-effect mobilities of as-prepared devices are independent of MWs. Under bias stress in humid environment, however, the drain current decay as well as transfer curve shift are found to increase as the MW of PMMA decreases (MW effect). The charge trapping induced by MW effect is irreversible, that is, the localized charges are difficult to be delocalized. The MW effect is caused by the variation in the density of polymer chain ends in the PMMA: the free volumes at the PMMA chain ends act as charge trap sites, corresponding to drain current decay depending on MWs of PMMA.

Assessment of Turbulent Spectral Estimators in LDV (LDV의 난류 스펙트럼 추정치 평가)

  • 이도환;성형진
    • Transactions of the Korean Society of Mechanical Engineers
    • /
    • v.16 no.9
    • /
    • pp.1788-1795
    • /
    • 1992
  • Numerical simulations have been performed to investigate various spectral estimators used in LDV signal processing. In order to simulate a particle arrival time statistics known as the doubly stochastic poisson process, an autoregressive vector model was adopted to construct a primary velocity field. The conditional Poisson process with a random rate parameter was generated through the rescaling time process using the mean value function. The direct transform based on random sampling sequences and the standard periodogram using periodically resampled data by the sample and hold interpolation were applied to obtain power spectral density functions. For low turbulent intensity flows, the direct transform with a constant Poisson intensity is in good agreement with the theoretical spectrum. The periodogram using the sample and hold sequences is better than the direct transform in the view of the stability and the weighting of the velocity bias for high data density flows. The high Reynolds stress and high fluctuation of the transverse velocity component affects the velocity bias which increases the distortion of spectral components in the direct transform.

Low voltage stability of a-Si:H TFTs with $SiN_x$ dielectric films prepared by PECVD using Taguchi methods

  • Wu, Chuan-Yi;Sun, Kuo-Sheng;Cho, Shih-Chieh;Lin, Hong-Ming
    • 한국정보디스플레이학회:학술대회논문집
    • /
    • 2005.07a
    • /
    • pp.272-275
    • /
    • 2005
  • The high stability of a-Si:H TFTs device is studied with different deposited conditions of $SiN_x$ films by PECVD. The process parameters of $N_2$, $NH_3$ gas flow rate, RF power, and pressure s of hydrogenated amorphous silicon nitride are taken into account and analyzed by Taguchi experimental design method. The $NH_3$ gas flow rate and RF power are two major factors on the average threshold voltage and the a-SiNx:H film's structure. The hydrogen contents in $SiN_x$ films were measured by FTIR using the related Si-H/N-H bonds ratio in $a-SiN_x:H$ films. After the 330,000 sec gate bias stress is applied, the threshold voltages ($V_th$) shift less than 10%. This result indicates that the highly stable a-Si:H TFTs device can be fabricated with optimum gate $SiN_x$ insulator.

  • PDF

Polymer semiconductor based transistors for flexible display

  • Lee, Ji-Yeol;Lee, Bang-Rin;Kim, Ju-Yeong;Jeong, Ji-Yeong;Park, Jeong-Il;Jeong, Jong-Won;Gu, Bon-Won;Jin, Yong-Wan
    • Proceedings of the Materials Research Society of Korea Conference
    • /
    • 2012.05a
    • /
    • pp.59.1-59.1
    • /
    • 2012
  • Organic thin-film transistors (OTFTs) with printable semiconductors are promising candidate devices for flexible active-matrix (AM) display applications. Yet, stable operation of actual display panels driven by OTFTs has seldom been reported up to date. Here, we demonstrate a flexible reflective type polymer dispersed liquid crystal (PDLC) display, in which inkjet-printed OTFT arrays are used as driving elements with excellent areal uniformity in terms of device performance. As the active semiconductor, a novel, ambient processable conjugated copolymer was synthesized. The stability of the devices with respect to electrical bias stress was improved by applying a channel-passivation layer, which suppresses the environmental effects and hence reduces the density of trap states at the channel/dielectric interface. The combination of high performance and high stability OTFT devices enabled the successful realization of stable operating flexible color-displays by inkjet-printing.

  • PDF

Effect of drain bias stress on the stability of nanocrystalline silicon TFT (드레인 전압 바이어스에 대한 미세결정 실리콘 박막 트랜지스터의 전기적 안정성 분석)

  • Ji, Seon-Beom;Kim, Sun-Jae;Park, Hyun-Sang;Han, Min-Koo
    • Proceedings of the KIEE Conference
    • /
    • 2009.07a
    • /
    • pp.1281_1282
    • /
    • 2009
  • ICP-CVD를 이용하여 inverted staggered 구조를 갖는 미세결정 실리콘 (Nanocrystalline Silicon, nc-Si) 박막 트랜지스터(Thin Film Transistor, TFT)를 제작하였다. 또한, 소자의 특성과 전기적 안정성을 평가하였다. 실험 결과는 짧은 채널 길이를 갖는 nc-Si TFT가 긴 채널 길이의 소자보다 같은 드레인 전압 바이어스 하에서 덜 열화 됨을 알 수 있었다. 이는 드레인 전압 바이어스 하에서의 낮은 채널 캐리어 농도는 적은 defect state를 만들기 때문으로 짧은 채널 길이의 TFT가 긴 채널 길이의 TFT보다 $V_{TH}$ 열화가 적었다. 이러한 결과는 짧은 채널 길이의 nc-Si TFT가 디스플레이 분야에 있어 다양하게 응용될 것으로 기대된다.

  • PDF

Study on the Stability of Organic Thin-Film Transistors Fabricated by Inserting a Polymeric Film as an Adhesion Layer

  • Hyung, Gun-Woo;Park, Il-Houng;Seo, Ji-Hoon;Seo, Ji-Hyun;Choi, Hak-Bum;Kim, Young-Kwan
    • 한국정보디스플레이학회:학술대회논문집
    • /
    • 2007.08b
    • /
    • pp.1348-1351
    • /
    • 2007
  • We demonstrated that the threshold voltage shift owing to a gate-bias stress is originated from the trapped charges at the interface between semiconductor layer and dielectric layer, and such drawback can be settled by applying long-term delay time to the gate electrode.

  • PDF

A novel integrated a-Si:H gate driver

  • Lee, Jung-Woo;Hong, Hyun-Seok;Lee, Eung-Sang;Lee, Jung-Young;Yi, Jun-Shin;Bae, Byung-Seong
    • 한국정보디스플레이학회:학술대회논문집
    • /
    • 2007.08b
    • /
    • pp.1176-1178
    • /
    • 2007
  • A novel integrated a-Si:H gate driver with high reliability has been designed and simulated. Since the a-Si:H TFT is easily degraded by gate bias stress, we should optimize the circuit considering the threshold voltage shift. The conventional circuit shows voltage drop at the input stage by threshold voltage of the TFT, however, the proposed circuit dose not shows voltage drop and keeps constant regardless of threshold voltage shift of the TFT.

  • PDF

Low temperature plasma deposition of microcrystalline silicon films for bottom gate thin film transistors

  • Cabarrocas, P.Roca i;Djeridane, Y.;Abramov, A.;Bui, V.D.;Bonnassieux, Y.
    • 한국정보디스플레이학회:학술대회논문집
    • /
    • 2006.08a
    • /
    • pp.56-60
    • /
    • 2006
  • We review our studies on the growth of microcrystalline silicon films by the standard PECVD technique. In situ spectroscopic ellipsometry studies allow the optimization of the complex film structure with respect to competing aspects of the growth process. Fine tuning the hydrogen flux, the ion energy, and the nature of the species contributing to deposition produces unique films with a fully crystallized interface with silicon nitride. These materials have been successfully incorporated in bottom gate TFTs which present mobility values in the range of 1 to 3 $cm^2/V.s$, and stable characteristics when submitted to a bias stress. The stability of these TFTs makes them suitable for driver applications in AMLCDs as well as pixel elements in OLED displays.

  • PDF

Deposition of DLC film by using an FCVA system with a magnetic mirror and characterization of its material properties (거울형 자계 구조를 갖는 진공 여과 아크 증착법을 이용한 다이아몬드상 탄소 박막의 증착 및 물성 분석)

  • PARK, Chang-Kyun;UHM, Hyun-Seok;SEO, Soo-Hyung;PARK, Jin-Seok
    • Proceedings of the KIEE Conference
    • /
    • 2000.07c
    • /
    • pp.1717-1719
    • /
    • 2000
  • DLC films are deposited by using an FCVA deposition system with a mirror-type magnetic field configuration. Permanent magnets and: magnetic yokes around the cathode have been observed to enhance the mobility of arc spots on the cathode and the stability of arc plasma, Effects of reactor pressures and substrate biases on structural properties of DLC films deposited are investigated. The results show that the highest $sp^{3}/sp^{2}$ fraction is obtained when the films are deposited at a pressure of $3{\times}10^4$ Torr and a bias voltage of - 50 V. The variation of the structural properties due to thermal stress up to 500$^{\circ}C$ is also examined.

  • PDF